{"id":"https://openalex.org/W2116237362","doi":"https://doi.org/10.1109/icecs.2008.4675093","title":"Study and development of an efficient RC-in-RC-out MOR method","display_name":"Study and development of an efficient RC-in-RC-out MOR method","publication_year":2008,"publication_date":"2008-08-01","ids":{"openalex":"https://openalex.org/W2116237362","doi":"https://doi.org/10.1109/icecs.2008.4675093","mag":"2116237362"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2008.4675093","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2008.4675093","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 15th IEEE International Conference on Electronics, Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089677654","display_name":"Pekka Miettinen","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Pekka Miettinen","raw_affiliation_strings":["Department of Radio Science and Engineering, Helsinki University of Technology, Finland","Dept. of Radio Sci. & Eng., Helsinki Univ. of Technol., Helsinki"],"affiliations":[{"raw_affiliation_string":"Department of Radio Science and Engineering, Helsinki University of Technology, Finland","institution_ids":[]},{"raw_affiliation_string":"Dept. of Radio Sci. & Eng., Helsinki Univ. of Technol., Helsinki","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056119397","display_name":"Mikko Honkala","orcid":"https://orcid.org/0000-0001-5916-5908"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Mikko Honkala","raw_affiliation_strings":["Department of Radio Science and Engineering, Helsinki University of Technology, Finland","Dept. of Radio Sci. & Eng., Helsinki Univ. of Technol., Helsinki"],"affiliations":[{"raw_affiliation_string":"Department of Radio Science and Engineering, Helsinki University of Technology, Finland","institution_ids":[]},{"raw_affiliation_string":"Dept. of Radio Sci. & Eng., Helsinki Univ. of Technol., Helsinki","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057856783","display_name":"Janne Roos","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Janne Roos","raw_affiliation_strings":["Department of Radio Science and Engineering, Helsinki University of Technology, Finland","Dept. of Radio Sci. & Eng., Helsinki Univ. of Technol., Helsinki"],"affiliations":[{"raw_affiliation_string":"Department of Radio Science and Engineering, Helsinki University of Technology, Finland","institution_ids":[]},{"raw_affiliation_string":"Dept. of Radio Sci. & Eng., Helsinki Univ. of Technol., Helsinki","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077566562","display_name":"C. Andrew Neff","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Carsten Neff","raw_affiliation_strings":["NEC Laboratories Europe, IT Research Division, NEC Europe Limited, Saint Augustine, USA","IT Res. Div., NEC Eur. Ltd., St. Augustin"],"affiliations":[{"raw_affiliation_string":"NEC Laboratories Europe, IT Research Division, NEC Europe Limited, Saint Augustine, USA","institution_ids":[]},{"raw_affiliation_string":"IT Res. Div., NEC Eur. Ltd., St. Augustin","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070137241","display_name":"Achim Basermann","orcid":"https://orcid.org/0000-0003-3637-3231"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Achim Basermann","raw_affiliation_strings":["NEC Laboratories Europe, IT Research Division, NEC Europe Limited, Saint Augustine, USA","IT Res. Div., NEC Eur. Ltd., St. Augustin"],"affiliations":[{"raw_affiliation_string":"NEC Laboratories Europe, IT Research Division, NEC Europe Limited, Saint Augustine, USA","institution_ids":[]},{"raw_affiliation_string":"IT Res. Div., NEC Eur. Ltd., St. Augustin","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5089677654"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.1232,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.7889215,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1277","last_page":"1280"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11206","display_name":"Model Reduction and Neural Networks","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/3109","display_name":"Statistical and Nonlinear Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11206","display_name":"Model Reduction and Neural Networks","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/3109","display_name":"Statistical and Nonlinear Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11263","display_name":"Electromagnetic Simulation and Numerical Methods","score":0.9879999756813049,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9846000075340271,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/rc-circuit","display_name":"RC circuit","score":0.8789651393890381},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.6327669620513916},{"id":"https://openalex.org/keywords/model-order-reduction","display_name":"Model order reduction","score":0.6129779815673828},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.512673020362854},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.46715205907821655},{"id":"https://openalex.org/keywords/development","display_name":"Development (topology)","score":0.4111173450946808},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36995527148246765},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3464987874031067},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.29595986008644104},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20703381299972534},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1712110936641693},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.11257711052894592},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10879838466644287},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.08167439699172974}],"concepts":[{"id":"https://openalex.org/C39394816","wikidata":"https://www.wikidata.org/wiki/Q939318","display_name":"RC circuit","level":4,"score":0.8789651393890381},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.6327669620513916},{"id":"https://openalex.org/C2779277453","wikidata":"https://www.wikidata.org/wiki/Q12202921","display_name":"Model order reduction","level":3,"score":0.6129779815673828},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.512673020362854},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.46715205907821655},{"id":"https://openalex.org/C2776542497","wikidata":"https://www.wikidata.org/wiki/Q5266672","display_name":"Development (topology)","level":2,"score":0.4111173450946808},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36995527148246765},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3464987874031067},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.29595986008644104},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20703381299972534},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1712110936641693},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.11257711052894592},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10879838466644287},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.08167439699172974},{"id":"https://openalex.org/C57493831","wikidata":"https://www.wikidata.org/wiki/Q3134666","display_name":"Projection (relational algebra)","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs.2008.4675093","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2008.4675093","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 15th IEEE International Conference on Electronics, Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2114505736","https://openalex.org/W2119098576","https://openalex.org/W2122608783","https://openalex.org/W2123962621","https://openalex.org/W2131337789","https://openalex.org/W2135742364","https://openalex.org/W2136924242","https://openalex.org/W3104001151","https://openalex.org/W4232853208","https://openalex.org/W6679130287"],"related_works":["https://openalex.org/W2765250005","https://openalex.org/W2110312969","https://openalex.org/W2182451763","https://openalex.org/W2153566364","https://openalex.org/W1991018216","https://openalex.org/W2118904547","https://openalex.org/W3127703504","https://openalex.org/W2015479478","https://openalex.org/W1964286429","https://openalex.org/W2800915648"],"abstract_inverted_index":{"This":[0,54],"paper":[1],"outlines":[2],"the":[3,25,44,72],"study":[4],"and":[5,49,79],"development":[6],"of":[7,18,29,46,51,71],"an":[8],"efficient":[9],"RC-in-RC-out":[10],"model-order":[11],"reduction":[12,17],"(MOR)":[13],"method":[14,74],"suitable":[15],"for":[16],"very":[19],"large":[20],"sized":[21],"RC":[22,26],"circuits":[23],"or":[24],"circuit":[27],"parts":[28],"a":[30,39,58,66],"non-RC":[31],"circuit.":[32],"The":[33,69],"MOR":[34,73,83],"is":[35,75],"carried":[36],"out":[37],"on":[38],"partitioned":[40],"circuit,":[41],"which":[42],"enables":[43],"use":[45],"low-order":[47],"moments":[48],"macromodels":[50],"few":[52],"elements.":[53],"benefit":[55],"translates":[56],"to":[57],"typical":[59],"10-100":[60],"times":[61],"faster":[62],"simulation":[63],"with":[64,77,81],"only":[65],"minimal":[67],"error.":[68],"performance":[70],"evaluated":[76],"simulations":[78],"compared":[80],"other":[82],"algorithms.":[84]},"counts_by_year":[{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}