{"id":"https://openalex.org/W2111586039","doi":"https://doi.org/10.1109/icecs.2002.1046189","title":"Supply current monitor and set-up for fault detection in analogue circuits","display_name":"Supply current monitor and set-up for fault detection in analogue circuits","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2111586039","doi":"https://doi.org/10.1109/icecs.2002.1046189","mag":"2111586039"},"language":"en","primary_location":{"id":"doi:10.1109/icecs.2002.1046189","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2002.1046189","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"9th International Conference on Electronics, Circuits and Systems","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5020682177","display_name":"Mahmoud Al\u2010Qutayri","orcid":"https://orcid.org/0000-0002-9600-8036"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"M.A. Al-Qutayri","raw_affiliation_strings":["Etisalat College of Engineering, Emirates Telecommunications Corporation, Sharjah, UAE","Etisalat Coll. of Eng., Emirates Telecommun. Corp, Sharjah, United Arab Emirates"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Etisalat College of Engineering, Emirates Telecommunications Corporation, Sharjah, UAE","institution_ids":[]},{"raw_affiliation_string":"Etisalat Coll. of Eng., Emirates Telecommun. Corp, Sharjah, United Arab Emirates","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":["https://openalex.org/A5020682177"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"2","issue":null,"first_page":"441","last_page":"444"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9918000102043152,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6435890197753906},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6103686094284058},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.600715696811676},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5873260498046875},{"id":"https://openalex.org/keywords/emphasis","display_name":"Emphasis (telecommunications)","score":0.5767605900764465},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5188849568367004},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.485275000333786},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4839373230934143},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.47783470153808594},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4725220799446106},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.42659685015678406},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.41157665848731995},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.35203033685684204},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3299613893032074},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.30608123540878296},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08341681957244873}],"concepts":[{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6435890197753906},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6103686094284058},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.600715696811676},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5873260498046875},{"id":"https://openalex.org/C177454536","wikidata":"https://www.wikidata.org/wiki/Q578290","display_name":"Emphasis (telecommunications)","level":2,"score":0.5767605900764465},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5188849568367004},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.485275000333786},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4839373230934143},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.47783470153808594},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4725220799446106},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.42659685015678406},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.41157665848731995},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.35203033685684204},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3299613893032074},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.30608123540878296},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08341681957244873},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecs.2002.1046189","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecs.2002.1046189","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"9th International Conference on Electronics, Circuits and Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1555400249","https://openalex.org/W1605400073","https://openalex.org/W1996900504","https://openalex.org/W2060839986","https://openalex.org/W2063588247","https://openalex.org/W2103949315","https://openalex.org/W2118919095","https://openalex.org/W2126059391","https://openalex.org/W6677392108"],"related_works":["https://openalex.org/W2055105357","https://openalex.org/W2153819599","https://openalex.org/W2255426644","https://openalex.org/W2072124641","https://openalex.org/W2167093538","https://openalex.org/W2018956713","https://openalex.org/W2081479354","https://openalex.org/W2113107605","https://openalex.org/W3204693335","https://openalex.org/W1971573522"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"the":[3,12,24,40,47,50],"design":[4,25,45],"of":[5,14,26,46,52],"an":[6,59],"off-chip":[7],"supply":[8,42],"current":[9],"monitor":[10,28,48],"for":[11],"detection":[13],"faults":[15,57],"in":[16,39,58,62],"analogue":[17,60],"circuits.":[18],"The":[19,44],"emphasis":[20],"is":[21],"placed":[22],"on":[23],"a":[27],"with":[29],"minimum":[30],"overhead":[31],"that":[32],"can":[33],"be":[34],"implemented":[35],"to":[36,55],"detect":[37,56],"variations":[38],"dynamic":[41],"current.":[43],"and":[49,65],"results":[51],"using":[53],"it":[54],"circuit,":[61],"both":[63],"simulation":[64],"physical":[66],"environments,":[67],"are":[68],"outlined.":[69]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}