{"id":"https://openalex.org/W2311846003","doi":"https://doi.org/10.1109/icecs.2015.7440340","title":"High coverage test for the second generation current conveyor","display_name":"High coverage test for the second generation current conveyor","publication_year":2015,"publication_date":"2015-12-01","ids":{"openalex":"https://openalex.org/W2311846003","doi":"https://doi.org/10.1109/icecs.2015.7440340","mag":"2311846003"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2015.7440340","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2015.7440340","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034596339","display_name":"Ahmed S. Emara","orcid":"https://orcid.org/0000-0002-7329-7795"},"institutions":[{"id":"https://openalex.org/I80693520","display_name":"American University in Cairo","ror":"https://ror.org/0176yqn58","country_code":"EG","type":"education","lineage":["https://openalex.org/I80693520"]}],"countries":["EG"],"is_corresponding":true,"raw_author_name":"A. S. Emara","raw_affiliation_strings":["Electronics Engineering Department, American University in Cairo, Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"Electronics Engineering Department, American University in Cairo, Cairo, Egypt","institution_ids":["https://openalex.org/I80693520"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035566088","display_name":"Ahmed H. Madian","orcid":"https://orcid.org/0000-0001-8313-8088"},"institutions":[{"id":"https://openalex.org/I3089115","display_name":"Egyptian Atomic Energy Authority","ror":"https://ror.org/04hd0yz67","country_code":"EG","type":"government","lineage":["https://openalex.org/I3089115"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"A. H. Madian","raw_affiliation_strings":["Radiation Engineering Department, Egyptian Atomic Energy Authority, Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"Radiation Engineering Department, Egyptian Atomic Energy Authority, Cairo, Egypt","institution_ids":["https://openalex.org/I3089115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109553881","display_name":"Hassanein H. Amer","orcid":null},"institutions":[{"id":"https://openalex.org/I80693520","display_name":"American University in Cairo","ror":"https://ror.org/0176yqn58","country_code":"EG","type":"education","lineage":["https://openalex.org/I80693520"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"H. H. Amer","raw_affiliation_strings":["Electronics Engineering Department, American University in Cairo, Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"Electronics Engineering Department, American University in Cairo, Cairo, Egypt","institution_ids":["https://openalex.org/I80693520"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073702088","display_name":"Sherif Amer","orcid":null},"institutions":[{"id":"https://openalex.org/I80693520","display_name":"American University in Cairo","ror":"https://ror.org/0176yqn58","country_code":"EG","type":"education","lineage":["https://openalex.org/I80693520"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"S. H. Amer","raw_affiliation_strings":["Electronics Engineering Department, American University in Cairo, Cairo, Egypt"],"affiliations":[{"raw_affiliation_string":"Electronics Engineering Department, American University in Cairo, Cairo, Egypt","institution_ids":["https://openalex.org/I80693520"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5034596339"],"corresponding_institution_ids":["https://openalex.org/I80693520"],"apc_list":null,"apc_paid":null,"fwci":0.177,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.57170428,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"137","issue":null,"first_page":"429","last_page":"432"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/current-conveyor","display_name":"Current conveyor","score":0.8668839931488037},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5602970719337463},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5262885689735413},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.516474723815918},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5107424259185791},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.4727505147457123},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4711305797100067},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.46111324429512024},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44155824184417725},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4357690215110779},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4194719195365906},{"id":"https://openalex.org/keywords/parasitic-capacitance","display_name":"Parasitic capacitance","score":0.4149896204471588},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.352785587310791},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.31068888306617737},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12241968512535095}],"concepts":[{"id":"https://openalex.org/C110252649","wikidata":"https://www.wikidata.org/wiki/Q5195095","display_name":"Current conveyor","level":4,"score":0.8668839931488037},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5602970719337463},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5262885689735413},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.516474723815918},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5107424259185791},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.4727505147457123},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4711305797100067},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.46111324429512024},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44155824184417725},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4357690215110779},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4194719195365906},{"id":"https://openalex.org/C154318817","wikidata":"https://www.wikidata.org/wiki/Q2157249","display_name":"Parasitic capacitance","level":4,"score":0.4149896204471588},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.352785587310791},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.31068888306617737},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12241968512535095},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs.2015.7440340","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2015.7440340","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8299999833106995,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1541860476","https://openalex.org/W1964060596","https://openalex.org/W1997318576","https://openalex.org/W2020664983","https://openalex.org/W2050676600","https://openalex.org/W2065136663","https://openalex.org/W2067323993","https://openalex.org/W2081076119","https://openalex.org/W2105290633","https://openalex.org/W2133455111","https://openalex.org/W2134698172","https://openalex.org/W2140979157","https://openalex.org/W2143592188","https://openalex.org/W2148025413","https://openalex.org/W2189181248","https://openalex.org/W2327421517","https://openalex.org/W3203011645","https://openalex.org/W6679540469"],"related_works":["https://openalex.org/W2080773395","https://openalex.org/W3212531278","https://openalex.org/W2161636646","https://openalex.org/W2099626417","https://openalex.org/W2019514496","https://openalex.org/W2085450379","https://openalex.org/W2354552488","https://openalex.org/W2058545256","https://openalex.org/W4396689093","https://openalex.org/W2394034449"],"abstract_inverted_index":{"This":[0,39],"paper":[1],"addresses":[2],"the":[3,14,70],"issue":[4],"of":[5],"finding":[6],"a":[7],"high":[8],"coverage":[9],"minimum":[10],"test":[11,23,84],"set":[12],"for":[13],"second":[15],"generation":[16],"current":[17,48,53,79],"conveyors":[18],"CCII.":[19],"The":[20],"circuit":[21,40],"under":[22],"is":[24,41,62],"used":[25,43],"in":[26,76],"active":[27],"capacitance":[28],"multipliers,":[29],"V-I":[30],"scalar":[31],"circuits,":[32],"Biquadratic":[33],"filters":[34],"and":[35,50],"many":[36],"other":[37],"applications.":[38],"often":[42],"to":[44,52,65,73,78,88],"implement":[45],"voltage":[46,51,77],"followers,":[47],"followers":[49],"converters.":[54],"Five":[55],"faults":[56],"are":[57,86],"assumed":[58],"per":[59],"transistor.":[60],"It":[61],"shown":[63],"that,":[64],"obtain":[66,89],"100%":[67],"fault":[68,91],"coverage,":[69],"CCII":[71],"has":[72],"be":[74],"operated":[75],"converter":[80],"mode.":[81],"Only":[82],"two":[83],"values":[85],"required":[87],"this":[90],"coverage.":[92]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}