{"id":"https://openalex.org/W3013218635","doi":"https://doi.org/10.1109/icecs.2012.6463766","title":"Temperature considerations on Hall Effect sensors current-related sensitivity behaviour","display_name":"Temperature considerations on Hall Effect sensors current-related sensitivity behaviour","publication_year":2012,"publication_date":"2012-12-01","ids":{"openalex":"https://openalex.org/W3013218635","doi":"https://doi.org/10.1109/icecs.2012.6463766","mag":"3013218635"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2012.6463766","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2012.6463766","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 19th IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2012)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034372215","display_name":"Maria-Alexandra P\u00e3un","orcid":"https://orcid.org/0000-0003-2088-7457"},"institutions":[{"id":"https://openalex.org/I5124864","display_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","ror":"https://ror.org/02s376052","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I5124864"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Maria-Alexandra Paun","raw_affiliation_strings":["STI-IEL-Electronics Laboratory, Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne, Lausanne, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STI-IEL-Electronics Laboratory, Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne, Lausanne, Switzerland","institution_ids":["https://openalex.org/I5124864"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060693851","display_name":"Jean-Michel Sall\u00e8se","orcid":"https://orcid.org/0000-0003-2109-909X"},"institutions":[{"id":"https://openalex.org/I5124864","display_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","ror":"https://ror.org/02s376052","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I5124864"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Jean-Michel Sallese","raw_affiliation_strings":["STI-IEL-Electronics Laboratory, Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne, Lausanne, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STI-IEL-Electronics Laboratory, Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne, Lausanne, Switzerland","institution_ids":["https://openalex.org/I5124864"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037002764","display_name":"Maher Kayal","orcid":"https://orcid.org/0000-0001-5962-174X"},"institutions":[{"id":"https://openalex.org/I5124864","display_name":"\u00c9cole Polytechnique F\u00e9d\u00e9rale de Lausanne","ror":"https://ror.org/02s376052","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I5124864"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Maher Kayal","raw_affiliation_strings":["STI-IEL-Electronics Laboratory, Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne, Lausanne, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STI-IEL-Electronics Laboratory, Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne, Lausanne, Switzerland","institution_ids":["https://openalex.org/I5124864"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I5124864"],"apc_list":null,"apc_paid":null,"fwci":0.8246,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.73543838,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"201","last_page":"204"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.8627925515174866},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.6623996496200562},{"id":"https://openalex.org/keywords/hall-effect","display_name":"Hall effect","score":0.6343400478363037},{"id":"https://openalex.org/keywords/hall-effect-sensor","display_name":"Hall effect sensor","score":0.5940223932266235},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4381181001663208},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.41639381647109985},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.38319602608680725},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.28438305854797363},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2697666585445404},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19808340072631836},{"id":"https://openalex.org/keywords/electrical-resistivity-and-conductivity","display_name":"Electrical resistivity and conductivity","score":0.14276909828186035}],"concepts":[{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.8627925515174866},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.6623996496200562},{"id":"https://openalex.org/C134112204","wikidata":"https://www.wikidata.org/wiki/Q10656","display_name":"Hall effect","level":3,"score":0.6343400478363037},{"id":"https://openalex.org/C107637996","wikidata":"https://www.wikidata.org/wiki/Q1431247","display_name":"Hall effect sensor","level":3,"score":0.5940223932266235},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4381181001663208},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.41639381647109985},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38319602608680725},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.28438305854797363},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2697666585445404},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19808340072631836},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.14276909828186035},{"id":"https://openalex.org/C16389437","wikidata":"https://www.wikidata.org/wiki/Q11421","display_name":"Magnet","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs.2012.6463766","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2012.6463766","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 19th IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2012)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.41999998688697815,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W11593175","https://openalex.org/W418432802","https://openalex.org/W758546253","https://openalex.org/W1999328338","https://openalex.org/W2005319760","https://openalex.org/W2014034928","https://openalex.org/W2038279721","https://openalex.org/W2050321012","https://openalex.org/W2050955442","https://openalex.org/W2053406263","https://openalex.org/W2068200693","https://openalex.org/W2070853820","https://openalex.org/W2074259603","https://openalex.org/W2096885355","https://openalex.org/W2167242465","https://openalex.org/W2172177833","https://openalex.org/W2176865545","https://openalex.org/W2471301854","https://openalex.org/W2490765418","https://openalex.org/W3147289055","https://openalex.org/W3149109106","https://openalex.org/W4243374555","https://openalex.org/W6600442565","https://openalex.org/W6674501538","https://openalex.org/W6685163934"],"related_works":["https://openalex.org/W3162919010","https://openalex.org/W2622830326","https://openalex.org/W2151516162","https://openalex.org/W2906319801","https://openalex.org/W3145181685","https://openalex.org/W2019901197","https://openalex.org/W1667373633","https://openalex.org/W2370291732","https://openalex.org/W2007447343","https://openalex.org/W1979220576"],"abstract_inverted_index":{"The":[0],"present":[1],"paper":[2],"focuses":[3],"on":[4,9],"presenting":[5],"the":[6,21,24,39,45,60,72,81,85],"temperature":[7,42,63],"effects":[8],"Hall":[10,73],"Effect":[11],"sensors":[12,25],"sensitivity":[13,27,62],"behavior.":[14,64],"To":[15],"this":[16],"purpose,":[17],"an":[18],"analysis":[19],"of":[20,31,38,59,71,84],"factors":[22],"affecting":[23],"current-related":[26,61,86],"is":[28,78],"performed,":[29],"consisting":[30],"several":[32],"pertinent":[33],"considerations.":[34],"An":[35],"analytical":[36],"investigation":[37],"carrier":[40],"concentration":[41],"dependence":[43],"including":[44],"freeze-out":[46],"effect":[47],"influence":[48],"was":[49,53],"performed.":[50],"This":[51],"information":[52],"subsequently":[54],"included":[55],"in":[56],"accurate":[57],"prediction":[58],"For":[65],"a":[66,75],"specific":[67],"CMOS":[68],"integration":[69],"process":[70],"sensors,":[74],"parabolic":[76],"curve":[77],"obtained":[79],"for":[80],"relative":[82],"variation":[83],"sensitivity.":[87]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":5},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}