{"id":"https://openalex.org/W2033542075","doi":"https://doi.org/10.1109/icecs.2014.7049906","title":"Radiation-hardened techniques for CMOS flash ADC","display_name":"Radiation-hardened techniques for CMOS flash ADC","publication_year":2014,"publication_date":"2014-12-01","ids":{"openalex":"https://openalex.org/W2033542075","doi":"https://doi.org/10.1109/icecs.2014.7049906","mag":"2033542075"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2014.7049906","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2014.7049906","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064681348","display_name":"U. Gatti","orcid":"https://orcid.org/0000-0002-1831-4345"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Umberto Gatti","raw_affiliation_strings":["RedCatDevices Milan, Italy"],"affiliations":[{"raw_affiliation_string":"RedCatDevices Milan, Italy","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042060595","display_name":"Cristiano Calligaro","orcid":"https://orcid.org/0000-0003-4298-5939"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Cristiano Calligaro","raw_affiliation_strings":["RedCatDevices Milan, Italy"],"affiliations":[{"raw_affiliation_string":"RedCatDevices Milan, Italy","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082597513","display_name":"Evgeny Pikhay","orcid":"https://orcid.org/0000-0002-0156-4241"},"institutions":[{"id":"https://openalex.org/I4210109451","display_name":"Tower Semiconductor (Israel)","ror":"https://ror.org/01r2vjq11","country_code":"IL","type":"company","lineage":["https://openalex.org/I4210109451"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Evgeny Pikhay","raw_affiliation_strings":["TowerJazz MigdalHaEmek, Israel","TowerJazz, MigdalHaEmek, Israel"],"affiliations":[{"raw_affiliation_string":"TowerJazz MigdalHaEmek, Israel","institution_ids":[]},{"raw_affiliation_string":"TowerJazz, MigdalHaEmek, Israel","institution_ids":["https://openalex.org/I4210109451"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061181795","display_name":"Yakov Roizin","orcid":"https://orcid.org/0000-0002-9484-1681"},"institutions":[{"id":"https://openalex.org/I4210109451","display_name":"Tower Semiconductor (Israel)","ror":"https://ror.org/01r2vjq11","country_code":"IL","type":"company","lineage":["https://openalex.org/I4210109451"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Yakov Roizin","raw_affiliation_strings":["TowerJazz MigdalHaEmek, Israel","TowerJazz, MigdalHaEmek, Israel"],"affiliations":[{"raw_affiliation_string":"TowerJazz MigdalHaEmek, Israel","institution_ids":[]},{"raw_affiliation_string":"TowerJazz, MigdalHaEmek, Israel","institution_ids":["https://openalex.org/I4210109451"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5064681348"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.628,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.73048272,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flash-adc","display_name":"Flash ADC","score":0.8137331008911133},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7813109159469604},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.675172746181488},{"id":"https://openalex.org/keywords/radiation-hardening","display_name":"Radiation hardening","score":0.5274921655654907},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5172046422958374},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5086523294448853},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.41970694065093994},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.414616197347641},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3962719142436981},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26263439655303955},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1397818922996521},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1019650399684906},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.07643228769302368},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.06682473421096802}],"concepts":[{"id":"https://openalex.org/C164862427","wikidata":"https://www.wikidata.org/wiki/Q2744647","display_name":"Flash ADC","level":4,"score":0.8137331008911133},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7813109159469604},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.675172746181488},{"id":"https://openalex.org/C119349744","wikidata":"https://www.wikidata.org/wiki/Q3026015","display_name":"Radiation hardening","level":3,"score":0.5274921655654907},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5172046422958374},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5086523294448853},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.41970694065093994},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.414616197347641},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3962719142436981},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26263439655303955},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1397818922996521},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1019650399684906},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.07643228769302368},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.06682473421096802},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs.2014.7049906","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2014.7049906","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.41999998688697815,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"},{"score":0.4000000059604645,"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2020846551","https://openalex.org/W2032105699","https://openalex.org/W2109339995","https://openalex.org/W2125639054","https://openalex.org/W2131303554","https://openalex.org/W2133712337","https://openalex.org/W2172871894","https://openalex.org/W6679279913"],"related_works":["https://openalex.org/W1629214335","https://openalex.org/W3139879056","https://openalex.org/W2095856099","https://openalex.org/W1979972974","https://openalex.org/W2333137665","https://openalex.org/W4296887773","https://openalex.org/W1939000505","https://openalex.org/W2501578203","https://openalex.org/W2113108952","https://openalex.org/W2040773997"],"abstract_inverted_index":{"This":[0],"work":[1],"presents":[2],"a":[3,51,64,69],"rad-hard":[4],"4-bit":[5],"10MHz":[6],"Flash":[7],"ADC":[8,46],"for":[9],"space":[10],"applications.":[11],"The":[12,26,45,58],"converter":[13],"has":[14,47,60],"been":[15,48,61],"developed":[16],"using":[17],"rad-hardened":[18],"techniques":[19],"both":[20],"at":[21],"architecture":[22],"and":[23,67],"layout":[24],"levels.":[25],"design":[27],"takes":[28],"into":[29],"account":[30],"the":[31,35,40],"different":[32],"effects":[33],"of":[34],"radiation":[36],"that":[37],"could":[38],"damage":[39],"circuits":[41],"in":[42,50],"harsh":[43],"environments.":[44],"integrated":[49],"standard":[52],"CMOS":[53],"0.18-\u03bcm":[54],"technology":[55],"by":[56],"TowerJazz.":[57],"prototype":[59],"tested":[62],"with":[63],"custom":[65],"methodology":[66],"showed":[68],"Total":[70],"Dose":[71],"immunity":[72],"up":[73],"to":[74],"300krad.":[75]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}