{"id":"https://openalex.org/W4206604611","doi":"https://doi.org/10.1109/icecs53924.2021.9665508","title":"Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production","display_name":"Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production","publication_year":2021,"publication_date":"2021-11-28","ids":{"openalex":"https://openalex.org/W4206604611","doi":"https://doi.org/10.1109/icecs53924.2021.9665508"},"language":"en","primary_location":{"id":"doi:10.1109/icecs53924.2021.9665508","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs53924.2021.9665508","pdf_url":null,"source":{"id":"https://openalex.org/S4363608220","display_name":"2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080065468","display_name":"Gaku Ogihara","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Gaku Ogihara","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001669942","display_name":"Takayuki Nakatani","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takayuki Nakatani","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066901011","display_name":"Daisuke Iimori","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Daisuke Iimori","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082129610","display_name":"Shogo Katayama","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shogo Katayama","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080778719","display_name":"Anna Kuwana","orcid":null},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Anna Kuwana","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006643454","display_name":"Keno Sato","orcid":null},"institutions":[{"id":"https://openalex.org/I162282272","display_name":"ROHM","ror":"https://ror.org/00vttj605","country_code":"JP","type":"company","lineage":["https://openalex.org/I162282272"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Keno Sato","raw_affiliation_strings":["ROHM Semiconductor, Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ROHM Semiconductor, Yokohama, Japan","institution_ids":["https://openalex.org/I162282272"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038817476","display_name":"Takashi Ishida","orcid":"https://orcid.org/0000-0002-1060-0777"},"institutions":[{"id":"https://openalex.org/I162282272","display_name":"ROHM","ror":"https://ror.org/00vttj605","country_code":"JP","type":"company","lineage":["https://openalex.org/I162282272"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takashi Ishida","raw_affiliation_strings":["ROHM Semiconductor, Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ROHM Semiconductor, Yokohama, Japan","institution_ids":["https://openalex.org/I162282272"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009609514","display_name":"Toshiyuki Okamoto","orcid":null},"institutions":[{"id":"https://openalex.org/I162282272","display_name":"ROHM","ror":"https://ror.org/00vttj605","country_code":"JP","type":"company","lineage":["https://openalex.org/I162282272"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshiyuki Okamoto","raw_affiliation_strings":["ROHM Semiconductor, Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ROHM Semiconductor, Yokohama, Japan","institution_ids":["https://openalex.org/I162282272"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026364305","display_name":"Tamotsu Ichikawa","orcid":null},"institutions":[{"id":"https://openalex.org/I162282272","display_name":"ROHM","ror":"https://ror.org/00vttj605","country_code":"JP","type":"company","lineage":["https://openalex.org/I162282272"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tamotsu Ichikawa","raw_affiliation_strings":["ROHM Semiconductor, Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ROHM Semiconductor, Yokohama, Japan","institution_ids":["https://openalex.org/I162282272"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006944227","display_name":"Yujie Zhao","orcid":"https://orcid.org/0000-0001-8119-3120"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yujie Zhao","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010183568","display_name":"Jianglin Wei","orcid":"https://orcid.org/0000-0002-2952-7282"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Jianglin Wei","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101930271","display_name":"Kazumi Hatayama","orcid":"https://orcid.org/0000-0001-8416-8609"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazumi Hatayama","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101691738","display_name":"Haruo Kobayashi","orcid":"https://orcid.org/0000-0002-0990-5522"},"institutions":[{"id":"https://openalex.org/I165735259","display_name":"Gunma University","ror":"https://ror.org/046fm7598","country_code":"JP","type":"education","lineage":["https://openalex.org/I165735259"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Haruo Kobayashi","raw_affiliation_strings":["Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Division of Electronics and Informatics, Gunma University, Kiryu, Gunma, Japan","institution_ids":["https://openalex.org/I165735259"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":13,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.3005,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.78438977,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.7301254272460938},{"id":"https://openalex.org/keywords/ampere","display_name":"Ampere","score":0.6348888874053955},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.5831929445266724},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5813351273536682},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.5649881958961487},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5499465465545654},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5479405522346497},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.481052428483963},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.45211729407310486},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.43168431520462036},{"id":"https://openalex.org/keywords/accuracy-and-precision","display_name":"Accuracy and precision","score":0.4241790473461151},{"id":"https://openalex.org/keywords/noise-measurement","display_name":"Noise measurement","score":0.41983935236930847},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4094799757003784},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3023351728916168},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.23285841941833496},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.20945516228675842},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.19813311100006104},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1648191213607788},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.0788860023021698}],"concepts":[{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.7301254272460938},{"id":"https://openalex.org/C4941483","wikidata":"https://www.wikidata.org/wiki/Q25272","display_name":"Ampere","level":3,"score":0.6348888874053955},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.5831929445266724},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5813351273536682},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.5649881958961487},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5499465465545654},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5479405522346497},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.481052428483963},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.45211729407310486},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.43168431520462036},{"id":"https://openalex.org/C202799725","wikidata":"https://www.wikidata.org/wiki/Q272035","display_name":"Accuracy and precision","level":2,"score":0.4241790473461151},{"id":"https://openalex.org/C29265498","wikidata":"https://www.wikidata.org/wiki/Q7047719","display_name":"Noise measurement","level":3,"score":0.41983935236930847},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4094799757003784},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3023351728916168},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.23285841941833496},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.20945516228675842},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.19813311100006104},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1648191213607788},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0788860023021698},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs53924.2021.9665508","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs53924.2021.9665508","pdf_url":null,"source":{"id":"https://openalex.org/S4363608220","display_name":"2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.550000011920929}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2542258942","https://openalex.org/W3115478326","https://openalex.org/W3117370318"],"related_works":["https://openalex.org/W3200817179","https://openalex.org/W1960166976","https://openalex.org/W2380067098","https://openalex.org/W1992708211","https://openalex.org/W1548152478","https://openalex.org/W2137172615","https://openalex.org/W2407741852","https://openalex.org/W2374974007","https://openalex.org/W2392627782","https://openalex.org/W4293868501"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"a":[3],"fast":[4],"and":[5,37,47,66,84],"accurate":[6],"nan-ampere":[7],"current":[8],"measurement":[9,23],"method":[10,32],"for":[11],"shipping":[12],"stage":[13],"testing":[14,85],"of":[15,21,92],"mass":[16],"production":[17],"devices;":[18],"engineering":[19],"evaluations":[20],"its":[22],"variation":[24],"under":[25],"different":[26],"conditions":[27],"are":[28],"introduced.":[29],"The":[30],"proposed":[31],"employs":[33],"current-to-voltage":[34],"(IV)":[35],"conversion":[36,39],"DC-AC":[38],"to":[40,48],"suppress":[41],"the":[42,55],"low":[43,75],"frequency":[44],"noise":[45],"effects":[46],"enable":[49],"multi-channel":[50],"measurement.":[51],"We":[52],"statistically":[53],"analyze":[54],"data":[56],"gathered":[57],"from":[58],"two":[59],"source":[60],"resistors":[61],"with":[62,81],"several":[63,90],"sampling":[64],"frequencies":[65],"moving":[67],"averaging":[68],"processing;":[69],"we":[70],"show":[71],"that":[72],"currents":[73],"as":[74,76,87,89],"0.02nA":[77],"can":[78],"be":[79],"measured":[80],"good":[82],"linearity":[83],"times":[86],"short":[88],"tens":[91],"milli":[93],"seconds.":[94]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}