{"id":"https://openalex.org/W1546829559","doi":"https://doi.org/10.1109/icecs.2002.1046197","title":"An efficient test relaxation technique for combinational circuits based on critical path tracing","display_name":"An efficient test relaxation technique for combinational circuits based on critical path tracing","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W1546829559","doi":"https://doi.org/10.1109/icecs.2002.1046197","mag":"1546829559"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2002.1046197","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2002.1046197","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"9th International Conference on Electronics, Circuits and Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://mpra.ub.uni-muenchen.de/14723/1/MPRA_paper_14723.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086020181","display_name":"Aiman H. El\u2010Maleh","orcid":"https://orcid.org/0000-0002-3247-0598"},"institutions":[{"id":"https://openalex.org/I134085113","display_name":"King Fahd University of Petroleum and Minerals","ror":"https://ror.org/03yez3163","country_code":"SA","type":"education","lineage":["https://openalex.org/I134085113"]}],"countries":["SA"],"is_corresponding":true,"raw_author_name":"A. El-Maleh","raw_affiliation_strings":["King Fahd University of Petroleum and Minerals, Dhahran, Saudi Arabia","[King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia]"],"affiliations":[{"raw_affiliation_string":"King Fahd University of Petroleum and Minerals, Dhahran, Saudi Arabia","institution_ids":["https://openalex.org/I134085113"]},{"raw_affiliation_string":"[King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia]","institution_ids":["https://openalex.org/I134085113"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053056880","display_name":"Ali Alsuwaiyan","orcid":null},"institutions":[{"id":"https://openalex.org/I134085113","display_name":"King Fahd University of Petroleum and Minerals","ror":"https://ror.org/03yez3163","country_code":"SA","type":"education","lineage":["https://openalex.org/I134085113"]}],"countries":["SA"],"is_corresponding":false,"raw_author_name":"A. Al-Suwaiyan","raw_affiliation_strings":["King Fahd University of Petroleum and Minerals, Dhahran, Saudi Arabia","[King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia]"],"affiliations":[{"raw_affiliation_string":"King Fahd University of Petroleum and Minerals, Dhahran, Saudi Arabia","institution_ids":["https://openalex.org/I134085113"]},{"raw_affiliation_string":"[King Fahd Univ. of Pet. & Miner., Dhahran, Saudi Arabia]","institution_ids":["https://openalex.org/I134085113"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5086020181"],"corresponding_institution_ids":["https://openalex.org/I134085113"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.05160808,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"2","issue":null,"first_page":"461","last_page":"465"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.7039532661437988},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.686384379863739},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6396678686141968},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6383105516433716},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6197493076324463},{"id":"https://openalex.org/keywords/tracing","display_name":"Tracing","score":0.602271318435669},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5186073780059814},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.5177604556083679},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5090934634208679},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4930283725261688},{"id":"https://openalex.org/keywords/path-tracing","display_name":"Path tracing","score":0.47529730200767517},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.4349604845046997},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.416521281003952},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.31586313247680664},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16029557585716248},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15736660361289978}],"concepts":[{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.7039532661437988},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.686384379863739},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6396678686141968},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6383105516433716},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6197493076324463},{"id":"https://openalex.org/C138673069","wikidata":"https://www.wikidata.org/wiki/Q322229","display_name":"Tracing","level":2,"score":0.602271318435669},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5186073780059814},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.5177604556083679},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5090934634208679},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4930283725261688},{"id":"https://openalex.org/C110541219","wikidata":"https://www.wikidata.org/wiki/Q72948","display_name":"Path tracing","level":3,"score":0.47529730200767517},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.4349604845046997},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.416521281003952},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.31586313247680664},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16029557585716248},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15736660361289978},{"id":"https://openalex.org/C205711294","wikidata":"https://www.wikidata.org/wiki/Q176953","display_name":"Rendering (computer graphics)","level":2,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/icecs.2002.1046197","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2002.1046197","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"9th International Conference on Electronics, Circuits and Systems","raw_type":"proceedings-article"},{"id":"pmh:oai::142","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4306400553","display_name":"Munich Personal RePEc Archive (Ludwig Maximilian University of Munich)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I8204097","host_organization_name":"Ludwig-Maximilians-Universit\u00e4t M\u00fcnchen","host_organization_lineage":["https://openalex.org/I8204097"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":null},{"id":"pmh:oai::14723","is_oa":true,"landing_page_url":"https://eprints.kfupm.edu.sa/id/eprint/14723/2/14723_2.doc","pdf_url":"https://mpra.ub.uni-muenchen.de/14723/1/MPRA_paper_14723.pdf","source":{"id":"https://openalex.org/S4306400553","display_name":"Munich Personal RePEc Archive (Ludwig Maximilian University of Munich)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I8204097","host_organization_name":"Ludwig-Maximilians-Universit\u00e4t M\u00fcnchen","host_organization_lineage":["https://openalex.org/I8204097"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"PeerReviewed"}],"best_oa_location":{"id":"pmh:oai::14723","is_oa":true,"landing_page_url":"https://eprints.kfupm.edu.sa/id/eprint/14723/2/14723_2.doc","pdf_url":"https://mpra.ub.uni-muenchen.de/14723/1/MPRA_paper_14723.pdf","source":{"id":"https://openalex.org/S4306400553","display_name":"Munich Personal RePEc Archive (Ludwig Maximilian University of Munich)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I8204097","host_organization_name":"Ludwig-Maximilians-Universit\u00e4t M\u00fcnchen","host_organization_lineage":["https://openalex.org/I8204097"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"PeerReviewed"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W1546829559.pdf"},"referenced_works_count":15,"referenced_works":["https://openalex.org/W1554885925","https://openalex.org/W1999039453","https://openalex.org/W2020404829","https://openalex.org/W2097936914","https://openalex.org/W2106182768","https://openalex.org/W2107800433","https://openalex.org/W2107995582","https://openalex.org/W2119241964","https://openalex.org/W2123887421","https://openalex.org/W2124132254","https://openalex.org/W2128823151","https://openalex.org/W2133595845","https://openalex.org/W2145007734","https://openalex.org/W2146594632","https://openalex.org/W2503952136"],"related_works":["https://openalex.org/W2786111245","https://openalex.org/W3009953521","https://openalex.org/W4285708951","https://openalex.org/W1991935474","https://openalex.org/W2021253405","https://openalex.org/W2091533492","https://openalex.org/W2323083271","https://openalex.org/W2802691720","https://openalex.org/W2940545572","https://openalex.org/W2098752843"],"abstract_inverted_index":{"Reducing":[0],"test":[1,18,29,48,106],"data":[2],"size":[3],"is":[4,55,92,101],"one":[5],"of":[6,34,96,112],"the":[7,32,70,82,85,97,104],"major":[8],"challenges":[9],"in":[10,66,69,84],"testing":[11],"systems-on-a-chip.":[12],"This":[13],"can":[14],"be":[15],"achieved":[16],"by":[17,109],"compaction":[19,35],"and/or":[20],"compression":[21,37],"techniques.":[22,38],"Having":[23],"a":[24,44,67],"partially":[25],"specified":[26],"or":[27],"relaxed":[28],"set":[30],"increases":[31],"effectiveness":[33],"and":[36,46,61],"In":[39],"this":[40],"paper,":[41],"we":[42],"propose":[43],"novel":[45],"efficient":[47],"relaxation":[49,91,107],"technique":[50,100],"for":[51,94],"combinational":[52],"circuits.":[53,98],"It":[54],"based":[56,74],"on":[57,75,78],"critical":[58],"path":[59],"tracing":[60],"hence":[62],"it":[63],"may":[64],"result":[65],"reduction":[68],"fault":[71,86],"coverage.":[72],"However,":[73],"experimental":[76],"results":[77],"ISCAS":[79],"benchmark":[80],"circuits,":[81],"drop":[83],"coverage":[87],"(if":[88],"any)":[89],"after":[90],"small":[93],"most":[95],"The":[99],"faster":[102],"than":[103],"brute-force":[105],"method":[108],"several":[110],"orders":[111],"magnitude.":[113]},"counts_by_year":[],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}