{"id":"https://openalex.org/W2013525748","doi":"https://doi.org/10.1109/icecs.2013.6815412","title":"Variability mitigation using correction function technique","display_name":"Variability mitigation using correction function technique","publication_year":2013,"publication_date":"2013-12-01","ids":{"openalex":"https://openalex.org/W2013525748","doi":"https://doi.org/10.1109/icecs.2013.6815412","mag":"2013525748"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2013.6815412","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2013.6815412","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5072040326","display_name":"Shady Agwa","orcid":"https://orcid.org/0000-0002-6678-6283"},"institutions":[{"id":"https://openalex.org/I80693520","display_name":"American University in Cairo","ror":"https://ror.org/0176yqn58","country_code":"EG","type":"education","lineage":["https://openalex.org/I80693520"]}],"countries":["EG"],"is_corresponding":true,"raw_author_name":"Shady Agwa","raw_affiliation_strings":["Center of Nanoelectronics and Devices (CND), American University in Cairo, Cairo, Egypt","[Center of Nanoelectronics and Devices (CND), American University in Cairo, Zewail City of Science and Technology]"],"affiliations":[{"raw_affiliation_string":"Center of Nanoelectronics and Devices (CND), American University in Cairo, Cairo, Egypt","institution_ids":["https://openalex.org/I80693520"]},{"raw_affiliation_string":"[Center of Nanoelectronics and Devices (CND), American University in Cairo, Zewail City of Science and Technology]","institution_ids":["https://openalex.org/I80693520"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084741373","display_name":"Eslam Yahya","orcid":null},"institutions":[{"id":"https://openalex.org/I80693520","display_name":"American University in Cairo","ror":"https://ror.org/0176yqn58","country_code":"EG","type":"education","lineage":["https://openalex.org/I80693520"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Eslam Yahya","raw_affiliation_strings":["Center of Nanoelectronics and Devices (CND), American University in Cairo, Cairo, Egypt","[Center of Nanoelectronics and Devices (CND), American University in Cairo, Zewail City of Science and Technology]"],"affiliations":[{"raw_affiliation_string":"Center of Nanoelectronics and Devices (CND), American University in Cairo, Cairo, Egypt","institution_ids":["https://openalex.org/I80693520"]},{"raw_affiliation_string":"[Center of Nanoelectronics and Devices (CND), American University in Cairo, Zewail City of Science and Technology]","institution_ids":["https://openalex.org/I80693520"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084980840","display_name":"Yehea Ismail","orcid":"https://orcid.org/0000-0003-3956-7533"},"institutions":[{"id":"https://openalex.org/I80693520","display_name":"American University in Cairo","ror":"https://ror.org/0176yqn58","country_code":"EG","type":"education","lineage":["https://openalex.org/I80693520"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Yehea Ismail","raw_affiliation_strings":["Center of Nanoelectronics and Devices (CND), American University in Cairo, Cairo, Egypt","[Center of Nanoelectronics and Devices (CND), American University in Cairo, Zewail City of Science and Technology]"],"affiliations":[{"raw_affiliation_string":"Center of Nanoelectronics and Devices (CND), American University in Cairo, Cairo, Egypt","institution_ids":["https://openalex.org/I80693520"]},{"raw_affiliation_string":"[Center of Nanoelectronics and Devices (CND), American University in Cairo, Zewail City of Science and Technology]","institution_ids":["https://openalex.org/I80693520"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5072040326"],"corresponding_institution_ids":["https://openalex.org/I80693520"],"apc_list":null,"apc_paid":null,"fwci":0.2365,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.59213839,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"293","last_page":"296"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7191504240036011},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6224521398544312},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.5844272971153259},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.5389642715454102},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5279516577720642},{"id":"https://openalex.org/keywords/pipeline","display_name":"Pipeline (software)","score":0.5070528984069824},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4789029657840729},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4330149292945862},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.33778077363967896},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2544299364089966},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1972430944442749},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16169890761375427}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7191504240036011},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6224521398544312},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.5844272971153259},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5389642715454102},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5279516577720642},{"id":"https://openalex.org/C43521106","wikidata":"https://www.wikidata.org/wiki/Q2165493","display_name":"Pipeline (software)","level":2,"score":0.5070528984069824},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4789029657840729},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4330149292945862},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.33778077363967896},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2544299364089966},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1972430944442749},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16169890761375427},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs.2013.6815412","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2013.6815412","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 20th International Conference on Electronics, Circuits, and Systems (ICECS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2019017236","https://openalex.org/W2104677471","https://openalex.org/W2126845391","https://openalex.org/W2136006926","https://openalex.org/W2150977159","https://openalex.org/W2169336791","https://openalex.org/W4236432903","https://openalex.org/W4236461749"],"related_works":["https://openalex.org/W2041615232","https://openalex.org/W2149032943","https://openalex.org/W2167002145","https://openalex.org/W2106281713","https://openalex.org/W2110991008","https://openalex.org/W2000201823","https://openalex.org/W2042832476","https://openalex.org/W2149051075","https://openalex.org/W2061536619","https://openalex.org/W2394408226"],"abstract_inverted_index":{"As":[0],"the":[1,8,25,28,37,42,46,58,81,89,93,104,109,116,121],"fabrication":[2],"technology":[3],"migrates":[4],"towards":[5],"nanometer":[6],"scale;":[7],"timing":[9,44,59],"constraints":[10],"of":[11,27,45,106,108,127,132],"sequential":[12,29,47],"circuits":[13],"have":[14],"become":[15],"more":[16],"critical.":[17],"Process":[18],"voltage":[19,91],"and":[20,39,114,129],"temperature":[21],"variations":[22],"(PVT)":[23],"increase":[24],"unreliability":[26],"circuits.":[30,48],"There":[31],"are":[32],"different":[33],"techniques":[34,50,71],"to":[35,40,69,87,102],"tolerate":[36],"variability":[38],"mitigate":[41],"critical":[43],"Traditional":[49],"using":[51,72],"clock":[52],"skewing":[53],"or":[54,92],"soft-edge":[55],"flipflop":[56],"relax":[57],"conditions":[60],"by":[61],"stealing":[62],"time":[63],"from":[64],"adjacent":[65],"stages.":[66],"In":[67],"contrast":[68],"traditional":[70],"correction":[73,97],"function":[74,98],"technique":[75,99],"can":[76],"give":[77],"an":[78],"indication":[79],"about":[80],"error":[82,105],"rate":[83],"which":[84],"is":[85,100],"useful":[86],"re-adjust":[88],"supply":[90],"operating":[94],"frequency.":[95],"The":[96],"able":[101],"detect":[103],"one":[107],"4\u00d74":[110],"bit":[111],"multiplier's":[112],"inputs":[113],"correct":[115],"output":[117],"data":[118],"without":[119],"flushing":[120],"pipeline":[122],"stages":[123],"with":[124],"1.459x":[125],"overhead":[126,131],"area":[128],"1.427x":[130],"power.":[133]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}