{"id":"https://openalex.org/W2125224092","doi":"https://doi.org/10.1109/icecs.2008.4675096","title":"Reseeding using compaction of pre-generated LFSR sub-sequences","display_name":"Reseeding using compaction of pre-generated LFSR sub-sequences","publication_year":2008,"publication_date":"2008-08-01","ids":{"openalex":"https://openalex.org/W2125224092","doi":"https://doi.org/10.1109/icecs.2008.4675096","mag":"2125224092"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2008.4675096","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2008.4675096","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 15th IEEE International Conference on Electronics, Circuits and Systems","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059021602","display_name":"Artur Jutman","orcid":"https://orcid.org/0000-0002-2018-5589"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Artur Jutman","raw_affiliation_strings":["Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia","Dept. of Comp. Eng., Tallinn Univ. of Technol., Tallinn"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]},{"raw_affiliation_string":"Dept. of Comp. Eng., Tallinn Univ. of Technol., Tallinn","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021757495","display_name":"Igor Aleksejev","orcid":"https://orcid.org/0000-0001-5931-0167"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Igor Aleksejev","raw_affiliation_strings":["Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia","Dept. of Comp. Eng., Tallinn Univ. of Technol., Tallinn"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]},{"raw_affiliation_string":"Dept. of Comp. Eng., Tallinn Univ. of Technol., Tallinn","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010286547","display_name":"Jaan Raik","orcid":"https://orcid.org/0000-0001-8113-020X"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Jaan Raik","raw_affiliation_strings":["Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia","Dept. of Comp. Eng., Tallinn Univ. of Technol., Tallinn"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]},{"raw_affiliation_string":"Dept. of Comp. Eng., Tallinn Univ. of Technol., Tallinn","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010536057","display_name":"Raimund Ubar","orcid":"https://orcid.org/0000-0001-8186-4385"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Raimund Ubar","raw_affiliation_strings":["Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia","Dept. of Comp. Eng., Tallinn Univ. of Technol., Tallinn"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Tallinn University of Technology, Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]},{"raw_affiliation_string":"Dept. of Comp. Eng., Tallinn Univ. of Technol., Tallinn","institution_ids":["https://openalex.org/I111112146"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I111112146"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"19","issue":null,"first_page":"1290","last_page":"1295"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9876999855041504,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/linear-feedback-shift-register","display_name":"Linear feedback shift register","score":0.8200514316558838},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6446313261985779},{"id":"https://openalex.org/keywords/heuristics","display_name":"Heuristics","score":0.6415254473686218},{"id":"https://openalex.org/keywords/pseudorandom-number-generator","display_name":"Pseudorandom number generator","score":0.6400555968284607},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5934627056121826},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.5887858867645264},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5592648983001709},{"id":"https://openalex.org/keywords/heuristic","display_name":"Heuristic","score":0.5548843741416931},{"id":"https://openalex.org/keywords/sequence","display_name":"Sequence (biology)","score":0.44934898614883423},{"id":"https://openalex.org/keywords/embedding","display_name":"Embedding","score":0.4183063209056854},{"id":"https://openalex.org/keywords/shift-register","display_name":"Shift register","score":0.3283706307411194},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1725447177886963},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.12338966131210327},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.12006247043609619},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.10068750381469727}],"concepts":[{"id":"https://openalex.org/C159862308","wikidata":"https://www.wikidata.org/wiki/Q681101","display_name":"Linear feedback shift register","level":4,"score":0.8200514316558838},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6446313261985779},{"id":"https://openalex.org/C127705205","wikidata":"https://www.wikidata.org/wiki/Q5748245","display_name":"Heuristics","level":2,"score":0.6415254473686218},{"id":"https://openalex.org/C140642157","wikidata":"https://www.wikidata.org/wiki/Q1623338","display_name":"Pseudorandom number generator","level":2,"score":0.6400555968284607},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5934627056121826},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.5887858867645264},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5592648983001709},{"id":"https://openalex.org/C173801870","wikidata":"https://www.wikidata.org/wiki/Q201413","display_name":"Heuristic","level":2,"score":0.5548843741416931},{"id":"https://openalex.org/C2778112365","wikidata":"https://www.wikidata.org/wiki/Q3511065","display_name":"Sequence (biology)","level":2,"score":0.44934898614883423},{"id":"https://openalex.org/C41608201","wikidata":"https://www.wikidata.org/wiki/Q980509","display_name":"Embedding","level":2,"score":0.4183063209056854},{"id":"https://openalex.org/C49654631","wikidata":"https://www.wikidata.org/wiki/Q746165","display_name":"Shift register","level":3,"score":0.3283706307411194},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1725447177886963},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.12338966131210327},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12006247043609619},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.10068750381469727},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C54355233","wikidata":"https://www.wikidata.org/wiki/Q7162","display_name":"Genetics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs.2008.4675096","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2008.4675096","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 15th IEEE International Conference on Electronics, Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321018","display_name":"Eesti Teadusfondi","ror":"https://ror.org/00jjeja18"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1484976571","https://openalex.org/W1528232000","https://openalex.org/W1562494186","https://openalex.org/W1562967125","https://openalex.org/W1972479656","https://openalex.org/W2126676773","https://openalex.org/W2137549092","https://openalex.org/W2137843962","https://openalex.org/W2138530143","https://openalex.org/W2149016918","https://openalex.org/W2156781054","https://openalex.org/W4243200393","https://openalex.org/W4246972245","https://openalex.org/W4247532507","https://openalex.org/W6683213879"],"related_works":["https://openalex.org/W1600807921","https://openalex.org/W2101477403","https://openalex.org/W4288754393","https://openalex.org/W2119351822","https://openalex.org/W2104563825","https://openalex.org/W4321517976","https://openalex.org/W2761125259","https://openalex.org/W2184933991","https://openalex.org/W1996917705","https://openalex.org/W1498635933"],"abstract_inverted_index":{"Built-In":[0],"Self-Test":[1],"(BIST)":[2],"techniques":[3],"are":[4],"often":[5],"based":[6,96],"on":[7,97,122],"pseudo-random":[8],"pattern":[9],"generators,":[10],"which":[11,127],"represent":[12],"simple":[13],"structures":[14],"that":[15,94,155],"can":[16,128,140,158],"generate":[17],"necessary":[18],"test":[19,25,59,136],"stimuli":[20],"for":[21,133,142,173],"a":[22,44,80,107,134,143,147,174],"device":[23],"under":[24],"(DUT).":[26],"For":[27],"some":[28],"designs,":[29],"however,":[30],"additional":[31],"measures":[32],"of":[33,72,99,110],"fault":[34,56],"coverage":[35,57],"improvement":[36],"have":[37],"to":[38,48,51,91,105,111],"be":[39,112],"applied.":[40],"LFSR":[41,73,101],"reseeding":[42,82,92,176],"is":[43,75,95],"popular":[45],"technique":[46],"due":[47],"its":[49],"ability":[50],"considerably":[52],"improve":[53],"both":[54],"the":[55,67,76,115,123,130],"and":[58],"application":[60],"time":[61,145],"by":[62],"embedding":[63],"specific":[64],"vectors":[65],"into":[66,114],"pseudorandom":[68],"sequence.":[69],"Proper":[70],"selection":[71],"seeds":[74],"key":[77],"aspect":[78],"in":[79,103,146,164],"successful":[81],"scheme.":[83],"In":[84],"this":[85],"paper,":[86],"we":[87],"present":[88],"our":[89],"approach":[90,120],"optimization":[93],"compaction":[98,132],"pre-generated":[100],"sub-sequences":[102],"order":[104],"select":[106],"minimal":[108],"subset":[109],"included":[113],"final":[116],"solution.":[117],"The":[118],"proposed":[119],"relies":[121],"branch-and-bound":[124],"search":[125],"technique,":[126],"provide":[129],"optimal":[131,160],"given":[135],"setup.":[137],"Alternatively,":[138],"it":[139],"run":[141],"limited":[144],"heuristic":[148],"mode,":[149],"producing":[150],"intermediate":[151],"results.":[152],"Experiments":[153],"show":[154],"applied":[156],"heuristics":[157],"yield":[159],"or":[161],"quasi-optimal":[162],"solutions":[163,168],"polynomial":[165],"time.":[166],"These":[167],"outperform":[169],"previously":[170],"published":[171],"results":[172],"similar":[175],"approach.":[177]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}