{"id":"https://openalex.org/W2912779344","doi":"https://doi.org/10.1109/icdsp.2018.8631654","title":"Radiation Hardening By Design Integrated Circuits Enabling Low-Cost Satellites for Internet-of-Things","display_name":"Radiation Hardening By Design Integrated Circuits Enabling Low-Cost Satellites for Internet-of-Things","publication_year":2018,"publication_date":"2018-11-01","ids":{"openalex":"https://openalex.org/W2912779344","doi":"https://doi.org/10.1109/icdsp.2018.8631654","mag":"2912779344"},"language":"en","primary_location":{"id":"doi:10.1109/icdsp.2018.8631654","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icdsp.2018.8631654","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 23rd International Conference on Digital Signal Processing (DSP)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101786512","display_name":"Wei Shu","orcid":"https://orcid.org/0009-0008-7619-4610"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Wei Shu","raw_affiliation_strings":["Nanyang Technological University, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101651491","display_name":"Jize Jiang","orcid":"https://orcid.org/0000-0002-8889-3784"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Jize Jiang","raw_affiliation_strings":["Nanyang Technological University, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077587732","display_name":"Kwen Siong Chong","orcid":null},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Kwen Siong Chong","raw_affiliation_strings":["Nanyang Technological University, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023352317","display_name":"Joseph S. Chang","orcid":"https://orcid.org/0000-0003-0991-8339"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Joseph Chang","raw_affiliation_strings":["Nanyang Technological University, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I172675005"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/radiation-hardening","display_name":"Radiation hardening","score":0.705630898475647},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5958127379417419},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.5675567388534546},{"id":"https://openalex.org/keywords/enabling","display_name":"Enabling","score":0.5659283399581909},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5195534825325012},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5157809257507324},{"id":"https://openalex.org/keywords/integrated-circuit-design","display_name":"Integrated circuit design","score":0.5029954314231873},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4727792739868164},{"id":"https://openalex.org/keywords/satellite","display_name":"Satellite","score":0.4545225203037262},{"id":"https://openalex.org/keywords/internet-of-things","display_name":"Internet of Things","score":0.4539884328842163},{"id":"https://openalex.org/keywords/the-internet","display_name":"The Internet","score":0.45099496841430664},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4139120280742645},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3672388195991516},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3402332067489624},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.31767594814300537},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2739805579185486},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.12003657221794128},{"id":"https://openalex.org/keywords/world-wide-web","display_name":"World Wide Web","score":0.11808064579963684},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.07518577575683594}],"concepts":[{"id":"https://openalex.org/C119349744","wikidata":"https://www.wikidata.org/wiki/Q3026015","display_name":"Radiation hardening","level":3,"score":0.705630898475647},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5958127379417419},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.5675567388534546},{"id":"https://openalex.org/C22607594","wikidata":"https://www.wikidata.org/wiki/Q5375150","display_name":"Enabling","level":2,"score":0.5659283399581909},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5195534825325012},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5157809257507324},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.5029954314231873},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4727792739868164},{"id":"https://openalex.org/C19269812","wikidata":"https://www.wikidata.org/wiki/Q26540","display_name":"Satellite","level":2,"score":0.4545225203037262},{"id":"https://openalex.org/C81860439","wikidata":"https://www.wikidata.org/wiki/Q251212","display_name":"Internet of Things","level":2,"score":0.4539884328842163},{"id":"https://openalex.org/C110875604","wikidata":"https://www.wikidata.org/wiki/Q75","display_name":"The Internet","level":2,"score":0.45099496841430664},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4139120280742645},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3672388195991516},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3402332067489624},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.31767594814300537},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2739805579185486},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.12003657221794128},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.11808064579963684},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.07518577575683594},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C542102704","wikidata":"https://www.wikidata.org/wiki/Q183257","display_name":"Psychotherapist","level":1,"score":0.0},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icdsp.2018.8631654","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icdsp.2018.8631654","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE 23rd International Conference on Digital Signal Processing (DSP)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.550000011920929,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1559525507","https://openalex.org/W2031674029","https://openalex.org/W2034562756","https://openalex.org/W2059214545","https://openalex.org/W2122995125","https://openalex.org/W2131862714","https://openalex.org/W2132334378","https://openalex.org/W2161875422","https://openalex.org/W2326183276","https://openalex.org/W2558013876","https://openalex.org/W4302341087"],"related_works":["https://openalex.org/W3022085703","https://openalex.org/W1939000505","https://openalex.org/W2015464935","https://openalex.org/W2051928579","https://openalex.org/W3094423394","https://openalex.org/W1553422968","https://openalex.org/W2046159858","https://openalex.org/W2157634520","https://openalex.org/W2338273177","https://openalex.org/W2168458994"],"abstract_inverted_index":{"Satellite":[0],"technology":[1],"serves":[2],"as":[3],"the":[4,9,38,44,63],"key":[5],"enabler":[6],"to":[7,13,54],"push":[8],"Internet-of-Thing":[10],"(IoT)":[11],"connectivity":[12],"its":[14],"full":[15],"potential.":[16],"Unfortunately,":[17],"present":[18,33,58],"Integrated":[19],"Circuits":[20],"(ICs)":[21],"for":[22],"satellites":[23],"are":[24],"very":[25],"expensive":[26],"and":[27],"dated.":[28],"In":[29],"this":[30],"paper,":[31],"we":[32,56],"an":[34,74],"interesting":[35],"investigation":[36],"into":[37],"design":[39,64],"of":[40,46,62,65,73],"advanced":[41],"ICs":[42],"on":[43],"basis":[45],"a":[47,59,66],"low-cost":[48],"commercial":[49],"bulk":[50],"CMOS":[51],"process.":[52],"Subsequent":[53],"this,":[55],"further":[57],"case":[60],"study":[61],"high-reliability":[67],"radiation-hardened":[68],"voltage":[69],"reference":[70],"by":[71],"means":[72],"innovative":[75],"Radiation":[76],"Harden":[77],"By":[78],"Design":[79],"(RHBD)":[80],"approach.":[81]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}