{"id":"https://openalex.org/W2038127509","doi":"https://doi.org/10.1109/icdsp.2014.6900729","title":"Investigating experienced quality factors in synthesized multi-view stereo images","display_name":"Investigating experienced quality factors in synthesized multi-view stereo images","publication_year":2014,"publication_date":"2014-08-01","ids":{"openalex":"https://openalex.org/W2038127509","doi":"https://doi.org/10.1109/icdsp.2014.6900729","mag":"2038127509"},"language":"en","primary_location":{"id":"doi:10.1109/icdsp.2014.6900729","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icdsp.2014.6900729","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 19th International Conference on Digital Signal Processing","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089050147","display_name":"Hak Gu Kim","orcid":"https://orcid.org/0000-0003-2137-934X"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Hak Gu Kim","raw_affiliation_strings":["Department of Electrical Engineering, KAIST, Daejeon, Republic of Korea","Department of Electrical Engineering KAIST, Daejeon, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, KAIST, Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Electrical Engineering KAIST, Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101991446","display_name":"Yong Ju Jung","orcid":"https://orcid.org/0000-0001-6173-0857"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yong Ju Jung","raw_affiliation_strings":["Department of Electrical Engineering, KAIST, Daejeon, Republic of Korea","Department of Electrical Engineering KAIST, Daejeon, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, KAIST, Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Electrical Engineering KAIST, Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017400630","display_name":"Soo Sung Yoon","orcid":null},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Soo Sung Yoon","raw_affiliation_strings":["Department of Electrical Engineering, KAIST, Daejeon, Republic of Korea","Department of Electrical Engineering KAIST, Daejeon, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, KAIST, Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Electrical Engineering KAIST, Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038798134","display_name":"Yong Man Ro","orcid":"https://orcid.org/0000-0001-5306-6853"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yong Man Ro","raw_affiliation_strings":["Department of Electrical Engineering, KAIST, Daejeon, Republic of Korea","Department of Electrical Engineering KAIST, Daejeon, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, KAIST, Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Electrical Engineering KAIST, Daejeon, Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5089050147"],"corresponding_institution_ids":["https://openalex.org/I157485424"],"apc_list":null,"apc_paid":null,"fwci":1.7923,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.87150997,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"568","last_page":"573"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11408","display_name":"Advanced Optical Imaging Technologies","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11408","display_name":"Advanced Optical Imaging Technologies","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11165","display_name":"Image and Video Quality Assessment","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/stereoscopy","display_name":"Stereoscopy","score":0.8677599430084229},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.730351448059082},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6861534118652344},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6480457782745361},{"id":"https://openalex.org/keywords/consistency","display_name":"Consistency (knowledge bases)","score":0.6227552890777588},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5839765071868896},{"id":"https://openalex.org/keywords/image-quality","display_name":"Image quality","score":0.5780346393585205},{"id":"https://openalex.org/keywords/view-synthesis","display_name":"View synthesis","score":0.4572375416755676},{"id":"https://openalex.org/keywords/perceived-quality","display_name":"Perceived quality","score":0.4457271993160248},{"id":"https://openalex.org/keywords/visualization","display_name":"Visualization","score":0.42391374707221985},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.28102028369903564},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09073746204376221}],"concepts":[{"id":"https://openalex.org/C126057942","wikidata":"https://www.wikidata.org/wiki/Q35158","display_name":"Stereoscopy","level":2,"score":0.8677599430084229},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.730351448059082},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6861534118652344},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6480457782745361},{"id":"https://openalex.org/C2776436953","wikidata":"https://www.wikidata.org/wiki/Q5163215","display_name":"Consistency (knowledge bases)","level":2,"score":0.6227552890777588},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5839765071868896},{"id":"https://openalex.org/C55020928","wikidata":"https://www.wikidata.org/wiki/Q3813865","display_name":"Image quality","level":3,"score":0.5780346393585205},{"id":"https://openalex.org/C2776449333","wikidata":"https://www.wikidata.org/wiki/Q7928781","display_name":"View synthesis","level":3,"score":0.4572375416755676},{"id":"https://openalex.org/C3019940508","wikidata":"https://www.wikidata.org/wiki/Q185957","display_name":"Perceived quality","level":3,"score":0.4457271993160248},{"id":"https://openalex.org/C36464697","wikidata":"https://www.wikidata.org/wiki/Q451553","display_name":"Visualization","level":2,"score":0.42391374707221985},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.28102028369903564},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09073746204376221},{"id":"https://openalex.org/C2778813691","wikidata":"https://www.wikidata.org/wiki/Q1369832","display_name":"Purchasing","level":2,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C205711294","wikidata":"https://www.wikidata.org/wiki/Q176953","display_name":"Rendering (computer graphics)","level":2,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icdsp.2014.6900729","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icdsp.2014.6900729","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 19th International Conference on Digital Signal Processing","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W781416012","https://openalex.org/W1980809053","https://openalex.org/W1992082721","https://openalex.org/W2014504480","https://openalex.org/W2020407015","https://openalex.org/W2028273486","https://openalex.org/W2065039464","https://openalex.org/W2072441879","https://openalex.org/W2102059872","https://openalex.org/W2105038642","https://openalex.org/W2113059272","https://openalex.org/W2119781527","https://openalex.org/W2141994388","https://openalex.org/W2142990573","https://openalex.org/W2165736859","https://openalex.org/W6622740944"],"related_works":["https://openalex.org/W2611780867","https://openalex.org/W2731344982","https://openalex.org/W1536158975","https://openalex.org/W2393788985","https://openalex.org/W2157670837","https://openalex.org/W2029966401","https://openalex.org/W2374120702","https://openalex.org/W2288745733","https://openalex.org/W2631594184","https://openalex.org/W2123769199"],"abstract_inverted_index":{"In":[0,34,63,93],"this":[1,69],"study,":[2],"we":[3,36,78,97],"investigated":[4],"the":[5,15,21,26,39,42,54,60,72,87,94,99,119,129,146,150,163],"quality":[6,24,57,141,155],"factors":[7,58],"in":[8,59,166],"view":[9,101],"synthesis":[10,102],"that":[11,49,128,149],"might":[12,50],"lead":[13],"to":[14,65,158],"visual":[16,73,88,136,151],"discomfort":[17,137],"and":[18,44,75,90,121,138,153],"degradation":[19],"of":[20,25,41,53,82,104,142],"overall":[22,76,140,154],"viewing":[23,91],"synthesized":[27],"multi-view":[28,167],"stereo":[29,100,168],"or":[30],"free":[31],"viewpoint":[32],"images.":[33,123,144],"particular,":[35],"focused":[37],"on":[38,86],"investigation":[40],"left":[43],"right":[45],"(LR)":[46],"image":[47,131],"mismatch":[48,132],"be":[51,159],"one":[52],"most":[55],"important":[56],"stereoscopic":[61,143],"viewing.":[62],"order":[64],"measure":[66],"how":[67],"severely":[68],"factor":[70],"influences":[71],"comfort":[74,89,152],"quality,":[77],"conducted":[79],"a":[80],"series":[81],"subjective":[83,95,125],"assessment":[84],"experiments":[85],"preference.":[92],"experiments,":[96],"compared":[98],"results":[103,126,147],"three":[105],"different":[106],"hole":[107],"filling":[108],"methods,":[109],"because":[110],"incorrectly":[111],"filled":[112],"holes":[113],"could":[114,133],"cause":[115],"severe":[116],"mismatches":[117],"between":[118],"left-":[120],"right-view":[122],"The":[124],"revealed":[127],"LR":[130],"induce":[134],"more":[135],"lower":[139],"Also,":[145],"indicated":[148],"were":[156],"able":[157],"improved":[160],"by":[161],"considering":[162],"inter-view":[164],"consistency":[165],"generation.":[169]},"counts_by_year":[{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}