{"id":"https://openalex.org/W3115488374","doi":"https://doi.org/10.1109/icecs49266.2020.9294909","title":"Linearity Boosting Technique Analysis for a Modified Current-Mode Bandgap Reference","display_name":"Linearity Boosting Technique Analysis for a Modified Current-Mode Bandgap Reference","publication_year":2020,"publication_date":"2020-11-23","ids":{"openalex":"https://openalex.org/W3115488374","doi":"https://doi.org/10.1109/icecs49266.2020.9294909","mag":"3115488374"},"language":"en","primary_location":{"id":"doi:10.1109/icecs49266.2020.9294909","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs49266.2020.9294909","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 27th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024639540","display_name":"Antonio Aprile","orcid":"https://orcid.org/0000-0003-3918-9296"},"institutions":[{"id":"https://openalex.org/I25217355","display_name":"University of Pavia","ror":"https://ror.org/00s6t1f81","country_code":"IT","type":"education","lineage":["https://openalex.org/I25217355"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Antonio Aprile","raw_affiliation_strings":["Dept. of Electrical, Computer and Biomedical Engineering, University of Pavia, Pavia, Italy"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical, Computer and Biomedical Engineering, University of Pavia, Pavia, Italy","institution_ids":["https://openalex.org/I25217355"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067126768","display_name":"Daniele Gardino","orcid":"https://orcid.org/0009-0007-6988-8350"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Daniele Gardino","raw_affiliation_strings":["TDK InvenSense, Assago, Italy"],"affiliations":[{"raw_affiliation_string":"TDK InvenSense, Assago, Italy","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012770413","display_name":"P. Malcovati","orcid":"https://orcid.org/0000-0001-6514-9672"},"institutions":[{"id":"https://openalex.org/I25217355","display_name":"University of Pavia","ror":"https://ror.org/00s6t1f81","country_code":"IT","type":"education","lineage":["https://openalex.org/I25217355"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Piero Malcovati","raw_affiliation_strings":["Dept. of Electrical, Computer and Biomedical Engineering, University of Pavia, Pavia, Italy"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical, Computer and Biomedical Engineering, University of Pavia, Pavia, Italy","institution_ids":["https://openalex.org/I25217355"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002715573","display_name":"Edoardo Bonizzoni","orcid":"https://orcid.org/0000-0002-8398-8506"},"institutions":[{"id":"https://openalex.org/I25217355","display_name":"University of Pavia","ror":"https://ror.org/00s6t1f81","country_code":"IT","type":"education","lineage":["https://openalex.org/I25217355"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Edoardo Bonizzoni","raw_affiliation_strings":["Dept. of Electrical, Computer and Biomedical Engineering, University of Pavia, Pavia, Italy"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical, Computer and Biomedical Engineering, University of Pavia, Pavia, Italy","institution_ids":["https://openalex.org/I25217355"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5024639540"],"corresponding_institution_ids":["https://openalex.org/I25217355"],"apc_list":null,"apc_paid":null,"fwci":0.3433,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.56057729,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.8332446813583374},{"id":"https://openalex.org/keywords/bandgap-voltage-reference","display_name":"Bandgap voltage reference","score":0.5977278351783752},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5447313785552979},{"id":"https://openalex.org/keywords/boosting","display_name":"Boosting (machine learning)","score":0.5246955752372742},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.46796804666519165},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.43863701820373535},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.42729681730270386},{"id":"https://openalex.org/keywords/current-mirror","display_name":"Current mirror","score":0.41155609488487244},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3833026587963104},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24647051095962524},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.23425182700157166},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20941409468650818},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.18289226293563843},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12403291463851929}],"concepts":[{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.8332446813583374},{"id":"https://openalex.org/C127033052","wikidata":"https://www.wikidata.org/wiki/Q48635","display_name":"Bandgap voltage reference","level":5,"score":0.5977278351783752},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5447313785552979},{"id":"https://openalex.org/C46686674","wikidata":"https://www.wikidata.org/wiki/Q466303","display_name":"Boosting (machine learning)","level":2,"score":0.5246955752372742},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.46796804666519165},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.43863701820373535},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.42729681730270386},{"id":"https://openalex.org/C173966970","wikidata":"https://www.wikidata.org/wiki/Q786012","display_name":"Current mirror","level":4,"score":0.41155609488487244},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3833026587963104},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24647051095962524},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.23425182700157166},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20941409468650818},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.18289226293563843},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12403291463851929},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs49266.2020.9294909","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs49266.2020.9294909","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 27th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.9100000262260437,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W339279952","https://openalex.org/W1981569522","https://openalex.org/W1997811146","https://openalex.org/W2164546195","https://openalex.org/W2173932149","https://openalex.org/W2735241581","https://openalex.org/W2942956639","https://openalex.org/W3023868049"],"related_works":["https://openalex.org/W2020950753","https://openalex.org/W2030376661","https://openalex.org/W2384155416","https://openalex.org/W3216611571","https://openalex.org/W1988219128","https://openalex.org/W2004219286","https://openalex.org/W2017242416","https://openalex.org/W1965734378","https://openalex.org/W2107593492","https://openalex.org/W1494593565"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,38,42,57,80,99,119,127],"detailed":[4],"analysis":[5],"of":[6,19,23,45,84,102,121],"an":[7],"effective":[8],"method":[9],"to":[10,34,65,94,134],"improve":[11],"the":[12,16,20,63,95,103,112],"linearity":[13,90],"and,":[14],"consequently,":[15],"temperature":[17,67,100],"insensitivity":[18],"output":[21,104],"characteristic":[22],"current":[24,44,105,130],"processing":[25],"based":[26],"bandgap":[27],"references.":[28],"The":[29,69,88],"described":[30],"technique":[31],"is":[32,74],"shown":[33],"be":[35],"successful":[36],"on":[37],"circuit":[39,70],"which":[40,49],"generates":[41],"temperature-invariant":[43],"approximately":[46],"1":[47],"\u03bcA":[48],"has":[50,79],"been":[51],"designed":[52],"and":[53,77],"extensively":[54],"simulated":[55],"in":[56,62,111],"standard":[58],"130-nm":[59],"CMOS":[60],"process":[61],"-40\u00b0C":[64],"125\u00b0C":[66],"range.":[68],"nominal":[71],"supply":[72],"voltage":[73],"1.5":[75],"V":[76],"it":[78,116],"total":[81],"power":[82],"consumption":[83],"about":[85],"5":[86],"\u03bcW.":[87],"analyzed":[89],"boosting":[91],"technique,":[92],"applied":[93],"proposed":[96],"circuit,":[97],"provides":[98],"sensitivity":[101],"as":[106,108],"low":[107],"1.7":[109],"ppm/\u00b0C":[110],"considered":[113],"range,":[114],"making":[115],"suitable":[117],"for":[118],"lot":[120],"different":[122],"precision":[123],"applications":[124],"that":[125],"require":[126],"highly":[128],"stable":[129],"signal":[131],"with":[132],"respect":[133],"temperature.":[135]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}