{"id":"https://openalex.org/W2131714252","doi":"https://doi.org/10.1109/icecs.2008.4674991","title":"Characterization of a temporal contrast microbolometer infrared sensor","display_name":"Characterization of a temporal contrast microbolometer infrared sensor","publication_year":2008,"publication_date":"2008-08-01","ids":{"openalex":"https://openalex.org/W2131714252","doi":"https://doi.org/10.1109/icecs.2008.4674991","mag":"2131714252"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2008.4674991","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2008.4674991","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 15th IEEE International Conference on Electronics, Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013972905","display_name":"Rainer Wohlgenannt","orcid":null},"institutions":[{"id":"https://openalex.org/I132118926","display_name":"Austrian Institute of Technology","ror":"https://ror.org/04knbh022","country_code":"AT","type":"facility","lineage":["https://openalex.org/I132118926"]}],"countries":["AT"],"is_corresponding":true,"raw_author_name":"Rainer Wohlgenannt","raw_affiliation_strings":["Austrian Research Centers GmbH, Vienna, Austria","Austrian Res. Centers GmbH - ARC, Vienna"],"affiliations":[{"raw_affiliation_string":"Austrian Research Centers GmbH, Vienna, Austria","institution_ids":["https://openalex.org/I132118926"]},{"raw_affiliation_string":"Austrian Res. Centers GmbH - ARC, Vienna","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075494439","display_name":"Daniel Matolin","orcid":null},"institutions":[{"id":"https://openalex.org/I132118926","display_name":"Austrian Institute of Technology","ror":"https://ror.org/04knbh022","country_code":"AT","type":"facility","lineage":["https://openalex.org/I132118926"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Daniel Matolin","raw_affiliation_strings":["Austrian Research Centers GmbH, Vienna, Austria","Austrian Res. Centers GmbH - ARC, Vienna"],"affiliations":[{"raw_affiliation_string":"Austrian Research Centers GmbH, Vienna, Austria","institution_ids":["https://openalex.org/I132118926"]},{"raw_affiliation_string":"Austrian Res. Centers GmbH - ARC, Vienna","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059523612","display_name":"Thomas Maier","orcid":"https://orcid.org/0000-0003-3775-2225"},"institutions":[{"id":"https://openalex.org/I132118926","display_name":"Austrian Institute of Technology","ror":"https://ror.org/04knbh022","country_code":"AT","type":"facility","lineage":["https://openalex.org/I132118926"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Thomas Maier","raw_affiliation_strings":["Austrian Research Centers GmbH, Vienna, Austria","Austrian Res. Centers GmbH - ARC, Vienna"],"affiliations":[{"raw_affiliation_string":"Austrian Research Centers GmbH, Vienna, Austria","institution_ids":["https://openalex.org/I132118926"]},{"raw_affiliation_string":"Austrian Res. Centers GmbH - ARC, Vienna","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043840260","display_name":"C. Posch","orcid":"https://orcid.org/0000-0002-0373-2739"},"institutions":[{"id":"https://openalex.org/I132118926","display_name":"Austrian Institute of Technology","ror":"https://ror.org/04knbh022","country_code":"AT","type":"facility","lineage":["https://openalex.org/I132118926"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Christoph Posch","raw_affiliation_strings":["Austrian Research Centers GmbH, Vienna, Austria","Austrian Res. Centers GmbH - ARC, Vienna"],"affiliations":[{"raw_affiliation_string":"Austrian Research Centers GmbH, Vienna, Austria","institution_ids":["https://openalex.org/I132118926"]},{"raw_affiliation_string":"Austrian Res. Centers GmbH - ARC, Vienna","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5013972905"],"corresponding_institution_ids":["https://openalex.org/I132118926"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.14733675,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"47","issue":null,"first_page":"866","last_page":"869"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11128","display_name":"Transition Metal Oxide Nanomaterials","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microbolometer","display_name":"Microbolometer","score":0.7704916000366211},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.7577747106552124},{"id":"https://openalex.org/keywords/millisecond","display_name":"Millisecond","score":0.6137410402297974},{"id":"https://openalex.org/keywords/shutter","display_name":"Shutter","score":0.5668059587478638},{"id":"https://openalex.org/keywords/asynchronous-communication","display_name":"Asynchronous communication","score":0.5308421850204468},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.5235502123832703},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4855634868144989},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4803684651851654},{"id":"https://openalex.org/keywords/chopper","display_name":"Chopper","score":0.4523324966430664},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.42460864782333374},{"id":"https://openalex.org/keywords/bolometer","display_name":"Bolometer","score":0.37391042709350586},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36351141333580017},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.32774436473846436},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.308177649974823},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.20746111869812012},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.1815069317817688},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17770341038703918},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17671766877174377},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.17664676904678345},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.16686144471168518},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1490234136581421},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.10337883234024048}],"concepts":[{"id":"https://openalex.org/C2776111576","wikidata":"https://www.wikidata.org/wiki/Q495462","display_name":"Microbolometer","level":4,"score":0.7704916000366211},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.7577747106552124},{"id":"https://openalex.org/C60327585","wikidata":"https://www.wikidata.org/wiki/Q723733","display_name":"Millisecond","level":2,"score":0.6137410402297974},{"id":"https://openalex.org/C2776871301","wikidata":"https://www.wikidata.org/wiki/Q691823","display_name":"Shutter","level":2,"score":0.5668059587478638},{"id":"https://openalex.org/C151319957","wikidata":"https://www.wikidata.org/wiki/Q752739","display_name":"Asynchronous communication","level":2,"score":0.5308421850204468},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.5235502123832703},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4855634868144989},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4803684651851654},{"id":"https://openalex.org/C2780191706","wikidata":"https://www.wikidata.org/wiki/Q191658","display_name":"Chopper","level":3,"score":0.4523324966430664},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.42460864782333374},{"id":"https://openalex.org/C21028948","wikidata":"https://www.wikidata.org/wiki/Q852212","display_name":"Bolometer","level":3,"score":0.37391042709350586},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36351141333580017},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.32774436473846436},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.308177649974823},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.20746111869812012},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.1815069317817688},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17770341038703918},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17671766877174377},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.17664676904678345},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16686144471168518},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1490234136581421},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.10337883234024048},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs.2008.4674991","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2008.4674991","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 15th IEEE International Conference on Electronics, Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.6000000238418579,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1807988891","https://openalex.org/W2006690963","https://openalex.org/W2117825662","https://openalex.org/W2138111540","https://openalex.org/W2152705698","https://openalex.org/W2163288878"],"related_works":["https://openalex.org/W2463152212","https://openalex.org/W2048831694","https://openalex.org/W2069825465","https://openalex.org/W2354849850","https://openalex.org/W1975679687","https://openalex.org/W2030738448","https://openalex.org/W2386050120","https://openalex.org/W2438759716","https://openalex.org/W2019237182","https://openalex.org/W3146585097"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"the":[3,50,61,69,94,113],"characterization":[4,70],"of":[5,20,52,60,71,112],"a":[6,21,26,57,65,80,86],"novel":[7],"event-based":[8],"64":[9,11],"times":[10],"pixel":[12,33,95,107],"temporal":[13],"contrast":[14],"IR":[15,43],"sensor.":[16],"The":[17,35],"device":[18],"consists":[19],"micro-bolometer":[22],"thermistor":[23],"array":[24],"and":[25,45,88,92,99,104,110],"CMOS":[27],"readout":[28],"IC":[29],"employing":[30],"asynchronous,":[31,72],"spiking":[32,73],"circuits.":[34],"pixels":[36],"independently":[37],"respond":[38],"to":[39,68,84],"changes":[40],"in":[41,49,97],"thermal":[42],"radiation":[44],"communicate":[46],"detected":[47],"variations":[48],"form":[51],"asynchronous":[53],"ldquoaddress-eventsrdquo":[54],"(AER).":[55],"After":[56],"brief":[58],"review":[59],"implemented":[62],"sensor":[63,74,116],"architecture,":[64],"DFT-based":[66],"approach":[67],"arrays":[75],"is":[76],"discussed.":[77],"We":[78],"use":[79],"mechanical":[81],"shutter":[82],"(chopper)":[83],"generate":[85],"controllable":[87],"reproducible":[89],"transient":[90],"stimulus":[91],"evaluate":[93],"response":[96],"time":[98],"frequency":[100],"domain.":[101],"Measurement":[102],"results":[103],"analysis":[105],"on":[106],"sensitivity,":[108],"bandwidth":[109],"noise":[111],"first":[114],"fabricated":[115],"prototype":[117],"are":[118],"presented.":[119]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
