{"id":"https://openalex.org/W2158886067","doi":"https://doi.org/10.1109/icecs.2009.5410980","title":"Shielding structures for millimeter-wave integrated transformers","display_name":"Shielding structures for millimeter-wave integrated transformers","publication_year":2009,"publication_date":"2009-12-01","ids":{"openalex":"https://openalex.org/W2158886067","doi":"https://doi.org/10.1109/icecs.2009.5410980","mag":"2158886067"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2009.5410980","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2009.5410980","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 16th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2009)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022865579","display_name":"Bernardo Leite","orcid":"https://orcid.org/0000-0002-9852-8182"},"institutions":[{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Bernardo Leite","raw_affiliation_strings":["IMS Laboratory, University of Bordeaux 1, Talence, France"],"affiliations":[{"raw_affiliation_string":"IMS Laboratory, University of Bordeaux 1, Talence, France","institution_ids":["https://openalex.org/I15057530","https://openalex.org/I4210160189"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108167299","display_name":"\u00c9ric Kerherv\u00e9","orcid":"https://orcid.org/0000-0001-6369-7544"},"institutions":[{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Eric Kerherve","raw_affiliation_strings":["IMS Laboratory, University of Bordeaux 1, Talence, France"],"affiliations":[{"raw_affiliation_string":"IMS Laboratory, University of Bordeaux 1, Talence, France","institution_ids":["https://openalex.org/I15057530","https://openalex.org/I4210160189"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109586805","display_name":"Jean-Baptiste B\u00e9gueret","orcid":null},"institutions":[{"id":"https://openalex.org/I4210160189","display_name":"Institut Polytechnique de Bordeaux","ror":"https://ror.org/054qv7y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210160189"]},{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Jean-Baptiste Begueret","raw_affiliation_strings":["IMS Laboratory, University of Bordeaux 1, Talence, France"],"affiliations":[{"raw_affiliation_string":"IMS Laboratory, University of Bordeaux 1, Talence, France","institution_ids":["https://openalex.org/I15057530","https://openalex.org/I4210160189"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108092427","display_name":"Didier Belot","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Didier Belot","raw_affiliation_strings":["STMicroelectronics Private Limited, Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics Private Limited, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5022865579"],"corresponding_institution_ids":["https://openalex.org/I15057530","https://openalex.org/I4210160189"],"apc_list":null,"apc_paid":null,"fwci":1.5241,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.84644556,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"239","last_page":"242"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/shields","display_name":"Shields","score":0.875878095626831},{"id":"https://openalex.org/keywords/electromagnetic-shielding","display_name":"Electromagnetic shielding","score":0.8695486187934875},{"id":"https://openalex.org/keywords/shield","display_name":"Shield","score":0.7389392256736755},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.7060849666595459},{"id":"https://openalex.org/keywords/extremely-high-frequency","display_name":"Extremely high frequency","score":0.67912757396698},{"id":"https://openalex.org/keywords/insertion-loss","display_name":"Insertion loss","score":0.6454944610595703},{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.6183333396911621},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.559569776058197},{"id":"https://openalex.org/keywords/millimeter","display_name":"Millimeter","score":0.4933759272098541},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4786582887172699},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42137137055397034},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.36368703842163086},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.33225518465042114},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2930186986923218},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.20529106259346008},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16591882705688477},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12573868036270142},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.10422933101654053}],"concepts":[{"id":"https://openalex.org/C109589588","wikidata":"https://www.wikidata.org/wiki/Q2253638","display_name":"Shields","level":3,"score":0.875878095626831},{"id":"https://openalex.org/C2265751","wikidata":"https://www.wikidata.org/wiki/Q332007","display_name":"Electromagnetic shielding","level":2,"score":0.8695486187934875},{"id":"https://openalex.org/C138081364","wikidata":"https://www.wikidata.org/wiki/Q852013","display_name":"Shield","level":2,"score":0.7389392256736755},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.7060849666595459},{"id":"https://openalex.org/C45764600","wikidata":"https://www.wikidata.org/wiki/Q570342","display_name":"Extremely high frequency","level":2,"score":0.67912757396698},{"id":"https://openalex.org/C90327742","wikidata":"https://www.wikidata.org/wiki/Q947396","display_name":"Insertion loss","level":2,"score":0.6454944610595703},{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.6183333396911621},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.559569776058197},{"id":"https://openalex.org/C109792285","wikidata":"https://www.wikidata.org/wiki/Q174789","display_name":"Millimeter","level":2,"score":0.4933759272098541},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4786582887172699},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42137137055397034},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.36368703842163086},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.33225518465042114},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2930186986923218},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.20529106259346008},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16591882705688477},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12573868036270142},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.10422933101654053},{"id":"https://openalex.org/C5900021","wikidata":"https://www.wikidata.org/wiki/Q163082","display_name":"Petrology","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/icecs.2009.5410980","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2009.5410980","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 16th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2009)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-00412569v1","is_oa":false,"landing_page_url":"https://hal.science/hal-00412569","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE International Conference on Electronics, Circuits and Systems, 2009. ICECS 2009., Dec 2009, Hammamet, Tunisia. pp. 239-242","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6200000047683716,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1511527741","https://openalex.org/W1801318682","https://openalex.org/W2102189112","https://openalex.org/W2112505083","https://openalex.org/W2114770672","https://openalex.org/W2146965532","https://openalex.org/W2167004581","https://openalex.org/W2313458865","https://openalex.org/W2788994432","https://openalex.org/W6699117192"],"related_works":["https://openalex.org/W3131170299","https://openalex.org/W1574966570","https://openalex.org/W1965881601","https://openalex.org/W1885879077","https://openalex.org/W1500071047","https://openalex.org/W1511367051","https://openalex.org/W2371581837","https://openalex.org/W1979805194","https://openalex.org/W2981827719","https://openalex.org/W2135859793"],"abstract_inverted_index":{"Shielding":[0],"structures":[1],"intended":[2],"to":[3,24,30],"improve":[4],"the":[5,16,21,25,32,73,80,94],"performance":[6],"of":[7,15,50,75,82,93],"millimeter-wave":[8],"transformers":[9],"are":[10,18,28,43,59,70],"presented.":[11],"The":[12],"loss":[13,58],"mechanisms":[14],"components":[17],"discussed":[19],"and":[20,39,45,55,63],"losses":[22],"related":[23],"silicon":[26],"substrate":[27],"shown":[29],"be":[31],"most":[33],"relevant.":[34],"A":[35],"patterned":[36,76],"ground":[37,77],"shield":[38,42],"a":[40,86],"floating":[41,83],"detailed":[44],"their":[46],"influences":[47],"in":[48],"terms":[49],"inductance,":[51],"quality-factors,":[52],"coupling":[53],"coefficients":[54],"minimum":[56],"insertion":[57],"evaluated":[60],"through":[61],"measurement":[62],"electromagnetic":[64],"simulations.":[65],"Results":[66],"indicate":[67],"that":[68],"quality-factors":[69],"deteriorated":[71],"by":[72],"use":[74,81],"shields,":[78],"whereas":[79],"shields":[84],"allows":[85],"slight":[87],"improvement":[88],"without":[89],"degrading":[90],"other":[91],"characteristics":[92],"transformer.":[95]},"counts_by_year":[{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}