{"id":"https://openalex.org/W2164458319","doi":"https://doi.org/10.1109/icecs.2007.4510919","title":"VCSEL device modeling and parameter extraction technique","display_name":"VCSEL device modeling and parameter extraction technique","publication_year":2007,"publication_date":"2007-12-01","ids":{"openalex":"https://openalex.org/W2164458319","doi":"https://doi.org/10.1109/icecs.2007.4510919","mag":"2164458319"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2007.4510919","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2007.4510919","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 14th IEEE International Conference on Electronics, Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110873348","display_name":"K. Minoglou","orcid":null},"institutions":[{"id":"https://openalex.org/I203474044","display_name":"National Centre of Scientific Research \"Demokritos\"","ror":"https://ror.org/038jp4m40","country_code":"GR","type":"facility","lineage":["https://openalex.org/I203474044"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN","GR"],"is_corresponding":true,"raw_author_name":"K. Minoglou","raw_affiliation_strings":["Institute of Microelectronics, NCSR-Demokritos, 15310, Athens, Greece. k.minoglou@imel.demokritos.gr","NCSR-Demokritos, Institute of Microelectronics, Athens, Greece"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, NCSR-Demokritos, 15310, Athens, Greece. k.minoglou@imel.demokritos.gr","institution_ids":["https://openalex.org/I203474044","https://openalex.org/I4210119392"]},{"raw_affiliation_string":"NCSR-Demokritos, Institute of Microelectronics, Athens, Greece","institution_ids":["https://openalex.org/I203474044"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006201862","display_name":"G. Halkias","orcid":"https://orcid.org/0000-0002-3803-2230"},"institutions":[{"id":"https://openalex.org/I203474044","display_name":"National Centre of Scientific Research \"Demokritos\"","ror":"https://ror.org/038jp4m40","country_code":"GR","type":"facility","lineage":["https://openalex.org/I203474044"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN","GR"],"is_corresponding":false,"raw_author_name":"G. Halkias","raw_affiliation_strings":["Institute of Microelectronics, NCSR-Demokritos, 15310, Athens, Greece","NCSR-Demokritos, Institute of Microelectronics, Athens, Greece"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, NCSR-Demokritos, 15310, Athens, Greece","institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I203474044"]},{"raw_affiliation_string":"NCSR-Demokritos, Institute of Microelectronics, Athens, Greece","institution_ids":["https://openalex.org/I203474044"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058522486","display_name":"E.D. Kyriakis-Bitzaros","orcid":"https://orcid.org/0000-0002-4497-6158"},"institutions":[{"id":"https://openalex.org/I122380217","display_name":"Technological Educational Institute of Piraeus","ror":"https://ror.org/00ks0ea23","country_code":"GR","type":"education","lineage":["https://openalex.org/I122380217"]},{"id":"https://openalex.org/I40479246","display_name":"Technological Educational Institute of Athens","ror":"https://ror.org/044m46d61","country_code":"GR","type":"education","lineage":["https://openalex.org/I40479246"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"E.D. Kyriakis-Bitzaros","raw_affiliation_strings":["Department of Electronics, TEI of Pireaus, 12244, Egaleo, Athens, Greece","Department of Electronics, TEI of Pireaus, Egaleo, Athens, Greece"],"affiliations":[{"raw_affiliation_string":"Department of Electronics, TEI of Pireaus, 12244, Egaleo, Athens, Greece","institution_ids":["https://openalex.org/I40479246","https://openalex.org/I122380217"]},{"raw_affiliation_string":"Department of Electronics, TEI of Pireaus, Egaleo, Athens, Greece","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083774956","display_name":"Dimitris Syvridis","orcid":null},"institutions":[{"id":"https://openalex.org/I200777214","display_name":"National and Kapodistrian University of Athens","ror":"https://ror.org/04gnjpq42","country_code":"GR","type":"education","lineage":["https://openalex.org/I200777214"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"D. Syvridis","raw_affiliation_strings":["Department of Informatics and Telecommunications, University of Athens, 15784, Athens, Greece","Department of Informatics and Telecommunications, University of Athens, Athens, Greece"],"affiliations":[{"raw_affiliation_string":"Department of Informatics and Telecommunications, University of Athens, 15784, Athens, Greece","institution_ids":["https://openalex.org/I200777214"]},{"raw_affiliation_string":"Department of Informatics and Telecommunications, University of Athens, Athens, Greece","institution_ids":["https://openalex.org/I200777214"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044984639","display_name":"Aggeliki Arapogianni","orcid":null},"institutions":[{"id":"https://openalex.org/I200777214","display_name":"National and Kapodistrian University of Athens","ror":"https://ror.org/04gnjpq42","country_code":"GR","type":"education","lineage":["https://openalex.org/I200777214"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"A. Arapogianni","raw_affiliation_strings":["Department of Informatics and Telecommunications, University of Athens, 15784, Athens, Greece","Department of Informatics and Telecommunications, University of Athens, Athens, Greece"],"affiliations":[{"raw_affiliation_string":"Department of Informatics and Telecommunications, University of Athens, 15784, Athens, Greece","institution_ids":["https://openalex.org/I200777214"]},{"raw_affiliation_string":"Department of Informatics and Telecommunications, University of Athens, Athens, Greece","institution_ids":["https://openalex.org/I200777214"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5110873348"],"corresponding_institution_ids":["https://openalex.org/I203474044","https://openalex.org/I4210119392"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.18163523,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"14","last_page":"17"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10913","display_name":"Molecular Junctions and Nanostructures","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parasitic-extraction","display_name":"Parasitic extraction","score":0.8599491119384766},{"id":"https://openalex.org/keywords/semiconductor-laser-theory","display_name":"Semiconductor laser theory","score":0.5389955639839172},{"id":"https://openalex.org/keywords/extraction","display_name":"Extraction (chemistry)","score":0.5388225317001343},{"id":"https://openalex.org/keywords/vertical-cavity-surface-emitting-laser","display_name":"Vertical-cavity surface-emitting laser","score":0.5348958373069763},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4930064380168915},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4684063792228699},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.4554263651371002},{"id":"https://openalex.org/keywords/estimation-theory","display_name":"Estimation theory","score":0.4375007748603821},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.42617231607437134},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.34103578329086304},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.335742712020874},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3101203441619873},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2806021571159363},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.206260085105896},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.17673343420028687},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.10867896676063538}],"concepts":[{"id":"https://openalex.org/C159818811","wikidata":"https://www.wikidata.org/wiki/Q7135947","display_name":"Parasitic extraction","level":2,"score":0.8599491119384766},{"id":"https://openalex.org/C121477167","wikidata":"https://www.wikidata.org/wiki/Q17154002","display_name":"Semiconductor laser theory","level":3,"score":0.5389955639839172},{"id":"https://openalex.org/C4725764","wikidata":"https://www.wikidata.org/wiki/Q844704","display_name":"Extraction (chemistry)","level":2,"score":0.5388225317001343},{"id":"https://openalex.org/C106246969","wikidata":"https://www.wikidata.org/wiki/Q2009618","display_name":"Vertical-cavity surface-emitting laser","level":3,"score":0.5348958373069763},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4930064380168915},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4684063792228699},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.4554263651371002},{"id":"https://openalex.org/C167928553","wikidata":"https://www.wikidata.org/wiki/Q1376021","display_name":"Estimation theory","level":2,"score":0.4375007748603821},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.42617231607437134},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.34103578329086304},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.335742712020874},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3101203441619873},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2806021571159363},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.206260085105896},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.17673343420028687},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.10867896676063538},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs.2007.4510919","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2007.4510919","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 14th IEEE International Conference on Electronics, Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W2000003115","https://openalex.org/W2017940251","https://openalex.org/W2021614512","https://openalex.org/W2079761260","https://openalex.org/W2097734477","https://openalex.org/W2097793475","https://openalex.org/W2104254939","https://openalex.org/W2109179002","https://openalex.org/W2109996588","https://openalex.org/W2117956361","https://openalex.org/W2124460934","https://openalex.org/W2131145946","https://openalex.org/W2155578747","https://openalex.org/W2160215262","https://openalex.org/W4254744419"],"related_works":["https://openalex.org/W1905216755","https://openalex.org/W2117417104","https://openalex.org/W2534619547","https://openalex.org/W1923048618","https://openalex.org/W2104218257","https://openalex.org/W1601428776","https://openalex.org/W2116984086","https://openalex.org/W2414593631","https://openalex.org/W2060220502","https://openalex.org/W2062675694"],"abstract_inverted_index":{"An":[0],"efficient":[1],"model":[2,31],"scheme":[3],"that":[4],"combines":[5],"the":[6,10,14,21,84],"nonlinear":[7],"behaviour":[8],"of":[9,20],"input":[11],"parasitics":[12],"with":[13,83],"intrinsic":[15],"fundamental":[16],"device":[17],"rate":[18],"equations":[19],"vertical":[22],"cavity":[23],"surface":[24],"emitting":[25],"lasers":[26],"(VCSELs)":[27],"is":[28,77],"proposed.":[29],"The":[30],"parameter":[32],"values":[33],"are":[34,63],"extracted":[35],"using":[36],"a":[37],"fully":[38],"defined":[39],"systematic":[40],"technique":[41],"from":[42],"dc":[43],"current-optical":[44],"power-voltage":[45],"(I-L-V)":[46],"and":[47,60,75],"ac":[48],"S":[49],"<sub":[50,54],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[51,55],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">11</sub>":[52],"-S":[53],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">21</sub>":[56],"response":[57],"measurements.":[58,86],"Extraction":[59],"simulation":[61,81],"procedures":[62],"implemented":[64],"in":[65],"commercial":[66],"integrated":[67],"circuit":[68],"design":[69],"tools.":[70],"Investigation":[71],"on":[72],"their":[73],"accuracy":[74],"efficiency":[76],"performed":[78],"by":[79],"comparing":[80],"results":[82],"experimental":[85]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-03-25T13:04:00.132906","created_date":"2025-10-10T00:00:00"}
