{"id":"https://openalex.org/W7168399597","doi":"https://doi.org/10.1109/iccworkshops63917.2026.11586695","title":"Multi-Hop IoT Network Fault Detection Using Spatio-Temporal Graph Neural Network","display_name":"Multi-Hop IoT Network Fault Detection Using Spatio-Temporal Graph Neural Network","publication_year":2026,"publication_date":"2026-05-24","ids":{"openalex":"https://openalex.org/W7168399597","doi":"https://doi.org/10.1109/iccworkshops63917.2026.11586695"},"language":null,"primary_location":{"id":"doi:10.1109/iccworkshops63917.2026.11586695","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccworkshops63917.2026.11586695","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE International Conference on Communications Workshops (ICC Workshops)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5140842793","display_name":"Bishal Lakha","orcid":null},"institutions":[{"id":"https://openalex.org/I4210159266","display_name":"Mitsubishi Electric (United States)","ror":"https://ror.org/053jnhe44","country_code":"US","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125","https://openalex.org/I4210159266"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bishal Lakha","raw_affiliation_strings":["Mitsubishi Electric Research Laboratories (MERL),Cambridge,MA,USA,02139"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mitsubishi Electric Research Laboratories (MERL),Cambridge,MA,USA,02139","institution_ids":["https://openalex.org/I4210159266"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5140820291","display_name":"Jianlin Guo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210159266","display_name":"Mitsubishi Electric (United States)","ror":"https://ror.org/053jnhe44","country_code":"US","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125","https://openalex.org/I4210159266"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jianlin Guo","raw_affiliation_strings":["Mitsubishi Electric Research Laboratories (MERL),Cambridge,MA,USA,02139"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mitsubishi Electric Research Laboratories (MERL),Cambridge,MA,USA,02139","institution_ids":["https://openalex.org/I4210159266"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5140957384","display_name":"Kieran Parsons","orcid":null},"institutions":[{"id":"https://openalex.org/I4210159266","display_name":"Mitsubishi Electric (United States)","ror":"https://ror.org/053jnhe44","country_code":"US","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125","https://openalex.org/I4210159266"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kieran Parsons","raw_affiliation_strings":["Mitsubishi Electric Research Laboratories (MERL),Cambridge,MA,USA,02139"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mitsubishi Electric Research Laboratories (MERL),Cambridge,MA,USA,02139","institution_ids":["https://openalex.org/I4210159266"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5140835632","display_name":"Takenori Sumi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takenori Sumi","raw_affiliation_strings":["Mitsubishi Electric Corporation,Information Technology R&D Center,Kamakura, Kanagawa,Japan,2478501"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mitsubishi Electric Corporation,Information Technology R&D Center,Kamakura, Kanagawa,Japan,2478501","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5140922989","display_name":"Yukimasa Nagai","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yukimasa Nagai","raw_affiliation_strings":["Mitsubishi Electric Corporation,IoT Life Solution Business Strategy Center,Yokohama, Kanagawa,Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mitsubishi Electric Corporation,IoT Life Solution Business Strategy Center,Yokohama, Kanagawa,Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5140865543","display_name":"Edoardo Serra","orcid":null},"institutions":[{"id":"https://openalex.org/I120156002","display_name":"Boise State University","ror":"https://ror.org/02e3zdp86","country_code":"US","type":"education","lineage":["https://openalex.org/I120156002"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Edoardo Serra","raw_affiliation_strings":["Boise State University,Department of Computer Science,Boise,USA,ID 83725"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Boise State University,Department of Computer Science,Boise,USA,ID 83725","institution_ids":["https://openalex.org/I120156002"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":null,"topics":[],"keywords":[{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5365999937057495},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.46650001406669617},{"id":"https://openalex.org/keywords/graph","display_name":"Graph","score":0.4004000127315521},{"id":"https://openalex.org/keywords/intrusion-detection-system","display_name":"Intrusion detection system","score":0.30309998989105225},{"id":"https://openalex.org/keywords/internet-of-things","display_name":"Internet of Things","score":0.29510000348091125}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6252999901771545},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5365999937057495},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.46650001406669617},{"id":"https://openalex.org/C132525143","wikidata":"https://www.wikidata.org/wiki/Q141488","display_name":"Graph","level":2,"score":0.4004000127315521},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.375},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.3587000072002411},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3305000066757202},{"id":"https://openalex.org/C35525427","wikidata":"https://www.wikidata.org/wiki/Q745881","display_name":"Intrusion detection system","level":2,"score":0.30309998989105225},{"id":"https://openalex.org/C81860439","wikidata":"https://www.wikidata.org/wiki/Q251212","display_name":"Internet of Things","level":2,"score":0.29510000348091125},{"id":"https://openalex.org/C24590314","wikidata":"https://www.wikidata.org/wiki/Q336038","display_name":"Wireless sensor network","level":2,"score":0.2939000129699707},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.289000004529953},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.266400009393692},{"id":"https://openalex.org/C51675839","wikidata":"https://www.wikidata.org/wiki/Q1665681","display_name":"Intelligent Network","level":2,"score":0.25870001316070557}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iccworkshops63917.2026.11586695","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccworkshops63917.2026.11586695","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE International Conference on Communications Workshops (ICC Workshops)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320315072","display_name":"Mitsubishi Electric Research Laboratories","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-16T06:00:37.324182","created_date":"2026-07-16T00:00:00"}