{"id":"https://openalex.org/W4390693426","doi":"https://doi.org/10.1109/icecs58634.2023.10382803","title":"Mutual Inductance Evaluation Between Two Parallel Conductors on a PCB","display_name":"Mutual Inductance Evaluation Between Two Parallel Conductors on a PCB","publication_year":2023,"publication_date":"2023-12-04","ids":{"openalex":"https://openalex.org/W4390693426","doi":"https://doi.org/10.1109/icecs58634.2023.10382803"},"language":"en","primary_location":{"id":"doi:10.1109/icecs58634.2023.10382803","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs58634.2023.10382803","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/2078.1/287694","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5093670787","display_name":"Sana Chouaibi","orcid":null},"institutions":[{"id":"https://openalex.org/I142899784","display_name":"University of Sfax","ror":"https://ror.org/04d4sd432","country_code":"TN","type":"education","lineage":["https://openalex.org/I142899784"]},{"id":"https://openalex.org/I8636806","display_name":"University of Sousse","ror":"https://ror.org/00dmpgj58","country_code":"TN","type":"education","lineage":["https://openalex.org/I8636806"]}],"countries":["TN"],"is_corresponding":true,"raw_author_name":"Sana Chouaibi","raw_affiliation_strings":["Sfax University,CES Laboratory, National engineering school of Sfax (ENIS),Tunisia","National Engineering School of Sousse (ENISo), Sousse University, Tunisia","CES Laboratory, National engineering school of Sfax (ENIS), Sfax University, Tunisia"],"affiliations":[{"raw_affiliation_string":"Sfax University,CES Laboratory, National engineering school of Sfax (ENIS),Tunisia","institution_ids":["https://openalex.org/I142899784"]},{"raw_affiliation_string":"National Engineering School of Sousse (ENISo), Sousse University, Tunisia","institution_ids":["https://openalex.org/I8636806"]},{"raw_affiliation_string":"CES Laboratory, National engineering school of Sfax (ENIS), Sfax University, Tunisia","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074806365","display_name":"Mohamed Hadj Sa\u00efd","orcid":"https://orcid.org/0000-0003-4510-544X"},"institutions":[{"id":"https://openalex.org/I142899784","display_name":"University of Sfax","ror":"https://ror.org/04d4sd432","country_code":"TN","type":"education","lineage":["https://openalex.org/I142899784"]},{"id":"https://openalex.org/I4396570653","display_name":"Centre de Recherche en Microelectronique et Nanotechnologie","ror":"https://ror.org/02xj61x84","country_code":null,"type":"facility","lineage":["https://openalex.org/I4396570653"]},{"id":"https://openalex.org/I8636806","display_name":"University of Sousse","ror":"https://ror.org/00dmpgj58","country_code":"TN","type":"education","lineage":["https://openalex.org/I8636806"]}],"countries":["TN"],"is_corresponding":false,"raw_author_name":"Mohamed Hadj Said","raw_affiliation_strings":["Center for Research in Microelectronics & Nanotechnology (CRMN),Sousse,Tunisia","SI2E Laboratory, National Engineering School of Sfax, Sfax University, Tunisia"],"affiliations":[{"raw_affiliation_string":"Center for Research in Microelectronics & Nanotechnology (CRMN),Sousse,Tunisia","institution_ids":["https://openalex.org/I4396570653","https://openalex.org/I8636806"]},{"raw_affiliation_string":"SI2E Laboratory, National Engineering School of Sfax, Sfax University, Tunisia","institution_ids":["https://openalex.org/I142899784"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5093489239","display_name":"Dorra Nasr","orcid":null},"institutions":[{"id":"https://openalex.org/I166928557","display_name":"University of Monastir","ror":"https://ror.org/00nhtcg76","country_code":"TN","type":"education","lineage":["https://openalex.org/I166928557"]},{"id":"https://openalex.org/I4396570653","display_name":"Centre de Recherche en Microelectronique et Nanotechnologie","ror":"https://ror.org/02xj61x84","country_code":null,"type":"facility","lineage":["https://openalex.org/I4396570653"]},{"id":"https://openalex.org/I8636806","display_name":"University of Sousse","ror":"https://ror.org/00dmpgj58","country_code":"TN","type":"education","lineage":["https://openalex.org/I8636806"]}],"countries":["TN"],"is_corresponding":false,"raw_author_name":"Dorra Nasr","raw_affiliation_strings":["Center for Research in Microelectronics & Nanotechnology (CRMN),Sousse,Tunisia","Laboratory of Microelectronics and Instrumentations, Faculty of Sciences of Monastir, Tunisia"],"affiliations":[{"raw_affiliation_string":"Center for Research in Microelectronics & Nanotechnology (CRMN),Sousse,Tunisia","institution_ids":["https://openalex.org/I4396570653","https://openalex.org/I8636806"]},{"raw_affiliation_string":"Laboratory of Microelectronics and Instrumentations, Faculty of Sciences of Monastir, Tunisia","institution_ids":["https://openalex.org/I166928557"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036132042","display_name":"Mossaad Ben Ayed","orcid":"https://orcid.org/0000-0002-0350-2765"},"institutions":[{"id":"https://openalex.org/I142899784","display_name":"University of Sfax","ror":"https://ror.org/04d4sd432","country_code":"TN","type":"education","lineage":["https://openalex.org/I142899784"]},{"id":"https://openalex.org/I8636806","display_name":"University of Sousse","ror":"https://ror.org/00dmpgj58","country_code":"TN","type":"education","lineage":["https://openalex.org/I8636806"]}],"countries":["TN"],"is_corresponding":false,"raw_author_name":"Mossaad Ben Ayed","raw_affiliation_strings":["Sfax University,CES Laboratory, National engineering school of Sfax (ENIS),Tunisia","CES Laboratory, National engineering school of Sfax (ENIS), Sfax University, Tunisia","National Engineering School of Sousse (ENISo), Sousse University, Tunisia"],"affiliations":[{"raw_affiliation_string":"Sfax University,CES Laboratory, National engineering school of Sfax (ENIS),Tunisia","institution_ids":["https://openalex.org/I142899784"]},{"raw_affiliation_string":"CES Laboratory, National engineering school of Sfax (ENIS), Sfax University, Tunisia","institution_ids":[]},{"raw_affiliation_string":"National Engineering School of Sousse (ENISo), Sousse University, Tunisia","institution_ids":["https://openalex.org/I8636806"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064026729","display_name":"Denis Flandre","orcid":"https://orcid.org/0000-0001-5298-5196"},"institutions":[{"id":"https://openalex.org/I95674353","display_name":"UCLouvain","ror":"https://ror.org/02495e989","country_code":"BE","type":"education","lineage":["https://openalex.org/I95674353"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Denis Flandre","raw_affiliation_strings":["SMALL Research Group, ICTEAM Institute, Université catholique de Louvain,Belgium"],"affiliations":[{"raw_affiliation_string":"SMALL Research Group, ICTEAM Institute, Université catholique de Louvain,Belgium","institution_ids":["https://openalex.org/I95674353"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025205082","display_name":"Far\u00e8s Tounsi","orcid":"https://orcid.org/0000-0002-7130-4007"},"institutions":[{"id":"https://openalex.org/I142899784","display_name":"University of Sfax","ror":"https://ror.org/04d4sd432","country_code":"TN","type":"education","lineage":["https://openalex.org/I142899784"]},{"id":"https://openalex.org/I95674353","display_name":"UCLouvain","ror":"https://ror.org/02495e989","country_code":"BE","type":"education","lineage":["https://openalex.org/I95674353"]}],"countries":["BE","TN"],"is_corresponding":false,"raw_author_name":"Fares Tounsi","raw_affiliation_strings":["SMALL Research Group, ICTEAM Institute, Université catholique de Louvain,Belgium","SI2E Laboratory, National Engineering School of Sfax, Sfax University, Tunisia"],"affiliations":[{"raw_affiliation_string":"SMALL Research Group, ICTEAM Institute, Université catholique de Louvain,Belgium","institution_ids":["https://openalex.org/I95674353"]},{"raw_affiliation_string":"SI2E Laboratory, National Engineering School of Sfax, Sfax University, Tunisia","institution_ids":["https://openalex.org/I142899784"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5093670787"],"corresponding_institution_ids":["https://openalex.org/I142899784","https://openalex.org/I8636806"],"apc_list":null,"apc_paid":null,"fwci":0.4011,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.62109807,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.9014171361923218},{"id":"https://openalex.org/keywords/equivalent-series-inductance","display_name":"Equivalent series inductance","score":0.8294005393981934},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.6891345977783203},{"id":"https://openalex.org/keywords/electrical-conductor","display_name":"Electrical conductor","score":0.6882011890411377},{"id":"https://openalex.org/keywords/planar","display_name":"Planar","score":0.6399397850036621},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.6323034167289734},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.6143069863319397},{"id":"https://openalex.org/keywords/leakage-inductance","display_name":"Leakage inductance","score":0.588677167892456},{"id":"https://openalex.org/keywords/embedding","display_name":"Embedding","score":0.513270378112793},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4326373040676117},{"id":"https://openalex.org/keywords/equivalent-series-resistance","display_name":"Equivalent series resistance","score":0.4161965847015381},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41282904148101807},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.37409019470214844},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3621658384799957},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.35030633211135864},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2816903591156006},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20686227083206177},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.07966354489326477}],"concepts":[{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.9014171361923218},{"id":"https://openalex.org/C141490761","wikidata":"https://www.wikidata.org/wiki/Q5384728","display_name":"Equivalent series inductance","level":4,"score":0.8294005393981934},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.6891345977783203},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.6882011890411377},{"id":"https://openalex.org/C134786449","wikidata":"https://www.wikidata.org/wiki/Q3391255","display_name":"Planar","level":2,"score":0.6399397850036621},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.6323034167289734},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.6143069863319397},{"id":"https://openalex.org/C32976094","wikidata":"https://www.wikidata.org/wiki/Q1515253","display_name":"Leakage inductance","level":4,"score":0.588677167892456},{"id":"https://openalex.org/C41608201","wikidata":"https://www.wikidata.org/wiki/Q980509","display_name":"Embedding","level":2,"score":0.513270378112793},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4326373040676117},{"id":"https://openalex.org/C14485415","wikidata":"https://www.wikidata.org/wiki/Q5384730","display_name":"Equivalent series resistance","level":3,"score":0.4161965847015381},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41282904148101807},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.37409019470214844},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3621658384799957},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.35030633211135864},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2816903591156006},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20686227083206177},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.07966354489326477},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/icecs58634.2023.10382803","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs58634.2023.10382803","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"},{"id":"pmh:oai:dial.uclouvain.be:boreal:287694","is_oa":true,"landing_page_url":"http://hdl.handle.net/2078.1/287694","pdf_url":null,"source":{"id":"https://openalex.org/S4306401902","display_name":"Digital Access to Libraries (Universit\u00e9 catholique de Louvain (UCL), l'Universit\u00e9 de Namur (UNamur) and the Universit\u00e9 Saint-Louis (USL-B))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I95674353","host_organization_name":"UCLouvain","host_organization_lineage":["https://openalex.org/I95674353"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":{"id":"pmh:oai:dial.uclouvain.be:boreal:287694","is_oa":true,"landing_page_url":"http://hdl.handle.net/2078.1/287694","pdf_url":null,"source":{"id":"https://openalex.org/S4306401902","display_name":"Digital Access to Libraries (Universit\u00e9 catholique de Louvain (UCL), l'Universit\u00e9 de Namur (UNamur) and the Universit\u00e9 Saint-Louis (USL-B))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I95674353","host_organization_name":"UCLouvain","host_organization_lineage":["https://openalex.org/I95674353"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.49000000953674316}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1976862901","https://openalex.org/W1979975256","https://openalex.org/W1994595659","https://openalex.org/W2071748207","https://openalex.org/W2113823994","https://openalex.org/W2543077856","https://openalex.org/W2891483507","https://openalex.org/W2946574032","https://openalex.org/W3007283990","https://openalex.org/W3011472244","https://openalex.org/W3094947613"],"related_works":["https://openalex.org/W3205678237","https://openalex.org/W2039404188","https://openalex.org/W2087014434","https://openalex.org/W2373643149","https://openalex.org/W2108569687","https://openalex.org/W2605243265","https://openalex.org/W1775192674","https://openalex.org/W2162173402","https://openalex.org/W2112086678","https://openalex.org/W1044841746"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"present":[4],"a":[5,14],"comprehensive":[6],"analysis":[7],"of":[8],"two":[9],"parallel":[10],"conductors,":[11],"fabricated":[12],"on":[13,27],"printed":[15],"circuit":[16],"board":[17],"(PCB),":[18],"forming":[19],"an":[20,25],"elementary":[21],"planar":[22],"transformer,":[23],"with":[24],"emphasis":[26],"extracting":[28],"performance":[29,74],"parameters":[30],"such":[31],"as":[32],"self-inductance,":[33],"resistance,":[34],"coupling":[35],"coefficient,":[36],"mutual":[37,57],"inductance,":[38],"and":[39,49],"inter-winding":[40],"capacitance.":[41],"Results":[42],"issued":[43],"from":[44],"theoretical":[45],"equations,":[46],"FEM-based":[47],"simulations,":[48],"characterizations":[50],"were":[51],"compared":[52],"together":[53],"to":[54,70],"evaluate":[55],"the":[56,62,72],"inductance.":[58],"A":[59],"procedure":[60],"using":[61],"Open-Short":[63],"de-embedding":[64],"technique":[65],"has":[66],"been":[67],"successfully":[68],"applied":[69],"extract":[71],"correct":[73],"values.":[75]},"counts_by_year":[{"year":2025,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}