{"id":"https://openalex.org/W2537129945","doi":"https://doi.org/10.1109/icecs.2003.1302050","title":"A method to diagnose faults in analog integrated circuits using artificial neural networks with pseudorandom noise as stimulus","display_name":"A method to diagnose faults in analog integrated circuits using artificial neural networks with pseudorandom noise as stimulus","publication_year":2004,"publication_date":"2004-06-03","ids":{"openalex":"https://openalex.org/W2537129945","doi":"https://doi.org/10.1109/icecs.2003.1302050","mag":"2537129945"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2003.1302050","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2003.1302050","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"10th IEEE International Conference on Electronics, Circuits and Systems, 2003. ICECS 2003. Proceedings of the 2003","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110452171","display_name":"Labannya Barua","orcid":null},"institutions":[{"id":"https://openalex.org/I145894827","display_name":"Indian Institute of Technology Kharagpur","ror":"https://ror.org/03w5sq511","country_code":"IN","type":"education","lineage":["https://openalex.org/I145894827"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"L. Barua","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology, Kharagpur, India"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology, Kharagpur, India","institution_ids":["https://openalex.org/I145894827"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024215506","display_name":"Prithviraj Kabisatpathy","orcid":null},"institutions":[{"id":"https://openalex.org/I99729588","display_name":"Indian Institute of Technology Bhubaneswar","ror":"https://ror.org/04gx72j20","country_code":"IN","type":"education","lineage":["https://openalex.org/I99729588"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"P. Kabisatpathy","raw_affiliation_strings":["College of Engineering and Technology, Bhubaneswar, India"],"affiliations":[{"raw_affiliation_string":"College of Engineering and Technology, Bhubaneswar, India","institution_ids":["https://openalex.org/I99729588"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010133971","display_name":"Sudarshana Sinha","orcid":"https://orcid.org/0000-0001-9087-2248"},"institutions":[{"id":"https://openalex.org/I145894827","display_name":"Indian Institute of Technology Kharagpur","ror":"https://ror.org/03w5sq511","country_code":"IN","type":"education","lineage":["https://openalex.org/I145894827"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"S. Sinha","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology, Kharagpur, India"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology, Kharagpur, India","institution_ids":["https://openalex.org/I145894827"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5110452171"],"corresponding_institution_ids":["https://openalex.org/I145894827"],"apc_list":null,"apc_paid":null,"fwci":0.6583,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.74223688,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":97},"biblio":{"volume":"50","issue":null,"first_page":"356","last_page":"359"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6765013337135315},{"id":"https://openalex.org/keywords/perceptron","display_name":"Perceptron","score":0.5916510820388794},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.5796450972557068},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5318282246589661},{"id":"https://openalex.org/keywords/operational-amplifier","display_name":"Operational amplifier","score":0.49654632806777954},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4909217953681946},{"id":"https://openalex.org/keywords/pseudorandom-number-generator","display_name":"Pseudorandom number generator","score":0.4479387402534485},{"id":"https://openalex.org/keywords/digital-pattern-generator","display_name":"Digital pattern generator","score":0.42863741517066956},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4223008155822754},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.41309329867362976},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.40093350410461426},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.38932228088378906},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25502336025238037},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20965594053268433},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.172583669424057},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.12517395615577698}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6765013337135315},{"id":"https://openalex.org/C60908668","wikidata":"https://www.wikidata.org/wiki/Q690207","display_name":"Perceptron","level":3,"score":0.5916510820388794},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.5796450972557068},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5318282246589661},{"id":"https://openalex.org/C145366948","wikidata":"https://www.wikidata.org/wiki/Q178947","display_name":"Operational amplifier","level":4,"score":0.49654632806777954},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4909217953681946},{"id":"https://openalex.org/C140642157","wikidata":"https://www.wikidata.org/wiki/Q1623338","display_name":"Pseudorandom number generator","level":2,"score":0.4479387402534485},{"id":"https://openalex.org/C151346624","wikidata":"https://www.wikidata.org/wiki/Q5276129","display_name":"Digital pattern generator","level":3,"score":0.42863741517066956},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4223008155822754},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.41309329867362976},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.40093350410461426},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.38932228088378906},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25502336025238037},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20965594053268433},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.172583669424057},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.12517395615577698},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs.2003.1302050","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2003.1302050","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"10th IEEE International Conference on Electronics, Circuits and Systems, 2003. ICECS 2003. Proceedings of the 2003","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1482540049","https://openalex.org/W1555400249","https://openalex.org/W1996007494","https://openalex.org/W2001465292","https://openalex.org/W2010922160","https://openalex.org/W2035859096","https://openalex.org/W2050846814","https://openalex.org/W2066058136","https://openalex.org/W2082507277","https://openalex.org/W2083919449","https://openalex.org/W2086263694","https://openalex.org/W2101550795","https://openalex.org/W2113234369","https://openalex.org/W2131610230","https://openalex.org/W2137594223","https://openalex.org/W2157117168","https://openalex.org/W2161236811","https://openalex.org/W2169713829","https://openalex.org/W2171294065","https://openalex.org/W6633035691"],"related_works":["https://openalex.org/W2001429498","https://openalex.org/W2499505660","https://openalex.org/W1540713932","https://openalex.org/W2782047625","https://openalex.org/W2352984759","https://openalex.org/W2167327848","https://openalex.org/W4244211680","https://openalex.org/W2561828749","https://openalex.org/W2120134802","https://openalex.org/W4249015575"],"abstract_inverted_index":{"This":[0,102],"paper":[1],"describes":[2],"a":[3,21,25,36,43,53,68,116,124],"new,":[4],"fast":[5],"and":[6,35,85,92,112,123],"economical":[7],"strategy":[8],"for":[9,72,83],"fault":[10],"diagnosis":[11],"of":[12,23,52],"analog":[13],"integrated":[14],"circuits.":[15],"The":[16,57,87],"methodology":[17,59],"is":[18,40,89,93],"based":[19,120],"on":[20],"technique":[22,103],"using":[24],"pseudo":[26],"random":[27],"noise":[28],"generator":[29,34],"as":[30],"the":[31,50,79],"test":[32],"pattern":[33],"model-based":[37],"observer,":[38],"which":[39],"implemented":[41,62],"through":[42],"feed":[44],"forward":[45],"artificial":[46],"neural":[47],"network":[48],"in":[49,63,115],"form":[51],"single":[54],"hidden-layer":[55],"perceptron.":[56],"proposed":[58],"can":[60],"be":[61],"any":[64],"personal":[65],"computer":[66],"with":[67],"data":[69],"acquisition":[70],"card":[71],"on-line":[73],"operation.":[74],"Its":[75],"main":[76],"advantages":[77],"are":[78],"low":[80],"time":[81],"requirement":[82],"learning":[84],"diagnosing.":[86],"method":[88],"quite":[90],"robust":[91],"able":[94],"to":[95,108],"detect":[96],"small":[97],"component":[98],"variations":[99],"without":[100],"problems.":[101],"has":[104],"been":[105],"successfully":[106],"applied":[107],"diagnose":[109],"both":[110],"hard":[111],"soft":[113],"faults":[114],"bipolar":[117],"junction":[118],"transistor":[119],"operational":[121,126],"amplifier":[122],"MOS":[125],"amplifier.":[127]},"counts_by_year":[{"year":2015,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}