{"id":"https://openalex.org/W2113424034","doi":"https://doi.org/10.1109/icecs.2010.5724676","title":"Low leakage multi-V&lt;inf&gt;th&lt;/inf&gt; technique for sequential circuits at transistor level in nanotechnology","display_name":"Low leakage multi-V&lt;inf&gt;th&lt;/inf&gt; technique for sequential circuits at transistor level in nanotechnology","publication_year":2010,"publication_date":"2010-12-01","ids":{"openalex":"https://openalex.org/W2113424034","doi":"https://doi.org/10.1109/icecs.2010.5724676","mag":"2113424034"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2010.5724676","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2010.5724676","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 17th IEEE International Conference on Electronics, Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5020701671","display_name":"Abdoul Rjoub","orcid":"https://orcid.org/0000-0001-8948-8070"},"institutions":[{"id":"https://openalex.org/I156983542","display_name":"Jordan University of Science and Technology","ror":"https://ror.org/03y8mtb59","country_code":"JO","type":"education","lineage":["https://openalex.org/I156983542"]}],"countries":["JO"],"is_corresponding":true,"raw_author_name":"Abdoul Rjoub","raw_affiliation_strings":["Computer Engineering Department, Jordan University of Science and Technology, Irbid, Jordan","Computer Engineering Department, Jordan University of Science and Technology, Irbid 22110, P. O. Box 3030, Jordan"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Department, Jordan University of Science and Technology, Irbid, Jordan","institution_ids":["https://openalex.org/I156983542"]},{"raw_affiliation_string":"Computer Engineering Department, Jordan University of Science and Technology, Irbid 22110, P. O. Box 3030, Jordan","institution_ids":["https://openalex.org/I156983542"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044062598","display_name":"Hassan Almanasrah","orcid":null},"institutions":[{"id":"https://openalex.org/I156983542","display_name":"Jordan University of Science and Technology","ror":"https://ror.org/03y8mtb59","country_code":"JO","type":"education","lineage":["https://openalex.org/I156983542"]}],"countries":["JO"],"is_corresponding":false,"raw_author_name":"Hassan Almanasrah","raw_affiliation_strings":["Computer Engineering Department, Jordan University of Science and Technology, Irbid, Jordan","Computer Engineering Department, Jordan University of Science and Technology, Irbid 22110, P. O. Box 3030, Jordan"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Department, Jordan University of Science and Technology, Irbid, Jordan","institution_ids":["https://openalex.org/I156983542"]},{"raw_affiliation_string":"Computer Engineering Department, Jordan University of Science and Technology, Irbid 22110, P. O. Box 3030, Jordan","institution_ids":["https://openalex.org/I156983542"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5020701671"],"corresponding_institution_ids":["https://openalex.org/I156983542"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15470803,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"974","last_page":"977"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.7692406177520752},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.7187325954437256},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.6456904411315918},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.6122981309890747},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.5835800170898438},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5725717544555664},{"id":"https://openalex.org/keywords/leakage-power","display_name":"Leakage power","score":0.5336196422576904},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5289566516876221},{"id":"https://openalex.org/keywords/heuristic","display_name":"Heuristic","score":0.4816385805606842},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4653632938861847},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.45477765798568726},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4493369460105896},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4411538243293762},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.400790810585022},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.35626471042633057},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16608160734176636},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1601654291152954}],"concepts":[{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.7692406177520752},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.7187325954437256},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.6456904411315918},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.6122981309890747},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.5835800170898438},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5725717544555664},{"id":"https://openalex.org/C2987719587","wikidata":"https://www.wikidata.org/wiki/Q1811428","display_name":"Leakage power","level":4,"score":0.5336196422576904},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5289566516876221},{"id":"https://openalex.org/C173801870","wikidata":"https://www.wikidata.org/wiki/Q201413","display_name":"Heuristic","level":2,"score":0.4816385805606842},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4653632938861847},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.45477765798568726},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4493369460105896},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4411538243293762},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.400790810585022},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35626471042633057},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16608160734176636},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1601654291152954},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs.2010.5724676","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2010.5724676","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 17th IEEE International Conference on Electronics, Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6200000047683716,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2004306407","https://openalex.org/W2042352336","https://openalex.org/W2103227017","https://openalex.org/W2120937992","https://openalex.org/W2149663872","https://openalex.org/W2152510528","https://openalex.org/W2171757373","https://openalex.org/W4240087758","https://openalex.org/W4255493755","https://openalex.org/W6681763760"],"related_works":["https://openalex.org/W4283025278","https://openalex.org/W61292821","https://openalex.org/W2082432309","https://openalex.org/W817174743","https://openalex.org/W2900067469","https://openalex.org/W2130342263","https://openalex.org/W2968511773","https://openalex.org/W1589514528","https://openalex.org/W2316140901","https://openalex.org/W2088008649"],"abstract_inverted_index":{"Leakage":[0,124],"power":[1,8,22],"is":[2,28,60,103],"the":[3,20,34,51,71,76,86,122,128,131],"main":[4],"dominant":[5],"source":[6],"of":[7,25,39,50,79,90,97,121,130],"dissipation":[9],"for":[10,47,55],"Sub-100nm":[11],"VLSI":[12],"circuits.":[13],"Various":[14],"techniques":[15,27],"were":[16],"proposed":[17,83,101,116],"to":[18,69],"reduce":[19],"leakage":[21,80,98],"dissipation;":[23],"one":[24],"these":[26],"Multi-Threshold":[29],"voltage.":[30],"In":[31],"this":[32],"paper,":[33],"exact":[35],"and":[36,94],"optimal":[37],"values":[38,73],"Threshold":[40],"Voltage":[41],"(V":[42],"<sub":[43],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[44],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">th</sub>":[45],")":[46],"each":[48,91],"transistor":[49],"design":[52],"are":[53],"found":[54],"any":[56],"sequential":[57],"circuit.":[58,132],"This":[59],"achieved":[61],"by":[62,105],"applying":[63],"Artificial":[64],"Intelligence":[65],"(AI)":[66],"Search":[67],"Algorithm":[68],"find":[70],"optimum":[72],"that":[74],"get":[75],"largest":[77],"reduction":[78],"current.":[81,99],"The":[82,100,115],"algorithm":[84,102],"exploits":[85],"total":[87],"Slack":[88],"Time":[89],"transistor's":[92],"location":[93],"their":[95],"contribution":[96],"introduced":[104],"AI":[106],"Heuristic":[107],"Search,":[108],"under":[109],"22nm":[110],"BSIM4":[111],"foundries":[112],"predictive":[113],"model.":[114],"approach":[117],"saves":[118],"around":[119],"80%":[120],"Sub-threshold":[123],"current":[125],"without":[126],"degrading":[127],"performance":[129]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}