{"id":"https://openalex.org/W2543028923","doi":"https://doi.org/10.1109/icecs.2004.1399757","title":"Desensitized design of MOS low noise amplifiers by R/sub n/ minimization","display_name":"Desensitized design of MOS low noise amplifiers by R/sub n/ minimization","publication_year":2005,"publication_date":"2005-03-31","ids":{"openalex":"https://openalex.org/W2543028923","doi":"https://doi.org/10.1109/icecs.2004.1399757","mag":"2543028923"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2004.1399757","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2004.1399757","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2004 11th IEEE International Conference on Electronics, Circuits and Systems, 2004. ICECS 2004.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102785192","display_name":"Gaurab Banerjee","orcid":"https://orcid.org/0000-0003-4858-7683"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"G. Banerjee","raw_affiliation_strings":["Intel Corporation, Hillsboro, OR, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021202027","display_name":"D. Becher","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D.T. Becher","raw_affiliation_strings":["Intel Corporation, Hillsboro, OR, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109218446","display_name":"C.-Y. Hung","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C. Hung","raw_affiliation_strings":["Intel Corporation, Hillsboro, OR, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062357544","display_name":"K. Soumyanath","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. Soumyanath","raw_affiliation_strings":["Intel Corporation, Hillsboro, OR, USA"],"affiliations":[{"raw_affiliation_string":"Intel Corporation, Hillsboro, OR, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033673209","display_name":"D.J. Allstot","orcid":"https://orcid.org/0000-0002-2296-7728"},"institutions":[{"id":"https://openalex.org/I201448701","display_name":"University of Washington","ror":"https://ror.org/00cvxb145","country_code":"US","type":"education","lineage":["https://openalex.org/I201448701"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D.J. Allstot","raw_affiliation_strings":["Department of Electrical Engineering, University of Washington, Seattle, WA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Washington, Seattle, WA, USA","institution_ids":["https://openalex.org/I201448701"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5102785192"],"corresponding_institution_ids":["https://openalex.org/I1343180700"],"apc_list":null,"apc_paid":null,"fwci":1.4228,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.83975155,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"13","issue":null,"first_page":"619","last_page":"622"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/minification","display_name":"Minification","score":0.6802452206611633},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6600311398506165},{"id":"https://openalex.org/keywords/low-noise-amplifier","display_name":"Low-noise amplifier","score":0.5649037957191467},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.523200511932373},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.486258864402771},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4625067114830017},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.459126353263855},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.4577052593231201},{"id":"https://openalex.org/keywords/noise-immunity","display_name":"Noise immunity","score":0.4346143305301666},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43306291103363037},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.4205189645290375},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.41691672801971436},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3989565372467041},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3304429054260254},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27943161129951477},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.21183514595031738},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.13040593266487122}],"concepts":[{"id":"https://openalex.org/C147764199","wikidata":"https://www.wikidata.org/wiki/Q6865248","display_name":"Minification","level":2,"score":0.6802452206611633},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6600311398506165},{"id":"https://openalex.org/C155332784","wikidata":"https://www.wikidata.org/wiki/Q1151304","display_name":"Low-noise amplifier","level":4,"score":0.5649037957191467},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.523200511932373},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.486258864402771},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4625067114830017},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.459126353263855},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.4577052593231201},{"id":"https://openalex.org/C2988494973","wikidata":"https://www.wikidata.org/wiki/Q179448","display_name":"Noise immunity","level":3,"score":0.4346143305301666},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43306291103363037},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.4205189645290375},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.41691672801971436},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3989565372467041},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3304429054260254},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27943161129951477},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.21183514595031738},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13040593266487122},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs.2004.1399757","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2004.1399757","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2004 11th IEEE International Conference on Electronics, Circuits and Systems, 2004. ICECS 2004.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5299999713897705,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2068999897","https://openalex.org/W6667593893"],"related_works":["https://openalex.org/W2382937231","https://openalex.org/W3000916362","https://openalex.org/W2024400826","https://openalex.org/W2515952003","https://openalex.org/W2010358330","https://openalex.org/W2064881384","https://openalex.org/W4390187685","https://openalex.org/W2151988453","https://openalex.org/W2366126408","https://openalex.org/W2289698412"],"abstract_inverted_index":{"We":[0],"show":[1,69],"that":[2,70],"the":[3,84,98],"minimization":[4],"of":[5,29,42,97],"device":[6,99],"R/sub":[7,30,73,103],"n/":[8,31,74,104],"allows":[9],"us":[10],"to":[11,52,109],"simultaneously":[12],"approach":[13],"noise":[14,90],"and":[15,114],"input":[16],"match":[17],"in":[18,22,77,83],"CMOS":[19],"LNA":[20],"designs":[21],"a":[23,39,63,71,78,101,106],"topology":[24],"independent":[25],"fashion.":[26],"The":[27,95],"dependence":[28,55],"on":[32],"designer":[33],"specifiable":[34],"parameters":[35],"is":[36],"derived":[37],"using":[38],"theoretical":[40],"analysis":[41],"long":[43],"channel":[44],"(i.e":[45],"square-law)":[46],"devices.":[47,58],"Experimental":[48],"results":[49,76],"are":[50],"shown":[51],"confirm":[53],"this":[54],"for":[56],"short-channel":[57],"Using":[59],"experimental":[60],"data":[61],"from":[62],"0.18":[64],"/spl":[65,79],"mu/m":[66],"technology,":[67],"we":[68],"low":[72,102],"design":[75],"ges/2/spl":[80],"times/":[81],"increase":[82],"bandwidth":[85],"over":[86],"which":[87],"an":[88],"optimal":[89],"figure":[91],"can":[92],"be":[93],"obtained.":[94],"desensitization":[96],"with":[100],"provides":[105],"greater":[107],"immunity":[108],"impedance":[110],"mismatches,":[111],"modeling":[112],"errors":[113],"manufacturing":[115],"variations.":[116]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}