{"id":"https://openalex.org/W2104790649","doi":"https://doi.org/10.1109/icde.1987.7272399","title":"Modeling the effect of chip failures on cache memory systems","display_name":"Modeling the effect of chip failures on cache memory systems","publication_year":1987,"publication_date":"1987-02-01","ids":{"openalex":"https://openalex.org/W2104790649","doi":"https://doi.org/10.1109/icde.1987.7272399","mag":"2104790649"},"language":"en","primary_location":{"id":"doi:10.1109/icde.1987.7272399","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icde.1987.7272399","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"1987 IEEE Third International Conference on Data Engineering","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109553881","display_name":"Hassanein H. Amer","orcid":null},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Hassanein H. Amer","raw_affiliation_strings":["Center for Reliable Computing, Computer Systems Laboratory, Stanford University, CA 94305, USA"],"affiliations":[{"raw_affiliation_string":"Center for Reliable Computing, Computer Systems Laboratory, Stanford University, CA 94305, USA","institution_ids":["https://openalex.org/I97018004"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054077540","display_name":"E.J. McCluskey","orcid":null},"institutions":[{"id":"https://openalex.org/I97018004","display_name":"Stanford University","ror":"https://ror.org/00f54p054","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Edward J. McCluskey","raw_affiliation_strings":["Center for Reliable Computing, Computer Systems Laboratory, Stanford University, CA 94305, USA"],"affiliations":[{"raw_affiliation_string":"Center for Reliable Computing, Computer Systems Laboratory, Stanford University, CA 94305, USA","institution_ids":["https://openalex.org/I97018004"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5109553881"],"corresponding_institution_ids":["https://openalex.org/I97018004"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.21557715,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"340","last_page":"346"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9908000230789185,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cache","display_name":"Cache","score":0.8015031814575195},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7577118873596191},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5456077456474304},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.532403290271759},{"id":"https://openalex.org/keywords/cache-pollution","display_name":"Cache pollution","score":0.5290265083312988},{"id":"https://openalex.org/keywords/cpu-cache","display_name":"CPU cache","score":0.5152056813240051},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.46741724014282227},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4289102554321289},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.42112770676612854},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.39637091755867004},{"id":"https://openalex.org/keywords/cache-algorithms","display_name":"Cache algorithms","score":0.3829837143421173},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10806271433830261}],"concepts":[{"id":"https://openalex.org/C115537543","wikidata":"https://www.wikidata.org/wiki/Q165596","display_name":"Cache","level":2,"score":0.8015031814575195},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7577118873596191},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5456077456474304},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.532403290271759},{"id":"https://openalex.org/C113166858","wikidata":"https://www.wikidata.org/wiki/Q5015981","display_name":"Cache pollution","level":5,"score":0.5290265083312988},{"id":"https://openalex.org/C189783530","wikidata":"https://www.wikidata.org/wiki/Q352090","display_name":"CPU cache","level":3,"score":0.5152056813240051},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.46741724014282227},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4289102554321289},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.42112770676612854},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.39637091755867004},{"id":"https://openalex.org/C38556500","wikidata":"https://www.wikidata.org/wiki/Q13404475","display_name":"Cache algorithms","level":4,"score":0.3829837143421173},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10806271433830261},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icde.1987.7272399","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icde.1987.7272399","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"1987 IEEE Third International Conference on Data Engineering","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions","score":0.47999998927116394}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W61369494","https://openalex.org/W1499217199","https://openalex.org/W1572474464","https://openalex.org/W2111682903","https://openalex.org/W2294693415"],"related_works":["https://openalex.org/W2031173804","https://openalex.org/W3085471909","https://openalex.org/W2114386333","https://openalex.org/W2363769136","https://openalex.org/W2324141783","https://openalex.org/W2148571123","https://openalex.org/W2012518269","https://openalex.org/W2167303720","https://openalex.org/W2061075966","https://openalex.org/W57688818"],"abstract_inverted_index":{"Two":[0],"statistical":[1],"models":[2,84],"are":[3,62],"developed":[4],"to":[5,75],"estimate":[6],"the":[7,20,23,30,48,68,71,76],"effect":[8],"of":[9,34,56,78,81],"chip":[10],"failures":[11],"on":[12],"cache":[13],"memory":[14,36],"systems.":[15],"The":[16,64],"first":[17],"one":[18],"predicts":[19],"degradation":[21,46,69],"in":[22,47,70,87,96],"expected":[24,49],"Read":[25],"time":[26,51],"taking":[27],"into":[28],"account":[29],"different":[31],"failure":[32],"modes":[33],"a":[35,44],"chip.":[37],"It":[38],"is":[39,43],"seen":[40],"that":[41],"there":[42],"significant":[45],"access":[50],"after":[52],"only":[53],"four":[54],"weeks":[55],"operation":[57],"even":[58],"if":[59],"failed":[60,79],"words":[61],"deallocated.":[63],"second":[65],"model":[66],"estimates":[67],"Miss":[72],"ratio":[73],"due":[74],"deallocation":[77],"sections":[80],"cache.":[82],"Both":[83],"can":[85],"help":[86],"setting":[88],"suitable":[89],"preventive":[90],"maintenance":[91],"schedules":[92],"as":[93,95],"well":[94],"making":[97],"design":[98],"decisions.":[99]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}