{"id":"https://openalex.org/W2041800040","doi":"https://doi.org/10.1109/icecs.2014.7050017","title":"Transient response exploration of SRAM cell metastable states caused by ionizing radiation with 3D mixed mode simulation","display_name":"Transient response exploration of SRAM cell metastable states caused by ionizing radiation with 3D mixed mode simulation","publication_year":2014,"publication_date":"2014-12-01","ids":{"openalex":"https://openalex.org/W2041800040","doi":"https://doi.org/10.1109/icecs.2014.7050017","mag":"2041800040"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2014.7050017","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2014.7050017","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010195027","display_name":"A. Privat","orcid":"https://orcid.org/0000-0002-3161-7586"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Privat","raw_affiliation_strings":["School of Electrical Computer and Energy Engineering, Arizona State University (ASU), Tempe, AZ, USA","School of Electrical, Computer and Energy Engineering, Arizona State University (ASU), Tempe, AZ, 85287 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Computer and Energy Engineering, Arizona State University (ASU), Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"School of Electrical, Computer and Energy Engineering, Arizona State University (ASU), Tempe, AZ, 85287 USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015329523","display_name":"Lawrence T. Clark","orcid":"https://orcid.org/0000-0001-7741-6512"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"L. T. Clark","raw_affiliation_strings":["School of Electrical Computer and Energy Engineering, Arizona State University (ASU), Tempe, AZ, USA","School of Electrical, Computer and Energy Engineering, Arizona State University (ASU), Tempe, AZ, 85287 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Computer and Energy Engineering, Arizona State University (ASU), Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"School of Electrical, Computer and Energy Engineering, Arizona State University (ASU), Tempe, AZ, 85287 USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075047270","display_name":"Hugh Barnaby","orcid":"https://orcid.org/0000-0002-8136-1849"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H. J. Barnaby","raw_affiliation_strings":["School of Electrical Computer and Energy Engineering, Arizona State University (ASU), Tempe, AZ, USA","School of Electrical, Computer and Energy Engineering, Arizona State University (ASU), Tempe, AZ, 85287 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Computer and Energy Engineering, Arizona State University (ASU), Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"School of Electrical, Computer and Energy Engineering, Arizona State University (ASU), Tempe, AZ, 85287 USA","institution_ids":["https://openalex.org/I55732556"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I55732556"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.13247561,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"443","last_page":"446"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/metastability","display_name":"Metastability","score":0.834182620048523},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.796968400478363},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.6067169308662415},{"id":"https://openalex.org/keywords/ionizing-radiation","display_name":"Ionizing radiation","score":0.5760161280632019},{"id":"https://openalex.org/keywords/irradiation","display_name":"Irradiation","score":0.5323588848114014},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.4706788659095764},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.44649070501327515},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.43764370679855347},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.4308658540248871},{"id":"https://openalex.org/keywords/ion","display_name":"Ion","score":0.42642515897750854},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.4194628596305847},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3736467957496643},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3704340159893036},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.34072935581207275},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16246634721755981},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.15138250589370728},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.10657688975334167},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.08420395851135254}],"concepts":[{"id":"https://openalex.org/C89464430","wikidata":"https://www.wikidata.org/wiki/Q849516","display_name":"Metastability","level":2,"score":0.834182620048523},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.796968400478363},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.6067169308662415},{"id":"https://openalex.org/C18231593","wikidata":"https://www.wikidata.org/wiki/Q186161","display_name":"Ionizing radiation","level":3,"score":0.5760161280632019},{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.5323588848114014},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.4706788659095764},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.44649070501327515},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.43764370679855347},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.4308658540248871},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.42642515897750854},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.4194628596305847},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3736467957496643},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3704340159893036},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.34072935581207275},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16246634721755981},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.15138250589370728},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.10657688975334167},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.08420395851135254},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs.2014.7050017","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2014.7050017","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1985078591","https://openalex.org/W1988316118","https://openalex.org/W2026113654","https://openalex.org/W2037576944","https://openalex.org/W2107610972","https://openalex.org/W2118351481","https://openalex.org/W2123863724","https://openalex.org/W2138111642","https://openalex.org/W2168101540","https://openalex.org/W6646359768"],"related_works":["https://openalex.org/W4290647047","https://openalex.org/W2622269177","https://openalex.org/W2363504003","https://openalex.org/W2066033226","https://openalex.org/W1523508240","https://openalex.org/W1500230652","https://openalex.org/W3208260600","https://openalex.org/W2766443086","https://openalex.org/W2617585808","https://openalex.org/W658316774"],"abstract_inverted_index":{"This":[0],"paper":[1],"reports":[2],"on":[3],"the":[4,10,41,63,74,81,85],"simulation":[5],"and":[6,14,29,55],"experimental":[7],"results":[8],"examining":[9],"interaction":[11],"between":[12],"mismatch":[13,83],"soft-errors":[15],"in":[16],"SRAM":[17],"cells.":[18],"Multiple":[19],"bit":[20],"upsets":[21],"(MBU)":[22],"due":[23,61],"to":[24,46,62],"ion":[25],"irradiation":[26],"are":[27],"measured":[28],"show":[30,56],"a":[31],"significant":[32],"probability":[33],"of":[34],"not":[35],"upsetting":[36],"otherwise":[37],"identical":[38],"cells,":[39],"including":[40],"stored":[42],"state.":[43],"In":[44],"order":[45],"understand":[47],"this":[48],"behavior,":[49],"we":[50],"use":[51],"3D":[52],"device":[53],"simulations":[54],"that":[57],"they":[58],"may":[59],"be":[60],"cells":[64],"being":[65],"driven":[66],"metastable":[67],"by":[68,80],"radiation":[69],"induced":[70],"collected":[71],"charge,":[72],"whence":[73],"final":[75],"state":[76],"is":[77],"strongly":[78],"determined":[79],"circuit":[82],"within":[84],"cell.":[86]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2026-08-15T07:11:24.734988","created_date":"2025-10-10T00:00:00"}