{"id":"https://openalex.org/W2785657057","doi":"https://doi.org/10.1109/icecs.2017.8292053","title":"Yield analysis of nano-crossbar arrays for uniform and clustered defect distributions","display_name":"Yield analysis of nano-crossbar arrays for uniform and clustered defect distributions","publication_year":2017,"publication_date":"2017-12-01","ids":{"openalex":"https://openalex.org/W2785657057","doi":"https://doi.org/10.1109/icecs.2017.8292053","mag":"2785657057"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2017.8292053","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2017.8292053","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 24th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007428266","display_name":"Onur Tunali","orcid":"https://orcid.org/0000-0002-2326-0708"},"institutions":[{"id":"https://openalex.org/I48912391","display_name":"Istanbul Technical University","ror":"https://ror.org/059636586","country_code":"TR","type":"education","lineage":["https://openalex.org/I48912391"]}],"countries":["TR"],"is_corresponding":true,"raw_author_name":"Onur Tunali","raw_affiliation_strings":["Istanbul Technical University, Turkey"],"affiliations":[{"raw_affiliation_string":"Istanbul Technical University, Turkey","institution_ids":["https://openalex.org/I48912391"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010145600","display_name":"Mustafa Altun","orcid":"https://orcid.org/0000-0002-3103-1809"},"institutions":[{"id":"https://openalex.org/I48912391","display_name":"Istanbul Technical University","ror":"https://ror.org/059636586","country_code":"TR","type":"education","lineage":["https://openalex.org/I48912391"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Mustafa Altun","raw_affiliation_strings":["Istanbul Technical University, Turkey"],"affiliations":[{"raw_affiliation_string":"Istanbul Technical University, Turkey","institution_ids":["https://openalex.org/I48912391"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5007428266"],"corresponding_institution_ids":["https://openalex.org/I48912391"],"apc_list":null,"apc_paid":null,"fwci":0.2907,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.62401145,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"99","issue":null,"first_page":"534","last_page":"537"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/crossbar-switch","display_name":"Crossbar switch","score":0.8209837079048157},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.6110855340957642},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5685341954231262},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.516523540019989},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4766438901424408},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.47146087884902954},{"id":"https://openalex.org/keywords/probability-density-function","display_name":"Probability density function","score":0.4422532618045807},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.4182998239994049},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4119781255722046},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3906243145465851},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.33000779151916504},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.27732181549072266},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1854342520236969},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14276373386383057},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.13391748070716858},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.11211216449737549},{"id":"https://openalex.org/keywords/combinatorics","display_name":"Combinatorics","score":0.08208140730857849}],"concepts":[{"id":"https://openalex.org/C29984679","wikidata":"https://www.wikidata.org/wiki/Q1929149","display_name":"Crossbar switch","level":2,"score":0.8209837079048157},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.6110855340957642},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5685341954231262},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.516523540019989},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4766438901424408},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.47146087884902954},{"id":"https://openalex.org/C197055811","wikidata":"https://www.wikidata.org/wiki/Q207522","display_name":"Probability density function","level":2,"score":0.4422532618045807},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.4182998239994049},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4119781255722046},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3906243145465851},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.33000779151916504},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.27732181549072266},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1854342520236969},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14276373386383057},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.13391748070716858},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.11211216449737549},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.08208140730857849},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/icecs.2017.8292053","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2017.8292053","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 24th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"},{"id":"pmh:oai:polen.itu.edu.tr:11527/18013","is_oa":false,"landing_page_url":"http://hdl.handle.net/11527/18013","pdf_url":null,"source":{"id":"https://openalex.org/S4306400460","display_name":"Istanbul Technical University Academic Open Archive (Istanbul Technical University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I48912391","host_organization_name":"Istanbul Technical University","host_organization_lineage":["https://openalex.org/I48912391"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2017 24th IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"Conference Paper"},{"id":"pmh:oai:polen.itu.edu.tr:11527/68958","is_oa":false,"landing_page_url":"https://hdl.handle.net/11527/68958","pdf_url":null,"source":{"id":"https://openalex.org/S4306400460","display_name":"Istanbul Technical University Academic Open Archive (Istanbul Technical University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I48912391","host_organization_name":"Istanbul Technical University","host_organization_lineage":["https://openalex.org/I48912391"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W2000404220","https://openalex.org/W2045843249","https://openalex.org/W2067546549","https://openalex.org/W2086805781","https://openalex.org/W2113101444","https://openalex.org/W2120537303","https://openalex.org/W2120559207","https://openalex.org/W2154130651","https://openalex.org/W2513849801","https://openalex.org/W2752691479","https://openalex.org/W2769561581","https://openalex.org/W6726407907"],"related_works":["https://openalex.org/W2145932742","https://openalex.org/W1874409533","https://openalex.org/W2554791727","https://openalex.org/W1981395029","https://openalex.org/W2108083791","https://openalex.org/W4250137794","https://openalex.org/W2063341228","https://openalex.org/W2111673944","https://openalex.org/W2571519720","https://openalex.org/W2033578273"],"abstract_inverted_index":{"During":[0],"the":[1,14,19,25,37,54,76,100],"fabrication":[2],"of":[3,8,28,40,50],"nano-crossbar":[4,29],"arrays,":[5],"certain":[6],"amount":[7],"defective":[9],"elements":[10],"are":[11],"introduced":[12],"to":[13,36,133],"end":[15],"product":[16],"which":[17],"affect":[18],"yield":[20,26,62],"drastically.":[21],"Current":[22],"literature":[23],"regarding":[24,142],"analysis":[27,63,126],"arrays":[30],"is":[31,53],"very":[32],"rough":[33],"and":[34,68,79,94,114,130],"limited":[35],"uniform":[38,67,112,129],"distribution":[39],"defect":[41,70,84,92,124,153],"occurrence":[42],"with":[43,151],"a":[44,60,122,135],"few":[45],"exceptions.":[46],"Since":[47],"density":[48,125],"feature":[49],"crossbar":[51],"architectures":[52],"main":[55],"attracting":[56],"point,":[57],"we":[58,73,89,103,120,146],"perform":[59],"detailed":[61],"by":[64,127],"considering":[65],"both":[66],"non-uniform":[69],"distributions.":[71,144,154],"Firstly,":[72],"briefly":[74],"explain":[75,90],"present":[77],"algorithms":[78],"their":[80],"features":[81],"used":[82,98],"in":[83,99],"tolerant":[85],"logic":[86,95],"mapping.":[87],"Secondly,":[88],"different":[91,152],"distributions":[93,113],"function":[96],"assumptions":[97],"literature.":[101],"Thirdly,":[102],"formalize":[104],"an":[105],"approximate":[106],"successful":[107],"mapping":[108],"probability":[109],"metric":[110],"for":[111,139],"determine":[115],"area":[116,140],"overheads.":[117],"After":[118],"that,":[119],"apply":[121],"regional":[123],"comparing":[128],"clustered":[131,143],"defects":[132],"formulate":[134],"looser":[136],"upper":[137],"bound":[138],"overheads":[141],"Finally,":[145],"conduct":[147],"extensive":[148],"experimental":[149],"simulations":[150]},"counts_by_year":[{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-03-06T13:50:29.536080","created_date":"2025-10-10T00:00:00"}