{"id":"https://openalex.org/W4390693193","doi":"https://doi.org/10.1109/icecs58634.2023.10382790","title":"Fast Electrochemical Impedance Measurement and Classification System Based on Machine Learning Algorithms","display_name":"Fast Electrochemical Impedance Measurement and Classification System Based on Machine Learning Algorithms","publication_year":2023,"publication_date":"2023-12-04","ids":{"openalex":"https://openalex.org/W4390693193","doi":"https://doi.org/10.1109/icecs58634.2023.10382790"},"language":"en","primary_location":{"id":"doi:10.1109/icecs58634.2023.10382790","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs58634.2023.10382790","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083012343","display_name":"M. El-Badi","orcid":"https://orcid.org/0000-0002-5013-0204"},"institutions":[{"id":"https://openalex.org/I29891158","display_name":"University of Sharjah","ror":"https://ror.org/00engpz63","country_code":"AE","type":"education","lineage":["https://openalex.org/I29891158"]}],"countries":["AE"],"is_corresponding":true,"raw_author_name":"M. El-Badi","raw_affiliation_strings":["University of Sharjah,Department of Electrical Engineering,United Arab Emirates,P.O. Box 27272"],"affiliations":[{"raw_affiliation_string":"University of Sharjah,Department of Electrical Engineering,United Arab Emirates,P.O. Box 27272","institution_ids":["https://openalex.org/I29891158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039814573","display_name":"Ahmed S. Elwakil","orcid":"https://orcid.org/0000-0002-3972-5434"},"institutions":[{"id":"https://openalex.org/I168635309","display_name":"University of Calgary","ror":"https://ror.org/03yjb2x39","country_code":"CA","type":"education","lineage":["https://openalex.org/I168635309"]},{"id":"https://openalex.org/I29891158","display_name":"University of Sharjah","ror":"https://ror.org/00engpz63","country_code":"AE","type":"education","lineage":["https://openalex.org/I29891158"]}],"countries":["AE","CA"],"is_corresponding":false,"raw_author_name":"A. S. Elwakil","raw_affiliation_strings":["University of Sharjah,Department of Electrical Engineering,United Arab Emirates,P.O. Box 27272","Department of Electrical and Computer Engineering, University of Calgary, Alberta, Canada"],"affiliations":[{"raw_affiliation_string":"University of Sharjah,Department of Electrical Engineering,United Arab Emirates,P.O. Box 27272","institution_ids":["https://openalex.org/I29891158"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Calgary, Alberta, Canada","institution_ids":["https://openalex.org/I168635309"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000482651","display_name":"Sohaib Majzoub","orcid":"https://orcid.org/0000-0003-3196-2635"},"institutions":[{"id":"https://openalex.org/I29891158","display_name":"University of Sharjah","ror":"https://ror.org/00engpz63","country_code":"AE","type":"education","lineage":["https://openalex.org/I29891158"]}],"countries":["AE"],"is_corresponding":false,"raw_author_name":"S. Majzoub","raw_affiliation_strings":["University of Sharjah,Department of Electrical Engineering,United Arab Emirates,P.O. Box 27272"],"affiliations":[{"raw_affiliation_string":"University of Sharjah,Department of Electrical Engineering,United Arab Emirates,P.O. Box 27272","institution_ids":["https://openalex.org/I29891158"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5083012343"],"corresponding_institution_ids":["https://openalex.org/I29891158"],"apc_list":null,"apc_paid":null,"fwci":0.7203,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.70054599,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11434","display_name":"Electrochemical Analysis and Applications","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/1603","display_name":"Electrochemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10640","display_name":"Spectroscopy and Chemometric Analyses","score":0.9850000143051147,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/preprocessor","display_name":"Preprocessor","score":0.7043938636779785},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.667298436164856},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6635388135910034},{"id":"https://openalex.org/keywords/principal-component-analysis","display_name":"Principal component analysis","score":0.6390220522880554},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6225187182426453},{"id":"https://openalex.org/keywords/feature-selection","display_name":"Feature selection","score":0.5960543155670166},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.5621389150619507},{"id":"https://openalex.org/keywords/dielectric-spectroscopy","display_name":"Dielectric spectroscopy","score":0.5083896517753601},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.48453348875045776},{"id":"https://openalex.org/keywords/data-pre-processing","display_name":"Data pre-processing","score":0.4590666592121124},{"id":"https://openalex.org/keywords/statistical-classification","display_name":"Statistical classification","score":0.4496696889400482},{"id":"https://openalex.org/keywords/curse-of-dimensionality","display_name":"Curse of dimensionality","score":0.4496104419231415},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.44185104966163635},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.42922377586364746},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3940604627132416},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19664865732192993}],"concepts":[{"id":"https://openalex.org/C34736171","wikidata":"https://www.wikidata.org/wiki/Q918333","display_name":"Preprocessor","level":2,"score":0.7043938636779785},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.667298436164856},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6635388135910034},{"id":"https://openalex.org/C27438332","wikidata":"https://www.wikidata.org/wiki/Q2873","display_name":"Principal component analysis","level":2,"score":0.6390220522880554},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6225187182426453},{"id":"https://openalex.org/C148483581","wikidata":"https://www.wikidata.org/wiki/Q446488","display_name":"Feature selection","level":2,"score":0.5960543155670166},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.5621389150619507},{"id":"https://openalex.org/C7040849","wikidata":"https://www.wikidata.org/wiki/Q899580","display_name":"Dielectric spectroscopy","level":4,"score":0.5083896517753601},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.48453348875045776},{"id":"https://openalex.org/C10551718","wikidata":"https://www.wikidata.org/wiki/Q5227332","display_name":"Data pre-processing","level":2,"score":0.4590666592121124},{"id":"https://openalex.org/C110083411","wikidata":"https://www.wikidata.org/wiki/Q1744628","display_name":"Statistical classification","level":2,"score":0.4496696889400482},{"id":"https://openalex.org/C111030470","wikidata":"https://www.wikidata.org/wiki/Q1430460","display_name":"Curse of dimensionality","level":2,"score":0.4496104419231415},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.44185104966163635},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.42922377586364746},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3940604627132416},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19664865732192993},{"id":"https://openalex.org/C52859227","wikidata":"https://www.wikidata.org/wiki/Q7877","display_name":"Electrochemistry","level":3,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs58634.2023.10382790","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs58634.2023.10382790","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1555946919","https://openalex.org/W2192293505","https://openalex.org/W2899248844","https://openalex.org/W2955459576","https://openalex.org/W3014576444","https://openalex.org/W3110652625","https://openalex.org/W3137202530","https://openalex.org/W3165359031","https://openalex.org/W4221093568","https://openalex.org/W4311224182","https://openalex.org/W4312127482"],"related_works":["https://openalex.org/W2989490741","https://openalex.org/W3092506759","https://openalex.org/W2367545121","https://openalex.org/W4248881655","https://openalex.org/W2482165163","https://openalex.org/W3010890513","https://openalex.org/W120741642","https://openalex.org/W138569904","https://openalex.org/W2390914021","https://openalex.org/W2389417819"],"abstract_inverted_index":{"This":[0],"work":[1],"focuses":[2],"on":[3],"the":[4,37,53,74,86,89,93,118,148,152,172,179,183],"analysis":[5],"and":[6,65,72,110,131,156,169],"detection":[7],"of":[8,32,69,88],"impedance":[9,38,76,149],"changes":[10,150],"in":[11,117,151],"tomatoes":[12],"using":[13,182],"a":[14,30,49,57,66,137,141],"wide-band":[15,45],"Electrochemical":[16],"Impedance":[17],"Spectroscopy":[18],"(EIS)":[19],"system.":[20],"Homogeneous":[21],"tomato":[22,54],"samples":[23,55],"were":[24,115],"subjected":[25],"to":[26,35,52,62,84],"EIS":[27,46,153],"testing":[28],"over":[29],"period":[31],"72":[33],"hours":[34],"monitor":[36],"variations":[39],"during":[40],"this":[41],"time.":[42],"The":[43,121],"designed":[44],"system":[47],"applied":[48],"structured":[50],"signal":[51],"with":[56,140,166],"wide":[58],"frequency":[59,174],"range":[60],"(1mHz":[61],"1":[63],"MHz)":[64],"maximum":[67],"amplitude":[68],"0.5V,":[70],"capturing":[71],"storing":[73],"electrochemical":[75],"responses.":[77],"Principal":[78],"Component":[79],"Analysis":[80],"(PCA)":[81],"was":[82],"utilized":[83],"reduce":[85],"dimensionality":[87],"dataset":[90],"while":[91],"retaining":[92],"most":[94],"relevant":[95],"features.":[96],"Furthermore,":[97],"three":[98,124],"Machine":[99],"Learning":[100],"(ML)":[101],"algorithms":[102,135],"such":[103],"as":[104],"XGBoost,":[105],"Artificial":[106],"Neural":[107],"Networks":[108],"(ANN),":[109],"Support":[111],"Vector":[112],"Machines":[113],"(SVM)":[114],"employed":[116],"classification":[119,180],"process.":[120],"process":[122],"involved":[123],"key":[125],"steps:":[126],"data":[127],"preprocessing,":[128],"model":[129,132,139],"training,":[130],"testing.":[133],"These":[134],"produced":[136],"prediction":[138],"specialized":[142],"feature":[143,185],"selection":[144],"that":[145,176],"effectively":[146,170],"identified":[147],"dataset.":[154],"XGBoost":[155,184],"ANN":[157],"demonstrated":[158],"superior":[159],"performance,":[160],"successfully":[161],"classifying":[162],"all":[163],"analyzed":[164],"responses":[165],"100%":[167],"accuracy":[168],"identifying":[171],"essential":[173],"points":[175],"significantly":[177],"influenced":[178],"outcome":[181],"importance":[186],"mechanism.":[187]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}