{"id":"https://openalex.org/W3002936072","doi":"https://doi.org/10.1109/icecs46596.2019.8965003","title":"Design and testing of a CMOS Self-Biased Current Source","display_name":"Design and testing of a CMOS Self-Biased Current Source","publication_year":2019,"publication_date":"2019-11-01","ids":{"openalex":"https://openalex.org/W3002936072","doi":"https://doi.org/10.1109/icecs46596.2019.8965003","mag":"3002936072"},"language":"en","primary_location":{"id":"doi:10.1109/icecs46596.2019.8965003","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs46596.2019.8965003","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051649378","display_name":"Evandro Bolzan","orcid":"https://orcid.org/0000-0001-5541-2182"},"institutions":[{"id":"https://openalex.org/I4104125","display_name":"Universidade Federal de Santa Catarina","ror":"https://ror.org/041akq887","country_code":"BR","type":"education","lineage":["https://openalex.org/I4104125"]}],"countries":["BR"],"is_corresponding":true,"raw_author_name":"Evandro Bolzan","raw_affiliation_strings":["Federal University of Santa Catarina (UFSC),Electrical and Electronics Engineering Department,Florianópolis,SC,Brazil,88040-900","Federal University of Santa Catarina (UFSC), Florian\u00f3polis, SC, Brazil"],"affiliations":[{"raw_affiliation_string":"Federal University of Santa Catarina (UFSC),Electrical and Electronics Engineering Department,Florianópolis,SC,Brazil,88040-900","institution_ids":["https://openalex.org/I4104125"]},{"raw_affiliation_string":"Federal University of Santa Catarina (UFSC), Florian\u00f3polis, SC, Brazil","institution_ids":["https://openalex.org/I4104125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006525236","display_name":"Elias Buhler Storck","orcid":null},"institutions":[{"id":"https://openalex.org/I4104125","display_name":"Universidade Federal de Santa Catarina","ror":"https://ror.org/041akq887","country_code":"BR","type":"education","lineage":["https://openalex.org/I4104125"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Elias B\u00fchler Storck","raw_affiliation_strings":["Federal University of Santa Catarina (UFSC),Electrical and Electronics Engineering Department,Florianópolis,SC,Brazil,88040-900","Federal University of Santa Catarina (UFSC), Florian\u00f3polis, SC, Brazil"],"affiliations":[{"raw_affiliation_string":"Federal University of Santa Catarina (UFSC),Electrical and Electronics Engineering Department,Florianópolis,SC,Brazil,88040-900","institution_ids":["https://openalex.org/I4104125"]},{"raw_affiliation_string":"Federal University of Santa Catarina (UFSC), Florian\u00f3polis, SC, Brazil","institution_ids":["https://openalex.org/I4104125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036909929","display_name":"M.C. Schneider","orcid":"https://orcid.org/0000-0001-5733-9468"},"institutions":[{"id":"https://openalex.org/I4104125","display_name":"Universidade Federal de Santa Catarina","ror":"https://ror.org/041akq887","country_code":"BR","type":"education","lineage":["https://openalex.org/I4104125"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"M\u00e1rcio C. Schneider","raw_affiliation_strings":["Federal University of Santa Catarina (UFSC),Electrical and Electronics Engineering Department,Florianópolis,SC,Brazil,88040-900","Federal University of Santa Catarina (UFSC), Florian\u00f3polis, SC, Brazil"],"affiliations":[{"raw_affiliation_string":"Federal University of Santa Catarina (UFSC),Electrical and Electronics Engineering Department,Florianópolis,SC,Brazil,88040-900","institution_ids":["https://openalex.org/I4104125"]},{"raw_affiliation_string":"Federal University of Santa Catarina (UFSC), Florian\u00f3polis, SC, Brazil","institution_ids":["https://openalex.org/I4104125"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048376627","display_name":"Carlos Galup\u2010Montoro","orcid":"https://orcid.org/0000-0003-4623-6425"},"institutions":[{"id":"https://openalex.org/I4104125","display_name":"Universidade Federal de Santa Catarina","ror":"https://ror.org/041akq887","country_code":"BR","type":"education","lineage":["https://openalex.org/I4104125"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Carlos Galup-Montoro","raw_affiliation_strings":["Federal University of Santa Catarina (UFSC),Electrical and Electronics Engineering Department,Florianópolis,SC,Brazil,88040-900","Federal University of Santa Catarina (UFSC), Florian\u00f3polis, SC, Brazil"],"affiliations":[{"raw_affiliation_string":"Federal University of Santa Catarina (UFSC),Electrical and Electronics Engineering Department,Florianópolis,SC,Brazil,88040-900","institution_ids":["https://openalex.org/I4104125"]},{"raw_affiliation_string":"Federal University of Santa Catarina (UFSC), Florian\u00f3polis, SC, Brazil","institution_ids":["https://openalex.org/I4104125"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5051649378"],"corresponding_institution_ids":["https://openalex.org/I4104125"],"apc_list":null,"apc_paid":null,"fwci":0.1956,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.52278494,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"382","last_page":"385"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7697279453277588},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6350336670875549},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.6008182168006897},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5658392906188965},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.47508612275123596},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4748799204826355},{"id":"https://openalex.org/keywords/current-source","display_name":"Current source","score":0.4648313522338867},{"id":"https://openalex.org/keywords/inversion","display_name":"Inversion (geology)","score":0.42932772636413574},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28518277406692505},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.20600706338882446}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7697279453277588},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6350336670875549},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.6008182168006897},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5658392906188965},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.47508612275123596},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4748799204826355},{"id":"https://openalex.org/C2781331714","wikidata":"https://www.wikidata.org/wiki/Q1163768","display_name":"Current source","level":3,"score":0.4648313522338867},{"id":"https://openalex.org/C1893757","wikidata":"https://www.wikidata.org/wiki/Q3653001","display_name":"Inversion (geology)","level":3,"score":0.42932772636413574},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28518277406692505},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.20600706338882446},{"id":"https://openalex.org/C109007969","wikidata":"https://www.wikidata.org/wiki/Q749565","display_name":"Structural basin","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs46596.2019.8965003","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs46596.2019.8965003","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1557514514","https://openalex.org/W1564201208","https://openalex.org/W1650807027","https://openalex.org/W2014617689","https://openalex.org/W2102609694","https://openalex.org/W2140823559","https://openalex.org/W2151940289","https://openalex.org/W2153232339","https://openalex.org/W2178320339","https://openalex.org/W2514515394","https://openalex.org/W2747666341","https://openalex.org/W2906894655","https://openalex.org/W2940222991","https://openalex.org/W3147616483","https://openalex.org/W6685453833","https://openalex.org/W6762207489"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W4386230336","https://openalex.org/W4306968100","https://openalex.org/W2171986175","https://openalex.org/W2089791793","https://openalex.org/W2388181129","https://openalex.org/W2364070420","https://openalex.org/W2143875862"],"abstract_inverted_index":{"This":[0],"paper":[1,17],"presents":[2],"the":[3,21,32,35,41],"design":[4,13],"and":[5,45],"testing":[6],"of":[7,23,31,40],"a":[8,28,53],"self-biased":[9],"current":[10,37],"source.":[11],"The":[12,48],"described":[14],"in":[15,34,38,52],"this":[16],"is":[18],"based":[19],"on":[20],"concept":[22],"inversion":[24],"coefficient,":[25],"which":[26],"allows":[27],"direct":[29],"calculation":[30],"dispersion":[33],"output":[36],"terms":[39],"internal":[42],"bias":[43],"errors":[44],"transistor":[46],"mismatch.":[47],"circuit":[49],"was":[50],"fabricated":[51],"standard":[54],"CMOS":[55],"180":[56],"nm":[57],"technology.":[58]},"counts_by_year":[{"year":2021,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}