{"id":"https://openalex.org/W3002610499","doi":"https://doi.org/10.1109/icecs46596.2019.8964962","title":"Low Cost and High Performance Radiation Hardened Latch Design for Reliable Circuits","display_name":"Low Cost and High Performance Radiation Hardened Latch Design for Reliable Circuits","publication_year":2019,"publication_date":"2019-11-01","ids":{"openalex":"https://openalex.org/W3002610499","doi":"https://doi.org/10.1109/icecs46596.2019.8964962","mag":"3002610499"},"language":"en","primary_location":{"id":"doi:10.1109/icecs46596.2019.8964962","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs46596.2019.8964962","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035985978","display_name":"Ambika Prasad Shah","orcid":"https://orcid.org/0000-0003-0810-814X"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":true,"raw_author_name":"Ambika Prasad Shah","raw_affiliation_strings":["Institute for Microelectronics, TU Wien,Vienna,Austria","Institute for Microelectronics, TU Wien, Vienna, Austria"],"affiliations":[{"raw_affiliation_string":"Institute for Microelectronics, TU Wien,Vienna,Austria","institution_ids":["https://openalex.org/I145847075"]},{"raw_affiliation_string":"Institute for Microelectronics, TU Wien, Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077464890","display_name":"Michael Waltl","orcid":"https://orcid.org/0000-0001-6042-759X"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Michael Waltl","raw_affiliation_strings":["Institute for Microelectronics, TU Wien,Vienna,Austria","Institute for Microelectronics, TU Wien, Vienna, Austria"],"affiliations":[{"raw_affiliation_string":"Institute for Microelectronics, TU Wien,Vienna,Austria","institution_ids":["https://openalex.org/I145847075"]},{"raw_affiliation_string":"Institute for Microelectronics, TU Wien, Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5035985978"],"corresponding_institution_ids":["https://openalex.org/I145847075"],"apc_list":null,"apc_paid":null,"fwci":0.1192,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.49542996,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":93},"biblio":{"volume":null,"issue":null,"first_page":"197","last_page":"200"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9919999837875366,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nmos-logic","display_name":"NMOS logic","score":0.7612116932868958},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.7231174111366272},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6701425313949585},{"id":"https://openalex.org/keywords/schmitt-trigger","display_name":"Schmitt trigger","score":0.6578400731086731},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6253873705863953},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5249699950218201},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4566582143306732},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4107438325881958},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.40534162521362305},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3706035017967224},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3259090781211853},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16256222128868103}],"concepts":[{"id":"https://openalex.org/C197162436","wikidata":"https://www.wikidata.org/wiki/Q83908","display_name":"NMOS logic","level":4,"score":0.7612116932868958},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.7231174111366272},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6701425313949585},{"id":"https://openalex.org/C90201813","wikidata":"https://www.wikidata.org/wiki/Q202957","display_name":"Schmitt trigger","level":3,"score":0.6578400731086731},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6253873705863953},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5249699950218201},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4566582143306732},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4107438325881958},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.40534162521362305},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3706035017967224},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3259090781211853},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16256222128868103},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs46596.2019.8964962","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs46596.2019.8964962","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6600000262260437,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1011947702","https://openalex.org/W2034813406","https://openalex.org/W2143279430","https://openalex.org/W2148327955","https://openalex.org/W2170649610","https://openalex.org/W2344726030","https://openalex.org/W2443429837","https://openalex.org/W2905258051"],"related_works":["https://openalex.org/W2804413622","https://openalex.org/W2104615293","https://openalex.org/W1557535892","https://openalex.org/W2006330903","https://openalex.org/W1577267070","https://openalex.org/W1643664280","https://openalex.org/W2365537356","https://openalex.org/W2160490486","https://openalex.org/W2139358663","https://openalex.org/W2089754124"],"abstract_inverted_index":{"With":[0],"decreasing":[1],"device":[2],"dimension,":[3],"the":[4,41,45,54,65,80,84,102,113,122,132,142,153],"susceptibility":[5],"of":[6,48,124,129],"transistors":[7],"and":[8,90,96],"circuits":[9,67],"to":[10,52,71,76,118,134,162],"external":[11],"noise":[12],"sources":[13],"increase":[14],"especially":[15],"in":[16],"radiative":[17],"environments.":[18],"In":[19],"this":[20],"work,":[21],"a":[22,127],"radiation":[23],"hardened":[24],"latch":[25,50,116,155],"based":[26,115],"on":[27],"NMOS":[28],"only":[29],"Schmitt":[30],"trigger":[31],"with":[32,88,106],"voltage":[33],"booster":[34],"(NST-VB)":[35],"is":[36,98,147],"proposed.":[37],"We":[38,149],"first":[39],"analyze":[40],"critical":[42,85,103],"charge":[43,86,104,133],"at":[44],"internal":[46],"nodes":[47],"different":[49],"designs":[51],"identify":[53],"most":[55,143],"sensitive":[56],"node.":[57],"By":[58],"doing":[59],"so":[60],"our":[61],"results":[62,81],"reveal":[63],"that":[64,83,101,152],"proposed":[66,125,154],"show":[68,82],"highest":[69],"robustness":[70],"single":[72],"event":[73],"transients,":[74],"compared":[75,117,161],"reference":[77],"designs.":[78,164],"Furthermore,":[79],"decreases":[87],"temperature":[89,107],"increases":[91],"for":[92,112],"higher":[93],"supply":[94],"voltages,":[95],"it":[97],"further":[99],"observed":[100],"decrement":[105],"variation,":[108],"exhibiting":[109],"best":[110],"performance":[111,145,159],"NST-VB":[114],"others":[119],"circuits.":[120],"For":[121],"validation":[123],"latch,":[126],"figure":[128],"merit,":[130],"i.e.":[131],"power":[135],"delay":[136],"area":[137],"product":[138],"ratio":[139],"(QPAR),":[140],"considering":[141],"important":[144],"parameters":[146],"calculated.":[148],"clearly":[150],"observe":[151],"exhibits":[156],"significantly":[157],"enhanced":[158],"as":[160],"existing":[163]},"counts_by_year":[{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}