{"id":"https://openalex.org/W3002638775","doi":"https://doi.org/10.1109/icecs46596.2019.8964707","title":"RRAM Endurance and Retention: Challenges, Opportunities and Implications on Reliable Design","display_name":"RRAM Endurance and Retention: Challenges, Opportunities and Implications on Reliable Design","publication_year":2019,"publication_date":"2019-11-01","ids":{"openalex":"https://openalex.org/W3002638775","doi":"https://doi.org/10.1109/icecs46596.2019.8964707","mag":"3002638775"},"language":"en","primary_location":{"id":"doi:10.1109/icecs46596.2019.8964707","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs46596.2019.8964707","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002693116","display_name":"Zainab Swaidan","orcid":null},"institutions":[{"id":"https://openalex.org/I98635879","display_name":"American University of Beirut","ror":"https://ror.org/04pznsd21","country_code":"LB","type":"education","lineage":["https://openalex.org/I98635879"]}],"countries":["LB"],"is_corresponding":true,"raw_author_name":"Zainab Swaidan","raw_affiliation_strings":["American University of Beirut,Beirut,Lebanon,1107 2020","American University of Beirut, Beirut, Lebanon"],"affiliations":[{"raw_affiliation_string":"American University of Beirut,Beirut,Lebanon,1107 2020","institution_ids":["https://openalex.org/I98635879"]},{"raw_affiliation_string":"American University of Beirut, Beirut, Lebanon","institution_ids":["https://openalex.org/I98635879"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071376756","display_name":"Rouwaida Kanj","orcid":"https://orcid.org/0000-0002-3519-2917"},"institutions":[{"id":"https://openalex.org/I98635879","display_name":"American University of Beirut","ror":"https://ror.org/04pznsd21","country_code":"LB","type":"education","lineage":["https://openalex.org/I98635879"]}],"countries":["LB"],"is_corresponding":false,"raw_author_name":"Rouwaida Kanj","raw_affiliation_strings":["American University of Beirut,Beirut,Lebanon,1107 2020","American University of Beirut, Beirut, Lebanon"],"affiliations":[{"raw_affiliation_string":"American University of Beirut,Beirut,Lebanon,1107 2020","institution_ids":["https://openalex.org/I98635879"]},{"raw_affiliation_string":"American University of Beirut, Beirut, Lebanon","institution_ids":["https://openalex.org/I98635879"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035630226","display_name":"Johnny El Hajj","orcid":null},"institutions":[{"id":"https://openalex.org/I98635879","display_name":"American University of Beirut","ror":"https://ror.org/04pznsd21","country_code":"LB","type":"education","lineage":["https://openalex.org/I98635879"]}],"countries":["LB"],"is_corresponding":false,"raw_author_name":"Johnny El Hajj","raw_affiliation_strings":["American University of Beirut,Beirut,Lebanon,1107 2020","American University of Beirut, Beirut, Lebanon"],"affiliations":[{"raw_affiliation_string":"American University of Beirut,Beirut,Lebanon,1107 2020","institution_ids":["https://openalex.org/I98635879"]},{"raw_affiliation_string":"American University of Beirut, Beirut, Lebanon","institution_ids":["https://openalex.org/I98635879"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002242899","display_name":"Edward Saad","orcid":null},"institutions":[{"id":"https://openalex.org/I98635879","display_name":"American University of Beirut","ror":"https://ror.org/04pznsd21","country_code":"LB","type":"education","lineage":["https://openalex.org/I98635879"]}],"countries":["LB"],"is_corresponding":false,"raw_author_name":"Edward Saad","raw_affiliation_strings":["American University of Beirut,Beirut,Lebanon,1107 2020","American University of Beirut, Beirut, Lebanon"],"affiliations":[{"raw_affiliation_string":"American University of Beirut,Beirut,Lebanon,1107 2020","institution_ids":["https://openalex.org/I98635879"]},{"raw_affiliation_string":"American University of Beirut, Beirut, Lebanon","institution_ids":["https://openalex.org/I98635879"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008034875","display_name":"Fadi Kurdahi","orcid":"https://orcid.org/0000-0002-6982-365X"},"institutions":[{"id":"https://openalex.org/I4210140243","display_name":"Samueli Institute","ror":"https://ror.org/03teef091","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210140243"]},{"id":"https://openalex.org/I204250578","display_name":"University of California, Irvine","ror":"https://ror.org/04gyf1771","country_code":"US","type":"education","lineage":["https://openalex.org/I204250578"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fadi Kurdahi","raw_affiliation_strings":["The Henry Samueli School of Engineering, University of California Irvine,Irvine,CA,92697-2625","The Henry Samueli School of Engineering, University of California Irvine, Irvine, CA"],"affiliations":[{"raw_affiliation_string":"The Henry Samueli School of Engineering, University of California Irvine,Irvine,CA,92697-2625","institution_ids":["https://openalex.org/I204250578","https://openalex.org/I4210140243"]},{"raw_affiliation_string":"The Henry Samueli School of Engineering, University of California Irvine, Irvine, CA","institution_ids":["https://openalex.org/I204250578"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5002693116"],"corresponding_institution_ids":["https://openalex.org/I98635879"],"apc_list":null,"apc_paid":null,"fwci":0.847,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.75308142,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"402","last_page":"405"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7220818996429443},{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.6777202486991882},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.5752396583557129},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5346614122390747},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.5055913925170898},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5010583400726318},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4481462836265564},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.42650237679481506},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.4195464551448822},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3461902141571045},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2746782600879669},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.20753952860832214},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.17952045798301697},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.15177252888679504}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7220818996429443},{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.6777202486991882},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.5752396583557129},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5346614122390747},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.5055913925170898},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5010583400726318},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4481462836265564},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.42650237679481506},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.4195464551448822},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3461902141571045},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2746782600879669},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.20753952860832214},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.17952045798301697},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.15177252888679504},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs46596.2019.8964707","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs46596.2019.8964707","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8500000238418579}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1571862906","https://openalex.org/W1641127476","https://openalex.org/W1736066795","https://openalex.org/W1965288361","https://openalex.org/W2004823737","https://openalex.org/W2035054741","https://openalex.org/W2087748124","https://openalex.org/W2093122352","https://openalex.org/W2099554009","https://openalex.org/W2120557145","https://openalex.org/W2163748484","https://openalex.org/W2743776257","https://openalex.org/W4252314738","https://openalex.org/W4252689861"],"related_works":["https://openalex.org/W2076211355","https://openalex.org/W2533127403","https://openalex.org/W2007070351","https://openalex.org/W2033811947","https://openalex.org/W1551399929","https://openalex.org/W2790329865","https://openalex.org/W2183989414","https://openalex.org/W2410132916","https://openalex.org/W2783549708","https://openalex.org/W2162174949"],"abstract_inverted_index":{"We":[0,30,46],"provide":[1],"an":[2],"overview":[3],"of":[4,14,27,51,112],"metal":[5],"oxide":[6],"RRAM":[7],"design":[8,44],"challenges":[9],"and":[10,17,19,25,42,61,69,133,136],"opportunities":[11,41],"in":[12,109,129],"terms":[13],"endurance,":[15,68,127],"retention":[16],"variability":[18,63],"the":[20,23,48,99,110],"implications":[21],"on":[22],"reliability":[24],"security":[26],"memory":[28,40,59],"designs.":[29],"revise":[31],"multiple":[32],"level":[33],"cell":[34],"programming,":[35],"endurance":[36,57,91],"enhancing":[37,58],"mechanisms,":[38],"short-term":[39],"variability-aware":[43],"methods.":[45],"study":[47],"restore":[49,100,131],"yield":[50,108,139],"nonvolatile":[52],"SRAM":[53],"designs":[54],"for":[55],"different":[56],"windows":[60],"device":[62,142],"ranges":[64],"citing":[65],"power,":[66],"reliability,":[67],"store":[70,134],"energy":[71],"trade-offs":[72],"taking":[73],"into":[74],"consideration":[75],"program":[76,113],"instability.":[77,114],"A":[78,115],"resistor":[79,116],"window":[80,117],"with":[81,118],"a":[82,94],"low":[83,120,130,141],"high":[84,119],"resistance":[85,121],"state,":[86,122],"which":[87,123],"offers":[88],"100x":[89],"enhanced":[90,126],"compared":[92],"to":[93],"full":[95],"range":[96],"window,":[97],"increases":[98],"power":[101,132],"by":[102],"around":[103],"2x":[104],"while":[105],"maintaining":[106],"good":[107,138],"absence":[111],"has":[124],"10x":[125],"results":[128],"energy,":[135],"maintains":[137],"at":[140],"process":[143],"variations.":[144]},"counts_by_year":[{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":4}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}