{"id":"https://openalex.org/W2102212033","doi":"https://doi.org/10.1109/icecs.2008.4674918","title":"GALEOR: Leakage reduction for CMOS circuits","display_name":"GALEOR: Leakage reduction for CMOS circuits","publication_year":2008,"publication_date":"2008-08-01","ids":{"openalex":"https://openalex.org/W2102212033","doi":"https://doi.org/10.1109/icecs.2008.4674918","mag":"2102212033"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2008.4674918","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2008.4674918","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 15th IEEE International Conference on Electronics, Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066190714","display_name":"Srikanth Katrue","orcid":null},"institutions":[{"id":"https://openalex.org/I155173764","display_name":"Rochester Institute of Technology","ror":"https://ror.org/00v4yb702","country_code":"US","type":"education","lineage":["https://openalex.org/I155173764"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Srikanth Katrue","raw_affiliation_strings":["Department of Computer Engineering, Rochester Institute of Technology, Rochester, USA","Dept. of Comput. Eng., Rochester Inst. of Technol., Rochester, NY"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Rochester Institute of Technology, Rochester, USA","institution_ids":["https://openalex.org/I155173764"]},{"raw_affiliation_string":"Dept. of Comput. Eng., Rochester Inst. of Technol., Rochester, NY","institution_ids":["https://openalex.org/I155173764"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067236813","display_name":"Dhireesha Kudithipudi","orcid":"https://orcid.org/0000-0003-4462-5224"},"institutions":[{"id":"https://openalex.org/I155173764","display_name":"Rochester Institute of Technology","ror":"https://ror.org/00v4yb702","country_code":"US","type":"education","lineage":["https://openalex.org/I155173764"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dhireesha Kudithipudi","raw_affiliation_strings":["Department of Computer Engineering, Rochester Institute of Technology, Rochester, USA","Dept. of Comput. Eng., Rochester Inst. of Technol., Rochester, NY"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Rochester Institute of Technology, Rochester, USA","institution_ids":["https://openalex.org/I155173764"]},{"raw_affiliation_string":"Dept. of Comput. Eng., Rochester Inst. of Technol., Rochester, NY","institution_ids":["https://openalex.org/I155173764"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5066190714"],"corresponding_institution_ids":["https://openalex.org/I155173764"],"apc_list":null,"apc_paid":null,"fwci":1.3318,"has_fulltext":false,"cited_by_count":56,"citation_normalized_percentile":{"value":0.8181283,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"574","last_page":"577"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nmos-logic","display_name":"NMOS logic","score":0.8024553060531616},{"id":"https://openalex.org/keywords/pmos-logic","display_name":"PMOS logic","score":0.7367749214172363},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6874064803123474},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.6648865342140198},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6351839900016785},{"id":"https://openalex.org/keywords/standby-power","display_name":"Standby power","score":0.623655378818512},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5667970776557922},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.532006561756134},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5207878947257996},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4870052933692932},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.47023317217826843},{"id":"https://openalex.org/keywords/low-power-electronics","display_name":"Low-power electronics","score":0.45912230014801025},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.43881574273109436},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3715776801109314},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.35658079385757446},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.24969106912612915},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07981714606285095}],"concepts":[{"id":"https://openalex.org/C197162436","wikidata":"https://www.wikidata.org/wiki/Q83908","display_name":"NMOS logic","level":4,"score":0.8024553060531616},{"id":"https://openalex.org/C27050352","wikidata":"https://www.wikidata.org/wiki/Q173605","display_name":"PMOS logic","level":4,"score":0.7367749214172363},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6874064803123474},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.6648865342140198},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6351839900016785},{"id":"https://openalex.org/C7140552","wikidata":"https://www.wikidata.org/wiki/Q1366402","display_name":"Standby power","level":3,"score":0.623655378818512},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5667970776557922},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.532006561756134},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5207878947257996},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4870052933692932},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.47023317217826843},{"id":"https://openalex.org/C117551214","wikidata":"https://www.wikidata.org/wiki/Q6692774","display_name":"Low-power electronics","level":4,"score":0.45912230014801025},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.43881574273109436},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3715776801109314},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35658079385757446},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.24969106912612915},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07981714606285095},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs.2008.4674918","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2008.4674918","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 15th IEEE International Conference on Electronics, Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8999999761581421,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1584898044","https://openalex.org/W1601651202","https://openalex.org/W2001236779","https://openalex.org/W2043128052","https://openalex.org/W2069345435","https://openalex.org/W2083626899","https://openalex.org/W2122757690","https://openalex.org/W2126203942","https://openalex.org/W2126357937","https://openalex.org/W2131862714","https://openalex.org/W2154941994","https://openalex.org/W2166852565","https://openalex.org/W2542641152","https://openalex.org/W4253620068","https://openalex.org/W6636174989"],"related_works":["https://openalex.org/W4386261925","https://openalex.org/W2048420745","https://openalex.org/W2082944690","https://openalex.org/W2263373136","https://openalex.org/W1914349328","https://openalex.org/W1811213809","https://openalex.org/W2160067645","https://openalex.org/W2023334077","https://openalex.org/W2005494397","https://openalex.org/W2104885411"],"abstract_inverted_index":{"High":[0,45],"performance":[1],"and":[2,17,27,40,48,114,144,163],"computational":[3],"capability":[4],"in":[5,32,53,56],"the":[6,23,29,57,68,93,98,101,118,125,153,161,172],"current":[7,24,59,69,95],"generation":[8,70],"processors":[9,71],"are":[10,65,73,110,129],"made":[11],"possible":[12],"by":[13,151],"small":[14],"feature":[15],"sizes":[16],"high":[18],"device":[19,46],"density.":[20],"To":[21],"maintain":[22],"drive":[25],"strength":[26],"control":[28,156],"power":[30,85,104],"dissipation":[31],"these":[33],"processors,":[34],"simultaneous":[35],"scaling":[36],"down":[37],"of":[38,117,124,155],"supply":[39],"threshold":[41,50],"voltages":[42,51],"is":[43,149,168],"performed.":[44],"density":[47],"low":[49],"result":[52],"an":[54],"increase":[55],"leakage":[58,80,94,103,108],"dissipation.":[60],"Large":[61],"on":[62,140],"chip":[63],"caches":[64],"integrated":[66],"onto":[67],"which":[72],"becoming":[74],"a":[75],"major":[76],"contributor":[77],"to":[78,131,158,171],"total":[79],"power.":[81],"The":[82],"proposed":[83,102],"static":[84],"reduction":[86],"technique,":[87,105],"GALEOR":[88,136],"(GAted":[89],"LEakage":[90],"TransistOR),":[91],"reduces":[92],"flowing":[96],"through":[97],"circuits.":[99],"In":[100],"two":[106],"gated":[107],"transistors":[109,128],"inserted":[111,127],"between":[112,160],"NMOS":[113],"PMOS":[115],"circuitry":[116],"existing":[119],"circuit":[120],"such":[121],"that":[122],"gates":[123,143],"extra":[126],"connected":[130],"their":[132],"respective":[133],"drain":[134],"regions.":[135],"technique":[137],"was":[138],"tested":[139],"standard":[141],"cell":[142],"memory":[145],"elements.":[146],"Area":[147],"overhead":[148,167],"minimized":[150],"eliminating":[152],"use":[154],"logic":[157],"switch":[159],"active":[162],"standby":[164],"states.":[165],"Performance":[166],"increased":[169],"due":[170],"reduced":[173],"output":[174],"voltage":[175],"swing.":[176]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":12},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}