{"id":"https://openalex.org/W2074960387","doi":"https://doi.org/10.1109/icecs.2011.6122260","title":"High level characterization and optimization of a GPSK modulator with genetic algorithm","display_name":"High level characterization and optimization of a GPSK modulator with genetic algorithm","publication_year":2011,"publication_date":"2011-12-01","ids":{"openalex":"https://openalex.org/W2074960387","doi":"https://doi.org/10.1109/icecs.2011.6122260","mag":"2074960387"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2011.6122260","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2011.6122260","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 18th IEEE International Conference on Electronics, Circuits, and Systems","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026046977","display_name":"Salwa Sahnoun","orcid":"https://orcid.org/0009-0005-8555-4604"},"institutions":[{"id":"https://openalex.org/I142899784","display_name":"University of Sfax","ror":"https://ror.org/04d4sd432","country_code":"TN","type":"education","lineage":["https://openalex.org/I142899784"]}],"countries":["TN"],"is_corresponding":true,"raw_author_name":"S. Sahnoun","raw_affiliation_strings":["LETI Laboratory, National Engineering School of Sfax, University of Sfax, Sfax, Tunisia","LETI Laboratory, University of Sfax, National Engineering School of Sfax, Sfax, Tunisia"],"affiliations":[{"raw_affiliation_string":"LETI Laboratory, National Engineering School of Sfax, University of Sfax, Sfax, Tunisia","institution_ids":["https://openalex.org/I142899784"]},{"raw_affiliation_string":"LETI Laboratory, University of Sfax, National Engineering School of Sfax, Sfax, Tunisia","institution_ids":["https://openalex.org/I142899784"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058762615","display_name":"Ahmed Fakhfakh","orcid":"https://orcid.org/0009-0005-3219-2371"},"institutions":[{"id":"https://openalex.org/I142899784","display_name":"University of Sfax","ror":"https://ror.org/04d4sd432","country_code":"TN","type":"education","lineage":["https://openalex.org/I142899784"]}],"countries":["TN"],"is_corresponding":false,"raw_author_name":"A. Fakhfakh","raw_affiliation_strings":["LETI Laboratory, National Engineering School of Sfax, University of Sfax, Sfax, Tunisia","LETI Laboratory, University of Sfax, National Engineering School of Sfax, Sfax, Tunisia"],"affiliations":[{"raw_affiliation_string":"LETI Laboratory, National Engineering School of Sfax, University of Sfax, Sfax, Tunisia","institution_ids":["https://openalex.org/I142899784"]},{"raw_affiliation_string":"LETI Laboratory, University of Sfax, National Engineering School of Sfax, Sfax, Tunisia","institution_ids":["https://openalex.org/I142899784"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109201405","display_name":"Nouri Masmoudi","orcid":null},"institutions":[{"id":"https://openalex.org/I142899784","display_name":"University of Sfax","ror":"https://ror.org/04d4sd432","country_code":"TN","type":"education","lineage":["https://openalex.org/I142899784"]}],"countries":["TN"],"is_corresponding":false,"raw_author_name":"N. Masmoudi","raw_affiliation_strings":["LETI Laboratory, National Engineering School of Sfax, University of Sfax, Sfax, Tunisia","LETI Laboratory, University of Sfax, National Engineering School of Sfax, Sfax, Tunisia"],"affiliations":[{"raw_affiliation_string":"LETI Laboratory, National Engineering School of Sfax, University of Sfax, Sfax, Tunisia","institution_ids":["https://openalex.org/I142899784"]},{"raw_affiliation_string":"LETI Laboratory, University of Sfax, National Engineering School of Sfax, Sfax, Tunisia","institution_ids":["https://openalex.org/I142899784"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110592832","display_name":"H. L\u00e9vi","orcid":null},"institutions":[{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"H. Levi","raw_affiliation_strings":["IMS Laboratory, University of Bordeaux I, Bordeaux, France"],"affiliations":[{"raw_affiliation_string":"IMS Laboratory, University of Bordeaux I, Bordeaux, France","institution_ids":["https://openalex.org/I15057530","https://openalex.org/I4210160189"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5026046977"],"corresponding_institution_ids":["https://openalex.org/I142899784"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.12306367,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"4","issue":null,"first_page":"248","last_page":"251"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6594858765602112},{"id":"https://openalex.org/keywords/vhdl","display_name":"VHDL","score":0.6116937398910522},{"id":"https://openalex.org/keywords/hardware-description-language","display_name":"Hardware description language","score":0.5965359807014465},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5631572008132935},{"id":"https://openalex.org/keywords/vhdl-ams","display_name":"VHDL-AMS","score":0.5195227265357971},{"id":"https://openalex.org/keywords/umts-frequency-bands","display_name":"UMTS frequency bands","score":0.4938581585884094},{"id":"https://openalex.org/keywords/high-level-synthesis","display_name":"High-level synthesis","score":0.47836560010910034},{"id":"https://openalex.org/keywords/reusability","display_name":"Reusability","score":0.4593425691127777},{"id":"https://openalex.org/keywords/genetic-algorithm","display_name":"Genetic algorithm","score":0.44910311698913574},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4459962844848633},{"id":"https://openalex.org/keywords/cad","display_name":"CAD","score":0.4219130277633667},{"id":"https://openalex.org/keywords/time-to-market","display_name":"Time to market","score":0.4146168828010559},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.4108527898788452},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3327183127403259},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3164699375629425},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.21355029940605164},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17003238201141357},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.12650179862976074},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08869639039039612}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6594858765602112},{"id":"https://openalex.org/C36941000","wikidata":"https://www.wikidata.org/wiki/Q209455","display_name":"VHDL","level":3,"score":0.6116937398910522},{"id":"https://openalex.org/C42143788","wikidata":"https://www.wikidata.org/wiki/Q173341","display_name":"Hardware description language","level":3,"score":0.5965359807014465},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5631572008132935},{"id":"https://openalex.org/C2776513426","wikidata":"https://www.wikidata.org/wiki/Q2744740","display_name":"VHDL-AMS","level":4,"score":0.5195227265357971},{"id":"https://openalex.org/C101618186","wikidata":"https://www.wikidata.org/wiki/Q3633928","display_name":"UMTS frequency bands","level":2,"score":0.4938581585884094},{"id":"https://openalex.org/C58013763","wikidata":"https://www.wikidata.org/wiki/Q5754574","display_name":"High-level synthesis","level":3,"score":0.47836560010910034},{"id":"https://openalex.org/C137981799","wikidata":"https://www.wikidata.org/wiki/Q1369184","display_name":"Reusability","level":3,"score":0.4593425691127777},{"id":"https://openalex.org/C8880873","wikidata":"https://www.wikidata.org/wiki/Q187787","display_name":"Genetic algorithm","level":2,"score":0.44910311698913574},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4459962844848633},{"id":"https://openalex.org/C194789388","wikidata":"https://www.wikidata.org/wiki/Q17855283","display_name":"CAD","level":2,"score":0.4219130277633667},{"id":"https://openalex.org/C2779229675","wikidata":"https://www.wikidata.org/wiki/Q445235","display_name":"Time to market","level":2,"score":0.4146168828010559},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.4108527898788452},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3327183127403259},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3164699375629425},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.21355029940605164},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17003238201141357},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.12650179862976074},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08869639039039612},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/icecs.2011.6122260","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2011.6122260","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 18th IEEE International Conference on Electronics, Circuits, and Systems","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-00816981v1","is_oa":false,"landing_page_url":"https://hal.science/hal-00816981","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"18th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2011), Dec 2011, Beyrout, Lebanon. pp.248-251","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5199999809265137}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1497256448","https://openalex.org/W1510013526","https://openalex.org/W2118652655","https://openalex.org/W2125802436","https://openalex.org/W2140904774","https://openalex.org/W2148022857","https://openalex.org/W2318911018","https://openalex.org/W6640956140"],"related_works":["https://openalex.org/W1586741485","https://openalex.org/W1967668957","https://openalex.org/W2112319484","https://openalex.org/W2086925677","https://openalex.org/W2540912367","https://openalex.org/W2151941088","https://openalex.org/W4236466949","https://openalex.org/W2357636087","https://openalex.org/W2115181119","https://openalex.org/W2537505891"],"abstract_inverted_index":{"Today,":[0],"design":[1,43,51],"requirements":[2],"are":[3],"extending":[4],"more":[5,7],"and":[6,11,39,57,69,83],"from":[8],"electronic":[9],"(analogue":[10],"digital)":[12],"to":[13,23,31,34,87,99],"multidiscipline":[14],"ones.":[15],"These":[16],"current":[17],"needs":[18],"imply":[19],"implementation":[20],"of":[21,41,60],"methodologies":[22],"make":[24],"the":[25,42,55,58,72,78,89],"CAD":[26],"product":[27],"reliable":[28],"in":[29],"order":[30],"improve":[32],"time":[33,96],"market,":[35],"study":[36],"costs,":[37],"reusability":[38],"reliability":[40],"process.":[44],"This":[45],"paper":[46],"proposes":[47],"a":[48,65,84,92,100],"high":[49],"level":[50,102],"approach":[52],"applied":[53],"for":[54,71],"characterization":[56],"optimization":[59],"fractional-N":[61],"synthesizer":[62],"acting":[63],"as":[64],"direct":[66],"GPSK":[67],"modulator":[68,90],"designed":[70],"UMTS":[73],"standard":[74],"application.":[75],"It":[76],"uses":[77],"hardware":[79],"description":[80],"language":[81],"VHDL-AMS":[82],"genetic":[85],"algorithm":[86],"optimize":[88],"with":[91],"considerably":[93],"reduced":[94],"CPU":[95],"before":[97],"passing":[98],"transistor":[101],"characterization.":[103]},"counts_by_year":[],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}