{"id":"https://openalex.org/W2540609224","doi":"https://doi.org/10.1109/icecs.2004.1399629","title":"Electromigration-dependent parametric yield estimation","display_name":"Electromigration-dependent parametric yield estimation","publication_year":2005,"publication_date":"2005-03-31","ids":{"openalex":"https://openalex.org/W2540609224","doi":"https://doi.org/10.1109/icecs.2004.1399629","mag":"2540609224"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2004.1399629","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2004.1399629","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2004 11th IEEE International Conference on Electronics, Circuits and Systems, 2004. ICECS 2004.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091735347","display_name":"Robert Barsky","orcid":null},"institutions":[{"id":"https://openalex.org/I174306211","display_name":"Technion \u2013 Israel Institute of Technology","ror":"https://ror.org/03qryx823","country_code":"IL","type":"education","lineage":["https://openalex.org/I174306211"]}],"countries":["IL"],"is_corresponding":true,"raw_author_name":"R. Barsky","raw_affiliation_strings":["Computer Science Department, Technion-Israel Institute of Technology, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"Computer Science Department, Technion-Israel Institute of Technology, Haifa, Israel","institution_ids":["https://openalex.org/I174306211"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087524328","display_name":"Israel A. Wagner","orcid":null},"institutions":[{"id":"https://openalex.org/I4210167297","display_name":"IBM Research - Haifa","ror":"https://ror.org/05rw9t746","country_code":"IL","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210167297"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"I.A. Wagner","raw_affiliation_strings":["IBM Haifa Research Laboratory, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"IBM Haifa Research Laboratory, Haifa, Israel","institution_ids":["https://openalex.org/I4210167297"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5091735347"],"corresponding_institution_ids":["https://openalex.org/I174306211"],"apc_list":null,"apc_paid":null,"fwci":0.7914,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.76771005,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"57","issue":null,"first_page":"121","last_page":"124"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromigration","display_name":"Electromigration","score":0.9860129952430725},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.7527676820755005},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.7479050159454346},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.6791572570800781},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4890201985836029},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45416930317878723},{"id":"https://openalex.org/keywords/estimation","display_name":"Estimation","score":0.44569918513298035},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4424014687538147},{"id":"https://openalex.org/keywords/parametric-model","display_name":"Parametric model","score":0.4278477132320404},{"id":"https://openalex.org/keywords/simple","display_name":"Simple (philosophy)","score":0.4175669550895691},{"id":"https://openalex.org/keywords/estimation-theory","display_name":"Estimation theory","score":0.4109017252922058},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3746148645877838},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.34319597482681274},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2995482087135315},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2276061475276947},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18569830060005188},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.15147796273231506},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.1322660744190216},{"id":"https://openalex.org/keywords/metallurgy","display_name":"Metallurgy","score":0.10170173645019531},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.07399114966392517}],"concepts":[{"id":"https://openalex.org/C138055206","wikidata":"https://www.wikidata.org/wiki/Q1319010","display_name":"Electromigration","level":2,"score":0.9860129952430725},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.7527676820755005},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.7479050159454346},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.6791572570800781},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4890201985836029},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45416930317878723},{"id":"https://openalex.org/C96250715","wikidata":"https://www.wikidata.org/wiki/Q965330","display_name":"Estimation","level":2,"score":0.44569918513298035},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4424014687538147},{"id":"https://openalex.org/C24574437","wikidata":"https://www.wikidata.org/wiki/Q7135228","display_name":"Parametric model","level":3,"score":0.4278477132320404},{"id":"https://openalex.org/C2780586882","wikidata":"https://www.wikidata.org/wiki/Q7520643","display_name":"Simple (philosophy)","level":2,"score":0.4175669550895691},{"id":"https://openalex.org/C167928553","wikidata":"https://www.wikidata.org/wiki/Q1376021","display_name":"Estimation theory","level":2,"score":0.4109017252922058},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3746148645877838},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.34319597482681274},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2995482087135315},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2276061475276947},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18569830060005188},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.15147796273231506},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.1322660744190216},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.10170173645019531},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.07399114966392517},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/icecs.2004.1399629","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2004.1399629","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2004 11th IEEE International Conference on Electronics, Circuits and Systems, 2004. ICECS 2004.","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.66.4885","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.66.4885","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.cs.technion.ac.il/~wagner/index_files/roman/icecs2004.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Decent work and economic growth","id":"https://metadata.un.org/sdg/8","score":0.46000000834465027}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1558796979","https://openalex.org/W1990215011","https://openalex.org/W2037926253","https://openalex.org/W2104440709","https://openalex.org/W2129555080","https://openalex.org/W2133857907","https://openalex.org/W2147106466","https://openalex.org/W2148381360","https://openalex.org/W2161358183","https://openalex.org/W2321486756"],"related_works":["https://openalex.org/W2289718384","https://openalex.org/W1995675544","https://openalex.org/W2509524819","https://openalex.org/W2012121796","https://openalex.org/W2068427817","https://openalex.org/W2952090425","https://openalex.org/W2538333368","https://openalex.org/W3127866798","https://openalex.org/W4294845631","https://openalex.org/W1518153952"],"abstract_inverted_index":{"We":[0],"define":[1],"and":[2,25,29],"investigate":[3],"the":[4,14,52],"problem":[5],"of":[6],"electromigration":[7],"faults":[8,45],"caused":[9],"by":[10],"spot":[11],"defects":[12],"during":[13],"VLSI":[15],"manufacturing":[16],"process.":[17],"Analysis":[18],"is":[19,37],"given":[20],"for":[21,31],"a":[22,32,48],"simple":[23],"layout,":[24],"simulations":[26],"are":[27],"presented":[28],"discussed":[30],"more":[33],"complicated":[34],"case.":[35],"It":[36],"shown":[38],"that":[39],"in":[40],"some":[41],"cases,":[42],"electromigration-dependent":[43],"parametric":[44],"can":[46],"make":[47],"significant":[49],"contribution":[50],"to":[51],"total":[53],"yield":[54],"estimation.":[55]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}