{"id":"https://openalex.org/W1985410929","doi":"https://doi.org/10.1109/icecs.2012.6463644","title":"Transient fault analysis of CORDIC processor","display_name":"Transient fault analysis of CORDIC processor","publication_year":2012,"publication_date":"2012-12-01","ids":{"openalex":"https://openalex.org/W1985410929","doi":"https://doi.org/10.1109/icecs.2012.6463644","mag":"1985410929"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2012.6463644","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2012.6463644","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 19th IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2012)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074720386","display_name":"Ting An","orcid":null},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I205703379","display_name":"Institut Mines-T\u00e9l\u00e9com","ror":"https://ror.org/025vp2923","country_code":"FR","type":"facility","lineage":["https://openalex.org/I205703379"]},{"id":"https://openalex.org/I4210165912","display_name":"Laboratoire Traitement et Communication de l\u2019Information","ror":"https://ror.org/057er4c39","country_code":"FR","type":"facility","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102","https://openalex.org/I4210165912"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Ting An","raw_affiliation_strings":["Institut Mines-Telecom, CNRS LTCI, Telecom ParisTech, Paris, France","Telecom ParisTech, Inst. Mines-Telecom, Paris, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut Mines-Telecom, CNRS LTCI, Telecom ParisTech, Paris, France","institution_ids":["https://openalex.org/I4210165912","https://openalex.org/I205703379","https://openalex.org/I1294671590","https://openalex.org/I12356871"]},{"raw_affiliation_string":"Telecom ParisTech, Inst. Mines-Telecom, Paris, France","institution_ids":["https://openalex.org/I12356871"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058821943","display_name":"Matteo Causo","orcid":null},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I205703379","display_name":"Institut Mines-T\u00e9l\u00e9com","ror":"https://ror.org/025vp2923","country_code":"FR","type":"facility","lineage":["https://openalex.org/I205703379"]},{"id":"https://openalex.org/I4210165912","display_name":"Laboratoire Traitement et Communication de l\u2019Information","ror":"https://ror.org/057er4c39","country_code":"FR","type":"facility","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102","https://openalex.org/I4210165912"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Matteo Causo","raw_affiliation_strings":["Institut Mines-Telecom, CNRS LTCI, Telecom ParisTech, Paris, France","Telecom ParisTech, Inst. Mines-Telecom, Paris, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut Mines-Telecom, CNRS LTCI, Telecom ParisTech, Paris, France","institution_ids":["https://openalex.org/I4210165912","https://openalex.org/I205703379","https://openalex.org/I1294671590","https://openalex.org/I12356871"]},{"raw_affiliation_string":"Telecom ParisTech, Inst. Mines-Telecom, Paris, France","institution_ids":["https://openalex.org/I12356871"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018022196","display_name":"L\u00edrida Naviner","orcid":"https://orcid.org/0000-0002-6320-4153"},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I205703379","display_name":"Institut Mines-T\u00e9l\u00e9com","ror":"https://ror.org/025vp2923","country_code":"FR","type":"facility","lineage":["https://openalex.org/I205703379"]},{"id":"https://openalex.org/I4210165912","display_name":"Laboratoire Traitement et Communication de l\u2019Information","ror":"https://ror.org/057er4c39","country_code":"FR","type":"facility","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102","https://openalex.org/I4210165912"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Lirida Alves de Barros Naviner","raw_affiliation_strings":["Institut Mines-Telecom, CNRS LTCI, Telecom ParisTech, Paris, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut Mines-Telecom, CNRS LTCI, Telecom ParisTech, Paris, France","institution_ids":["https://openalex.org/I4210165912","https://openalex.org/I205703379","https://openalex.org/I1294671590","https://openalex.org/I12356871"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062676433","display_name":"Philippe Matherat","orcid":null},"institutions":[{"id":"https://openalex.org/I12356871","display_name":"T\u00e9l\u00e9com Paris","ror":"https://ror.org/01naq7912","country_code":"FR","type":"education","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I205703379","display_name":"Institut Mines-T\u00e9l\u00e9com","ror":"https://ror.org/025vp2923","country_code":"FR","type":"facility","lineage":["https://openalex.org/I205703379"]},{"id":"https://openalex.org/I4210165912","display_name":"Laboratoire Traitement et Communication de l\u2019Information","ror":"https://ror.org/057er4c39","country_code":"FR","type":"facility","lineage":["https://openalex.org/I12356871","https://openalex.org/I205703379","https://openalex.org/I4210145102","https://openalex.org/I4210165912"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Philippe Matherat","raw_affiliation_strings":["Institut Mines-Telecom, CNRS LTCI, Telecom ParisTech, Paris, France","Telecom ParisTech, Inst. Mines-Telecom, Paris, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut Mines-Telecom, CNRS LTCI, Telecom ParisTech, Paris, France","institution_ids":["https://openalex.org/I4210165912","https://openalex.org/I205703379","https://openalex.org/I1294671590","https://openalex.org/I12356871"]},{"raw_affiliation_string":"Telecom ParisTech, Inst. Mines-Telecom, Paris, France","institution_ids":["https://openalex.org/I12356871"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.06205813,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"51","issue":null,"first_page":"757","last_page":"760"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11697","display_name":"Numerical Methods and Algorithms","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cordic","display_name":"CORDIC","score":0.91858971118927},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7463808059692383},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.6874369978904724},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6850489377975464},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.651614248752594},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6449214220046997},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.5886247158050537},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4215748608112335},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3552834689617157},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3027195334434509},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.22076362371444702},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13608071208000183},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.11489623785018921},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.06520029902458191}],"concepts":[{"id":"https://openalex.org/C58870171","wikidata":"https://www.wikidata.org/wiki/Q116076","display_name":"CORDIC","level":3,"score":0.91858971118927},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7463808059692383},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.6874369978904724},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6850489377975464},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.651614248752594},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6449214220046997},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.5886247158050537},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4215748608112335},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3552834689617157},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3027195334434509},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.22076362371444702},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13608071208000183},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.11489623785018921},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.06520029902458191},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs.2012.6463644","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2012.6463644","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 19th IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2012)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6299999952316284,"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1512375387","https://openalex.org/W1968010872","https://openalex.org/W2034198879","https://openalex.org/W2070566315","https://openalex.org/W2096443114","https://openalex.org/W2100250713","https://openalex.org/W2100437717","https://openalex.org/W2101580300","https://openalex.org/W2102577205","https://openalex.org/W2103110226","https://openalex.org/W2115452265","https://openalex.org/W2136079444","https://openalex.org/W2147449058"],"related_works":["https://openalex.org/W2375598816","https://openalex.org/W2379157082","https://openalex.org/W2401971123","https://openalex.org/W907492214","https://openalex.org/W2534468830","https://openalex.org/W1862835629","https://openalex.org/W2136799148","https://openalex.org/W2897533804","https://openalex.org/W2890506991","https://openalex.org/W2098626762"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3,76],"propose":[4],"a":[5,12,39,44,81],"method":[6],"to":[7,51,60,79],"evaluate":[8],"the":[9,24,30,35,53,85,92],"impact":[10,46],"of":[11,29,72],"transient":[13],"fault":[14,40,45,66,93],"in":[15],"CORDIC":[16,73],"processors.":[17],"The":[18],"proposed":[19],"approach":[20],"takes":[21],"into":[22],"account":[23],"spatial":[25],"and":[26,58,75,88,91],"temporal":[27],"localization":[28],"fault.":[31],"It":[32],"also":[33],"embeds":[34],"probability":[36],"that":[37],"such":[38],"occurs.":[41],"By":[42],"defining":[43],"coefficient,":[47],"it":[48],"is":[49],"possible":[50],"identify":[52],"most":[54],"critical":[55],"arithmetic":[56],"blocks":[57],"thus":[59],"implement":[61],"an":[62],"optimized":[63],"strategy":[64],"for":[65],"tolerance.":[67],"We":[68],"analyzed":[69],"two":[70],"structures":[71],"processors":[74],"showed":[77],"how":[78],"get":[80],"better":[82],"tradeoff":[83],"between":[84],"penalty":[86],"(area":[87],"delay":[89],"overhead)":[90],"tolerant":[94],"improvement.":[95]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}