{"id":"https://openalex.org/W4311224385","doi":"https://doi.org/10.1109/icecs202256217.2022.9970964","title":"Performance Comparison of BJT and MOS Devices as Temperature Sensing Elements","display_name":"Performance Comparison of BJT and MOS Devices as Temperature Sensing Elements","publication_year":2022,"publication_date":"2022-10-24","ids":{"openalex":"https://openalex.org/W4311224385","doi":"https://doi.org/10.1109/icecs202256217.2022.9970964"},"language":"en","primary_location":{"id":"doi:10.1109/icecs202256217.2022.9970964","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs202256217.2022.9970964","pdf_url":null,"source":{"id":"https://openalex.org/S4363607963","display_name":"2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024639540","display_name":"Antonio Aprile","orcid":"https://orcid.org/0000-0003-3918-9296"},"institutions":[{"id":"https://openalex.org/I25217355","display_name":"University of Pavia","ror":"https://ror.org/00s6t1f81","country_code":"IT","type":"education","lineage":["https://openalex.org/I25217355"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Antonio Aprile","raw_affiliation_strings":["University of Pavia,Department of Electrical, Computer and Biomedical Engineering,Italy","Department of Electrical, Computer and Biomedical Engineering, University of Pavia, Italy"],"affiliations":[{"raw_affiliation_string":"University of Pavia,Department of Electrical, Computer and Biomedical Engineering,Italy","institution_ids":["https://openalex.org/I25217355"]},{"raw_affiliation_string":"Department of Electrical, Computer and Biomedical Engineering, University of Pavia, Italy","institution_ids":["https://openalex.org/I25217355"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034882137","display_name":"Elisabetta Moisello","orcid":"https://orcid.org/0000-0001-8535-4227"},"institutions":[{"id":"https://openalex.org/I25217355","display_name":"University of Pavia","ror":"https://ror.org/00s6t1f81","country_code":"IT","type":"education","lineage":["https://openalex.org/I25217355"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Elisabetta Moisello","raw_affiliation_strings":["University of Pavia,Department of Electrical, Computer and Biomedical Engineering,Italy","Department of Electrical, Computer and Biomedical Engineering, University of Pavia, Italy"],"affiliations":[{"raw_affiliation_string":"University of Pavia,Department of Electrical, Computer and Biomedical Engineering,Italy","institution_ids":["https://openalex.org/I25217355"]},{"raw_affiliation_string":"Department of Electrical, Computer and Biomedical Engineering, University of Pavia, Italy","institution_ids":["https://openalex.org/I25217355"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002715573","display_name":"Edoardo Bonizzoni","orcid":"https://orcid.org/0000-0002-8398-8506"},"institutions":[{"id":"https://openalex.org/I25217355","display_name":"University of Pavia","ror":"https://ror.org/00s6t1f81","country_code":"IT","type":"education","lineage":["https://openalex.org/I25217355"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Edoardo Bonizzoni","raw_affiliation_strings":["University of Pavia,Department of Electrical, Computer and Biomedical Engineering,Italy","Department of Electrical, Computer and Biomedical Engineering, University of Pavia, Italy"],"affiliations":[{"raw_affiliation_string":"University of Pavia,Department of Electrical, Computer and Biomedical Engineering,Italy","institution_ids":["https://openalex.org/I25217355"]},{"raw_affiliation_string":"Department of Electrical, Computer and Biomedical Engineering, University of Pavia, Italy","institution_ids":["https://openalex.org/I25217355"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012770413","display_name":"P. Malcovati","orcid":"https://orcid.org/0000-0001-6514-9672"},"institutions":[{"id":"https://openalex.org/I25217355","display_name":"University of Pavia","ror":"https://ror.org/00s6t1f81","country_code":"IT","type":"education","lineage":["https://openalex.org/I25217355"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Piero Malcovati","raw_affiliation_strings":["University of Pavia,Department of Electrical, Computer and Biomedical Engineering,Italy","Department of Electrical, Computer and Biomedical Engineering, University of Pavia, Italy"],"affiliations":[{"raw_affiliation_string":"University of Pavia,Department of Electrical, Computer and Biomedical Engineering,Italy","institution_ids":["https://openalex.org/I25217355"]},{"raw_affiliation_string":"Department of Electrical, Computer and Biomedical Engineering, University of Pavia, Italy","institution_ids":["https://openalex.org/I25217355"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5024639540"],"corresponding_institution_ids":["https://openalex.org/I25217355"],"apc_list":null,"apc_paid":null,"fwci":0.9619,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.73144237,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bipolar-junction-transistor","display_name":"Bipolar junction transistor","score":0.8810187578201294},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.6125167608261108},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5918536186218262},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5915356874465942},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5856819152832031},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5236434936523438},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5234838724136353},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4602154493331909},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.43203017115592957},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43138161301612854},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3345482647418976},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3242989480495453},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20778995752334595},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.0725243091583252}],"concepts":[{"id":"https://openalex.org/C23061349","wikidata":"https://www.wikidata.org/wiki/Q188946","display_name":"Bipolar junction transistor","level":4,"score":0.8810187578201294},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.6125167608261108},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5918536186218262},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5915356874465942},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5856819152832031},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5236434936523438},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5234838724136353},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4602154493331909},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.43203017115592957},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43138161301612854},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3345482647418976},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3242989480495453},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20778995752334595},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0725243091583252},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs202256217.2022.9970964","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs202256217.2022.9970964","pdf_url":null,"source":{"id":"https://openalex.org/S4363607963","display_name":"2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Decent work and economic growth","id":"https://metadata.un.org/sdg/8","score":0.4300000071525574}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1969794630","https://openalex.org/W2086489180","https://openalex.org/W3045193417","https://openalex.org/W3046266258","https://openalex.org/W3080248049","https://openalex.org/W3115488374","https://openalex.org/W4205375546","https://openalex.org/W4308089738","https://openalex.org/W4312292409"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2023858428","https://openalex.org/W2218509615","https://openalex.org/W1840261322","https://openalex.org/W2126963364","https://openalex.org/W2538259895","https://openalex.org/W2617868873","https://openalex.org/W2051287254","https://openalex.org/W3204141294","https://openalex.org/W4324123959"],"abstract_inverted_index":{"The":[0,23],"majority":[1],"of":[2,14,18,25,66,83,86,91,120],"the":[3,11,15,50,58,64,67,80,89,108],"existing":[4],"on-chip":[5],"temperature":[6,112],"sensing":[7,105],"solutions":[8],"rely":[9],"on":[10,88],"thermal":[12],"behaviour":[13],"main":[16],"parameters":[17],"BJT":[19,41],"or":[20],"MOS":[21,39],"transistors.":[22],"success":[24],"their":[26,31,114],"employment":[27],"is":[28,70,116],"correlated":[29],"to":[30,56,110,123],"availability":[32],"in":[33,49,107,118],"standard":[34],"CMOS":[35],"processes;":[36],"since":[37],"usually":[38],"and":[40,93,128],"(even":[42],"if":[43],"parasitic)":[44],"transistors":[45],"can":[46],"be":[47],"implemented":[48],"same":[51],"technology,":[52],"an":[53,76],"in-depth":[54],"analysis":[55],"select":[57],"more":[59],"appropriate":[60],"device":[61],"for":[62,103],"meeting":[63],"requirements":[65],"considered":[68],"application":[69],"needed.":[71],"This":[72],"paper,":[73],"therefore,":[74],"presents":[75],"extensive":[77],"comparison":[78],"between":[79],"temperature-related":[81],"performance":[82,115],"these":[84],"kinds":[85],"devices":[87],"basis":[90],"simulated":[92],"experimental":[94],"results":[95],"collected":[96],"from":[97],"two":[98],"different":[99],"test":[100],"chips,":[101],"one":[102],"each":[104],"type,":[106],"\u221240\u00b0C":[109],"+80\u00b0C":[111],"range;":[113],"analyzed":[117],"terms":[119],"sensitivity,":[121],"susceptibility":[122],"mismatch":[124],"variations,":[125],"inaccuracy,":[126],"linearity":[127],"noise.":[129]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}