{"id":"https://openalex.org/W2092627400","doi":"https://doi.org/10.1109/icecs.2014.7050060","title":"Fault tolerant implementation of a SpaceWire interface","display_name":"Fault tolerant implementation of a SpaceWire interface","publication_year":2014,"publication_date":"2014-12-01","ids":{"openalex":"https://openalex.org/W2092627400","doi":"https://doi.org/10.1109/icecs.2014.7050060","mag":"2092627400"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2014.7050060","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2014.7050060","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001442652","display_name":"Sebastian Taube","orcid":null},"institutions":[{"id":"https://openalex.org/I92894754","display_name":"Innovations for High Performance Microelectronics","ror":"https://ror.org/0489gab80","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I92894754"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Sebastian Taube","raw_affiliation_strings":["IHP, Frankfurt (Oder), Germany"],"affiliations":[{"raw_affiliation_string":"IHP, Frankfurt (Oder), Germany","institution_ids":["https://openalex.org/I92894754"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061082081","display_name":"Vladimir Petrovi\u0107","orcid":null},"institutions":[{"id":"https://openalex.org/I92894754","display_name":"Innovations for High Performance Microelectronics","ror":"https://ror.org/0489gab80","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I92894754"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Vladimir Petrovic","raw_affiliation_strings":["IHP, Frankfurt (Oder), Germany"],"affiliations":[{"raw_affiliation_string":"IHP, Frankfurt (Oder), Germany","institution_ids":["https://openalex.org/I92894754"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004959402","display_name":"Milo\u0161 Krsti\u0107","orcid":"https://orcid.org/0000-0003-0267-0203"},"institutions":[{"id":"https://openalex.org/I92894754","display_name":"Innovations for High Performance Microelectronics","ror":"https://ror.org/0489gab80","country_code":"DE","type":"facility","lineage":["https://openalex.org/I315704651","https://openalex.org/I92894754"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Milos Krstic","raw_affiliation_strings":["IHP, Frankfurt (Oder), Germany"],"affiliations":[{"raw_affiliation_string":"IHP, Frankfurt (Oder), Germany","institution_ids":["https://openalex.org/I92894754"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5001442652"],"corresponding_institution_ids":["https://openalex.org/I92894754"],"apc_list":null,"apc_paid":null,"fwci":0.4186,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.69132103,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"614","last_page":"617"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13436","display_name":"Space Technology and Applications","score":0.982200026512146,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9714000225067139,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.861860990524292},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.8349124193191528},{"id":"https://openalex.org/keywords/triple-modular-redundancy","display_name":"Triple modular redundancy","score":0.7535656690597534},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6457159519195557},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.6418205499649048},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6246634125709534},{"id":"https://openalex.org/keywords/transceiver","display_name":"Transceiver","score":0.5741930603981018},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.5160448551177979},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.4996962547302246},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.2603672444820404},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.18259727954864502},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.10620376467704773}],"concepts":[{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.861860990524292},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.8349124193191528},{"id":"https://openalex.org/C196371267","wikidata":"https://www.wikidata.org/wiki/Q3998979","display_name":"Triple modular redundancy","level":3,"score":0.7535656690597534},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6457159519195557},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.6418205499649048},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6246634125709534},{"id":"https://openalex.org/C7720470","wikidata":"https://www.wikidata.org/wiki/Q954187","display_name":"Transceiver","level":3,"score":0.5741930603981018},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.5160448551177979},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.4996962547302246},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.2603672444820404},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.18259727954864502},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.10620376467704773},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs.2014.7050060","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2014.7050060","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320337367","display_name":"Division of Materials Research","ror":"https://ror.org/01pc7k308"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W611078108","https://openalex.org/W1985951220","https://openalex.org/W2120185818","https://openalex.org/W2153953229"],"related_works":["https://openalex.org/W58658798","https://openalex.org/W3114375939","https://openalex.org/W3008821054","https://openalex.org/W2759696718","https://openalex.org/W2359816675","https://openalex.org/W2000379092","https://openalex.org/W2153096481","https://openalex.org/W2148616436","https://openalex.org/W2152497502","https://openalex.org/W2102525122"],"abstract_inverted_index":{"Due":[0],"to":[1,10,85],"cosmic":[2],"radiation,":[3],"semiconductor":[4],"chips":[5],"operating":[6],"in":[7,25],"space":[8,26],"have":[9],"be":[11],"protected":[12],"particularly":[13],"against":[14,53],"Single":[15,54],"Event":[16,55],"Effects":[17],"(SEE).":[18],"The":[19],"SpaceWire":[20,38,80,110],"protocol":[21,81],"is":[22,83,123],"frequently":[23],"used":[24],"vehicles,":[27],"connecting":[28],"mission":[29],"critical":[30],"devices.":[31],"To":[32],"increase":[33],"the":[34,51,64,74,79,87,93,117,124,129],"reliability":[35],"of":[36,66,95,131],"a":[37],"transceiver":[39,52],"under":[40],"these":[41,62],"conditions,":[42],"various":[43],"fault":[44,100,106,133,140],"tolerance":[45,107,134],"concepts":[46,102],"are":[47],"presented,":[48],"which":[49],"protect":[50],"Transients":[56],"(SETs)":[57],"and":[58],"Upsets":[59],"(SEUs).":[60],"Within":[61],"concepts,":[63],"application":[65,130],"modular":[67],"redundancy":[68,71],"with":[69,73,103],"information":[70],"respectively":[72],"error":[75],"correction":[76],"method":[77],"at":[78],"layer":[82],"combined":[84],"reduce":[86],"hardware":[88,132],"overhead.":[89],"This":[90],"paper":[91],"provides":[92,135],"evaluation":[94],"methods":[96],"combining":[97],"different":[98],"circuit-level":[99],"tolerant":[101],"existing":[104],"protocol-layer":[105],"provided":[108],"by":[109],"standard.":[111],"It":[112],"will":[113],"been":[114],"shown":[115],"that":[116],"concept":[118],"utilizing":[119],"Double":[120],"Modular":[121],"Redundancy":[122],"most":[125],"efficient":[126],"one,":[127],"while":[128],"advantages":[136],"only":[137],"for":[138],"high":[139],"densities.":[141]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}