{"id":"https://openalex.org/W4311309973","doi":"https://doi.org/10.1109/icecs202256217.2022.9970943","title":"A 0.46 nV/\u221aHz JFET Low-Noise Amplifier for Characterization of Nanoelectrode Coating Materials","display_name":"A 0.46 nV/\u221aHz JFET Low-Noise Amplifier for Characterization of Nanoelectrode Coating Materials","publication_year":2022,"publication_date":"2022-10-24","ids":{"openalex":"https://openalex.org/W4311309973","doi":"https://doi.org/10.1109/icecs202256217.2022.9970943"},"language":"en","primary_location":{"id":"doi:10.1109/icecs202256217.2022.9970943","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs202256217.2022.9970943","pdf_url":null,"source":{"id":"https://openalex.org/S4363607963","display_name":"2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://doi.org/10.1109/ICECS202256217.2022.9970943","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073082581","display_name":"Elia A. Vallicelli","orcid":"https://orcid.org/0000-0003-0905-151X"},"institutions":[{"id":"https://openalex.org/I189158943","display_name":"University of Milan","ror":"https://ror.org/00wjc7c48","country_code":"IT","type":"education","lineage":["https://openalex.org/I189158943"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Elia A. Vallicelli","raw_affiliation_strings":["University of Milano,Department of Physics,Milano,Italy","Department of Physics, University of Milano, Milano, Italy"],"affiliations":[{"raw_affiliation_string":"University of Milano,Department of Physics,Milano,Italy","institution_ids":["https://openalex.org/I189158943"]},{"raw_affiliation_string":"Department of Physics, University of Milano, Milano, Italy","institution_ids":["https://openalex.org/I189158943"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046568713","display_name":"Valerio Di Palma","orcid":"https://orcid.org/0000-0002-8219-4894"},"institutions":[{"id":"https://openalex.org/I189158943","display_name":"University of Milan","ror":"https://ror.org/00wjc7c48","country_code":"IT","type":"education","lineage":["https://openalex.org/I189158943"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Valerio Di Palma","raw_affiliation_strings":["University of Milano,Department of Materials Science,Italy","Department of Materials Science, University of Milano, Italy"],"affiliations":[{"raw_affiliation_string":"University of Milano,Department of Materials Science,Italy","institution_ids":["https://openalex.org/I189158943"]},{"raw_affiliation_string":"Department of Materials Science, University of Milano, Italy","institution_ids":["https://openalex.org/I189158943"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029585591","display_name":"Marcello De Matteis","orcid":"https://orcid.org/0000-0003-1061-1262"},"institutions":[{"id":"https://openalex.org/I189158943","display_name":"University of Milan","ror":"https://ror.org/00wjc7c48","country_code":"IT","type":"education","lineage":["https://openalex.org/I189158943"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Marcello De Matteis","raw_affiliation_strings":["University of Milano,Department of Physics,Milano,Italy","Department of Physics, University of Milano, Milano, Italy"],"affiliations":[{"raw_affiliation_string":"University of Milano,Department of Physics,Milano,Italy","institution_ids":["https://openalex.org/I189158943"]},{"raw_affiliation_string":"Department of Physics, University of Milano, Milano, Italy","institution_ids":["https://openalex.org/I189158943"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038780136","display_name":"A. Bas\u00e7hirotto","orcid":"https://orcid.org/0000-0002-8844-5754"},"institutions":[{"id":"https://openalex.org/I189158943","display_name":"University of Milan","ror":"https://ror.org/00wjc7c48","country_code":"IT","type":"education","lineage":["https://openalex.org/I189158943"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Andrea Baschirotto","raw_affiliation_strings":["University of Milano,Department of Physics,Milano,Italy","Department of Physics, University of Milano, Milano, Italy"],"affiliations":[{"raw_affiliation_string":"University of Milano,Department of Physics,Milano,Italy","institution_ids":["https://openalex.org/I189158943"]},{"raw_affiliation_string":"Department of Physics, University of Milano, Milano, Italy","institution_ids":["https://openalex.org/I189158943"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008647090","display_name":"M. Fanciulli","orcid":"https://orcid.org/0000-0003-2951-0859"},"institutions":[{"id":"https://openalex.org/I189158943","display_name":"University of Milan","ror":"https://ror.org/00wjc7c48","country_code":"IT","type":"education","lineage":["https://openalex.org/I189158943"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Marco Fanciulli","raw_affiliation_strings":["University of Milano,Department of Materials Science,Italy","Department of Materials Science, University of Milano, Italy"],"affiliations":[{"raw_affiliation_string":"University of Milano,Department of Materials Science,Italy","institution_ids":["https://openalex.org/I189158943"]},{"raw_affiliation_string":"Department of Materials Science, University of Milano, Italy","institution_ids":["https://openalex.org/I189158943"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5073082581"],"corresponding_institution_ids":["https://openalex.org/I189158943"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.19297558,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"6 3","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jfet","display_name":"JFET","score":0.864348828792572},{"id":"https://openalex.org/keywords/flicker-noise","display_name":"Flicker noise","score":0.7964106798171997},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6354422569274902},{"id":"https://openalex.org/keywords/low-noise-amplifier","display_name":"Low-noise amplifier","score":0.6241092085838318},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5631053447723389},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4672622084617615},{"id":"https://openalex.org/keywords/noise-temperature","display_name":"Noise temperature","score":0.4195919930934906},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.41287434101104736},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3899545967578888},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3703557252883911},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.3636131286621094},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3012998104095459},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.2685742974281311},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.182728111743927},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16171032190322876},{"id":"https://openalex.org/keywords/field-effect-transistor","display_name":"Field-effect transistor","score":0.1130947470664978},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.09817206859588623},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.0556759238243103}],"concepts":[{"id":"https://openalex.org/C2778484494","wikidata":"https://www.wikidata.org/wiki/Q385520","display_name":"JFET","level":5,"score":0.864348828792572},{"id":"https://openalex.org/C113873419","wikidata":"https://www.wikidata.org/wiki/Q1410810","display_name":"Flicker noise","level":5,"score":0.7964106798171997},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6354422569274902},{"id":"https://openalex.org/C155332784","wikidata":"https://www.wikidata.org/wiki/Q1151304","display_name":"Low-noise amplifier","level":4,"score":0.6241092085838318},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5631053447723389},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4672622084617615},{"id":"https://openalex.org/C52660251","wikidata":"https://www.wikidata.org/wiki/Q17083145","display_name":"Noise temperature","level":3,"score":0.4195919930934906},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.41287434101104736},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3899545967578888},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3703557252883911},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.3636131286621094},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3012998104095459},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.2685742974281311},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.182728111743927},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16171032190322876},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.1130947470664978},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.09817206859588623},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0556759238243103},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/icecs202256217.2022.9970943","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs202256217.2022.9970943","pdf_url":null,"source":{"id":"https://openalex.org/S4363607963","display_name":"2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"},{"id":"pmh:oai:boa.unimib.it:10281/470984","is_oa":false,"landing_page_url":"https://hdl.handle.net/10281/470984","pdf_url":null,"source":{"id":"https://openalex.org/S4306401259","display_name":"BOA (University of Milano-Bicocca)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I66752286","host_organization_name":"University of Milano-Bicocca","host_organization_lineage":["https://openalex.org/I66752286"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:zenodo.org:13897306","is_oa":true,"landing_page_url":"https://doi.org/10.1109/ICECS202256217.2022.9970943","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 1-4, (2022-12-12)","raw_type":"info:eu-repo/semantics/conferencePaper"}],"best_oa_location":{"id":"pmh:oai:zenodo.org:13897306","is_oa":true,"landing_page_url":"https://doi.org/10.1109/ICECS202256217.2022.9970943","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS), 1-4, (2022-12-12)","raw_type":"info:eu-repo/semantics/conferencePaper"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3097519368","display_name":null,"funder_award_id":"863245","funder_id":"https://openalex.org/F4320320300","funder_display_name":"European Commission"}],"funders":[{"id":"https://openalex.org/F4320320300","display_name":"European Commission","ror":"https://ror.org/00k4n6c32"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W2023603575","https://openalex.org/W2157950330","https://openalex.org/W2161093362","https://openalex.org/W2887085435","https://openalex.org/W2980825657","https://openalex.org/W3093526971","https://openalex.org/W3140554452","https://openalex.org/W3152739785","https://openalex.org/W3179432870","https://openalex.org/W3180157116","https://openalex.org/W6784840146"],"related_works":["https://openalex.org/W2154819083","https://openalex.org/W1982657863","https://openalex.org/W2805726058","https://openalex.org/W2382937231","https://openalex.org/W3000916362","https://openalex.org/W2024400826","https://openalex.org/W2515952003","https://openalex.org/W2095707859","https://openalex.org/W2024183800","https://openalex.org/W3150374606"],"abstract_inverted_index":{"This":[0],"work":[1],"presents":[2],"the":[3,30,54,90],"design":[4],"and":[5,57,81,85],"experimental":[6],"validation":[7],"of":[8,20,62,78,93],"a":[9,14,39,94],"low-noise":[10],"amplifier":[11,41],"based":[12],"on":[13],"ultra-low-noise":[15],"JFET":[16,27,71],"for":[17,23,48],"noise":[18,32,42,49,68,82,91],"characterization":[19],"materials":[21],"samples":[22],"neural":[24],"interfaces.":[25],"The":[26,51,70],"LNA":[28,52,72],"amplifies":[29],"sample":[31],"power":[33,83],"by":[34,88],"46":[35],"dB":[36,67],"well":[37],"above":[38],"lock-in":[40],"floor,":[43],"used":[44],"as":[45],"spectrum":[46,84,92],"analyzer":[47],"characterization.":[50],"exploits":[53],"high":[55],"gm":[56],"low":[58],"flicker":[59],"corner":[60],"frequency":[61,79],"JFETs":[63],"to":[64],"achieve":[65],"0.15":[66],"figure.":[69],"has":[73],"been":[74],"characterized":[75],"in":[76],"terms":[77],"response":[80],"experimentally":[86],"validated":[87],"characterizing":[89],"platinum":[95],"silicide":[96],"(PtSi)":[97],"sample.":[98]},"counts_by_year":[],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}