{"id":"https://openalex.org/W7152408218","doi":"https://doi.org/10.1109/icecet63943.2025.11472205","title":"Mechatronic Product\u2019s Family Functional Modeling Using SysML And X-CDSM For Reliability Evaluation","display_name":"Mechatronic Product\u2019s Family Functional Modeling Using SysML And X-CDSM For Reliability Evaluation","publication_year":2025,"publication_date":"2025-07-03","ids":{"openalex":"https://openalex.org/W7152408218","doi":"https://doi.org/10.1109/icecet63943.2025.11472205"},"language":null,"primary_location":{"id":"doi:10.1109/icecet63943.2025.11472205","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecet63943.2025.11472205","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 5th International Conference on Electrical, Computer and Energy Technologies (ICECET)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5133281341","display_name":"Serigne Diagne","orcid":null},"institutions":[{"id":"https://openalex.org/I3133343326","display_name":"Ziguinchor University","ror":"https://ror.org/01xprs690","country_code":"SN","type":"education","lineage":["https://openalex.org/I3133343326"]}],"countries":["SN"],"is_corresponding":true,"raw_author_name":"Serigne Diagne","raw_affiliation_strings":["University Assane SECK,Laboratory of Computer Science and Engineering of Innovation (L3I),Ziguinchor,Senegal"],"affiliations":[{"raw_affiliation_string":"University Assane SECK,Laboratory of Computer Science and Engineering of Innovation (L3I),Ziguinchor,Senegal","institution_ids":["https://openalex.org/I3133343326"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024063857","display_name":"Amadou Coulibaly","orcid":"https://orcid.org/0000-0002-3711-9932"},"institutions":[{"id":"https://openalex.org/I2801509770","display_name":"Institut National des Sciences Appliqu\u00e9es de Strasbourg","ror":"https://ror.org/001nta019","country_code":"FR","type":"education","lineage":["https://openalex.org/I2801509770"]},{"id":"https://openalex.org/I4210100283","display_name":"Laboratoire des Sciences de l'Ing\u00e9nieur, de l'Informatique et de l'Imagerie","ror":"https://ror.org/00k4e5n71","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I2801509770","https://openalex.org/I4210095849","https://openalex.org/I4210100283","https://openalex.org/I4210159245","https://openalex.org/I68947357"]},{"id":"https://openalex.org/I68947357","display_name":"Universit\u00e9 de Strasbourg","ror":"https://ror.org/00pg6eq24","country_code":"FR","type":"education","lineage":["https://openalex.org/I68947357"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Amadou Coulibaly","raw_affiliation_strings":["INSA of Strasbourg,Laboratory of Engineering Science, Computer Science, and Imaging (ICUBE),Strasbourg,France"],"affiliations":[{"raw_affiliation_string":"INSA of Strasbourg,Laboratory of Engineering Science, Computer Science, and Imaging (ICUBE),Strasbourg,France","institution_ids":["https://openalex.org/I2801509770","https://openalex.org/I4210100283","https://openalex.org/I68947357"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5133277910","display_name":"Fran\u00e7ois De Bertrand De Beuvron","orcid":null},"institutions":[{"id":"https://openalex.org/I4210100283","display_name":"Laboratoire des Sciences de l'Ing\u00e9nieur, de l'Informatique et de l'Imagerie","ror":"https://ror.org/00k4e5n71","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I2801509770","https://openalex.org/I4210095849","https://openalex.org/I4210100283","https://openalex.org/I4210159245","https://openalex.org/I68947357"]},{"id":"https://openalex.org/I68947357","display_name":"Universit\u00e9 de Strasbourg","ror":"https://ror.org/00pg6eq24","country_code":"FR","type":"education","lineage":["https://openalex.org/I68947357"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Fran\u00e7ois De Bertrand De Beuvron","raw_affiliation_strings":["University of Strasbourg,Laboratory of Engineering Science, Computer Science, and Imaging (ICUBE),Strasbourg,France"],"affiliations":[{"raw_affiliation_string":"University of Strasbourg,Laboratory of Engineering Science, Computer Science, and Imaging (ICUBE),Strasbourg,France","institution_ids":["https://openalex.org/I68947357","https://openalex.org/I4210100283"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5133281341"],"corresponding_institution_ids":["https://openalex.org/I3133343326"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.73062926,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.11699999868869781,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.11699999868869781,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12000","display_name":"Systems Engineering Methodologies and Applications","score":0.11219999939203262,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.0925000011920929,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6862999796867371},{"id":"https://openalex.org/keywords/mechatronics","display_name":"Mechatronics","score":0.4977000057697296},{"id":"https://openalex.org/keywords/systems-modeling-language","display_name":"Systems Modeling Language","score":0.41940000653266907},{"id":"https://openalex.org/keywords/action","display_name":"Action (physics)","score":0.29829999804496765},{"id":"https://openalex.org/keywords/stability","display_name":"Stability (learning theory)","score":0.28999999165534973},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.28679999709129333}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6862999796867371},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5113000273704529},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5030999779701233},{"id":"https://openalex.org/C28704281","wikidata":"https://www.wikidata.org/wiki/Q180165","display_name":"Mechatronics","level":2,"score":0.4977000057697296},{"id":"https://openalex.org/C21285288","wikidata":"https://www.wikidata.org/wiki/Q2117885","display_name":"Systems Modeling Language","level":4,"score":0.41940000653266907},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.39259999990463257},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.34360000491142273},{"id":"https://openalex.org/C2780791683","wikidata":"https://www.wikidata.org/wiki/Q846785","display_name":"Action (physics)","level":2,"score":0.29829999804496765},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.29120001196861267},{"id":"https://openalex.org/C112972136","wikidata":"https://www.wikidata.org/wiki/Q7595718","display_name":"Stability (learning theory)","level":2,"score":0.28999999165534973},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.28679999709129333},{"id":"https://openalex.org/C66283442","wikidata":"https://www.wikidata.org/wiki/Q1389268","display_name":"Failure mode and effects analysis","level":2,"score":0.26759999990463257},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.258899986743927},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.25859999656677246},{"id":"https://openalex.org/C61797465","wikidata":"https://www.wikidata.org/wiki/Q1188986","display_name":"Term (time)","level":2,"score":0.25519999861717224}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icecet63943.2025.11472205","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icecet63943.2025.11472205","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 5th International Conference on Electrical, Computer and Energy Technologies (ICECET)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-04-10T06:07:51.998497","created_date":"2026-04-10T00:00:00"}