{"id":"https://openalex.org/W2162519365","doi":"https://doi.org/10.1109/icecs.2008.4675081","title":"On-chip supply current monitoring units using magnetic force sensing","display_name":"On-chip supply current monitoring units using magnetic force sensing","publication_year":2008,"publication_date":"2008-08-01","ids":{"openalex":"https://openalex.org/W2162519365","doi":"https://doi.org/10.1109/icecs.2008.4675081","mag":"2162519365"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2008.4675081","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2008.4675081","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 15th IEEE International Conference on Electronics, Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069559709","display_name":"Martin Donoval","orcid":"https://orcid.org/0000-0003-4024-4475"},"institutions":[{"id":"https://openalex.org/I110757952","display_name":"Slovak University of Technology in Bratislava","ror":"https://ror.org/0561ghm58","country_code":"SK","type":"education","lineage":["https://openalex.org/I110757952"]}],"countries":["SK"],"is_corresponding":true,"raw_author_name":"Martin Donoval","raw_affiliation_strings":["Department of Microelectronics, Slovak University of Technology, Bratislava, Slovakia"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Slovak University of Technology, Bratislava, Slovakia","institution_ids":["https://openalex.org/I110757952"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091166750","display_name":"Martin Daricek","orcid":null},"institutions":[{"id":"https://openalex.org/I110757952","display_name":"Slovak University of Technology in Bratislava","ror":"https://ror.org/0561ghm58","country_code":"SK","type":"education","lineage":["https://openalex.org/I110757952"]}],"countries":["SK"],"is_corresponding":false,"raw_author_name":"Martin Daricek","raw_affiliation_strings":["Department of Microelectronics, Slovak University of Technology, Bratislava, Slovakia"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Slovak University of Technology, Bratislava, Slovakia","institution_ids":["https://openalex.org/I110757952"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030204131","display_name":"Viera Stopjakov\u00e1","orcid":"https://orcid.org/0000-0002-0010-8965"},"institutions":[{"id":"https://openalex.org/I110757952","display_name":"Slovak University of Technology in Bratislava","ror":"https://ror.org/0561ghm58","country_code":"SK","type":"education","lineage":["https://openalex.org/I110757952"]}],"countries":["SK"],"is_corresponding":false,"raw_author_name":"Viera Stopjakova","raw_affiliation_strings":["Department of Microelectronics, Slovak University of Technology, Bratislava, Slovakia"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Slovak University of Technology, Bratislava, Slovakia","institution_ids":["https://openalex.org/I110757952"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5035790638","display_name":"Juraj Marek","orcid":"https://orcid.org/0000-0001-5612-430X"},"institutions":[{"id":"https://openalex.org/I110757952","display_name":"Slovak University of Technology in Bratislava","ror":"https://ror.org/0561ghm58","country_code":"SK","type":"education","lineage":["https://openalex.org/I110757952"]}],"countries":["SK"],"is_corresponding":false,"raw_author_name":"Juraj Marek","raw_affiliation_strings":["Department of Microelectronics, Slovak University of Technology, Bratislava, Slovakia"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Slovak University of Technology, Bratislava, Slovakia","institution_ids":["https://openalex.org/I110757952"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5069559709"],"corresponding_institution_ids":["https://openalex.org/I110757952"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.17004942,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1229","last_page":"1232"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.7281119227409363},{"id":"https://openalex.org/keywords/current-sensor","display_name":"Current sensor","score":0.6827910542488098},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6181102395057678},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5555063486099243},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5416815876960754},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5348732471466064},{"id":"https://openalex.org/keywords/bicmos","display_name":"BiCMOS","score":0.5244227647781372},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4947780966758728},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4874994456768036},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4663618803024292},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.45430809259414673},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.407207727432251},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.39992791414260864},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.2794746160507202},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09069418907165527}],"concepts":[{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.7281119227409363},{"id":"https://openalex.org/C55000061","wikidata":"https://www.wikidata.org/wiki/Q24894777","display_name":"Current sensor","level":3,"score":0.6827910542488098},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6181102395057678},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5555063486099243},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5416815876960754},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5348732471466064},{"id":"https://openalex.org/C62427370","wikidata":"https://www.wikidata.org/wiki/Q173416","display_name":"BiCMOS","level":4,"score":0.5244227647781372},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4947780966758728},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4874994456768036},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4663618803024292},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.45430809259414673},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.407207727432251},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.39992791414260864},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.2794746160507202},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09069418907165527},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs.2008.4675081","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2008.4675081","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 15th IEEE International Conference on Electronics, Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8700000047683716,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1263869031","https://openalex.org/W2010441798","https://openalex.org/W2037960720","https://openalex.org/W2069976035","https://openalex.org/W2091580676","https://openalex.org/W2128881711","https://openalex.org/W2135212173"],"related_works":["https://openalex.org/W27766761","https://openalex.org/W2538534558","https://openalex.org/W2043562057","https://openalex.org/W1523515178","https://openalex.org/W188237805","https://openalex.org/W24428751","https://openalex.org/W2183033402","https://openalex.org/W2107744340","https://openalex.org/W2065289416","https://openalex.org/W2017236304"],"abstract_inverted_index":{"A":[0],"built-in":[1],"on-chip":[2,22],"current":[3,23,52],"sensors":[4,15],"design":[5],"based":[6],"on":[7,65],"magnetic":[8],"force":[9],"of":[10,35,42,56],"is":[11,39],"presented.":[12,68],"The":[13,33],"proposed":[14,37],"are":[16,67],"aimed":[17],"to":[18],"be":[19],"used":[20],"for":[21],"testing":[24],"in":[25,75],"deep-submicron":[26],"circuits":[27],"with":[28],"ultra":[29],"low-voltage":[30],"power":[31],"supply.":[32],"advantage":[34],"the":[36,43,70],"monitors":[38],"mainly":[40],"elimination":[41],"undesired":[44],"supply":[45],"voltage":[46],"reduction,":[47],"commonly":[48],"created":[49],"by":[50],"standard":[51],"test":[53],"methods.":[54],"Description":[55],"different":[57],"sensor":[58,71],"architectures,":[59],"their":[60],"designs":[61],"and":[62],"physical":[63],"implementations":[64],"chip":[66],"All":[69],"versions":[72],"were":[73],"designed":[74],"1.0":[76],"\u03bcm":[77],"BiCMOS":[78],"technology.":[79]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}