{"id":"https://openalex.org/W7141404848","doi":"https://doi.org/10.1109/icce67443.2026.11449904","title":"OpenOCD-Compliant Radiation-Hardened JTAG Interface for Optically Reconfigurable Gate Array VLSIs","display_name":"OpenOCD-Compliant Radiation-Hardened JTAG Interface for Optically Reconfigurable Gate Array VLSIs","publication_year":2026,"publication_date":"2026-02-03","ids":{"openalex":"https://openalex.org/W7141404848","doi":"https://doi.org/10.1109/icce67443.2026.11449904"},"language":null,"primary_location":{"id":"doi:10.1109/icce67443.2026.11449904","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icce67443.2026.11449904","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE International Conference on Consumer Electronics (ICCE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5116806738","display_name":"Naoki Nagamine","orcid":null},"institutions":[{"id":"https://openalex.org/I136446963","display_name":"Okayama University of Science","ror":"https://ror.org/05aevyc10","country_code":"JP","type":"education","lineage":["https://openalex.org/I136446963"]},{"id":"https://openalex.org/I163770644","display_name":"Okayama University","ror":"https://ror.org/02pc6pc55","country_code":"JP","type":"education","lineage":["https://openalex.org/I163770644"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Naoki Nagamine","raw_affiliation_strings":["Okayama University Okayama University,Graduate School of Environmental, Life, Natural Science and Technology,Okayama,Japan,700-8530"],"affiliations":[{"raw_affiliation_string":"Okayama University Okayama University,Graduate School of Environmental, Life, Natural Science and Technology,Okayama,Japan,700-8530","institution_ids":["https://openalex.org/I163770644","https://openalex.org/I136446963"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5130731565","display_name":"Minoru Watanabe","orcid":null},"institutions":[{"id":"https://openalex.org/I136446963","display_name":"Okayama University of Science","ror":"https://ror.org/05aevyc10","country_code":"JP","type":"education","lineage":["https://openalex.org/I136446963"]},{"id":"https://openalex.org/I163770644","display_name":"Okayama University","ror":"https://ror.org/02pc6pc55","country_code":"JP","type":"education","lineage":["https://openalex.org/I163770644"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Minoru Watanabe","raw_affiliation_strings":["Okayama University Okayama University,Graduate School of Environmental, Life, Natural Science and Technology,Okayama,Japan,700-8530"],"affiliations":[{"raw_affiliation_string":"Okayama University Okayama University,Graduate School of Environmental, Life, Natural Science and Technology,Okayama,Japan,700-8530","institution_ids":["https://openalex.org/I163770644","https://openalex.org/I136446963"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5130742687","display_name":"Nobuya Watanabe","orcid":null},"institutions":[{"id":"https://openalex.org/I136446963","display_name":"Okayama University of Science","ror":"https://ror.org/05aevyc10","country_code":"JP","type":"education","lineage":["https://openalex.org/I136446963"]},{"id":"https://openalex.org/I163770644","display_name":"Okayama University","ror":"https://ror.org/02pc6pc55","country_code":"JP","type":"education","lineage":["https://openalex.org/I163770644"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Nobuya Watanabe","raw_affiliation_strings":["Okayama University Okayama University,Graduate School of Environmental, Life, Natural Science and Technology,Okayama,Japan,700-8530"],"affiliations":[{"raw_affiliation_string":"Okayama University Okayama University,Graduate School of Environmental, Life, Natural Science and Technology,Okayama,Japan,700-8530","institution_ids":["https://openalex.org/I163770644","https://openalex.org/I136446963"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5116806738"],"corresponding_institution_ids":["https://openalex.org/I136446963","https://openalex.org/I163770644"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.92702031,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.326200008392334,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.326200008392334,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.07169999927282333,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.06159999966621399,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.6003999710083008},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.3684000074863434},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.30320000648498535},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.25529998540878296}],"concepts":[{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.6003999710083008},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4406000077724457},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3937000036239624},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3847000002861023},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.3684000074863434},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3449999988079071},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.32749998569488525},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.30320000648498535},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.29660001397132874},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2711000144481659},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.25529998540878296},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.2540999948978424}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icce67443.2026.11449904","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icce67443.2026.11449904","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE International Conference on Consumer Electronics (ICCE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7677675485610962,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1980344006","https://openalex.org/W2601634806","https://openalex.org/W2767108248","https://openalex.org/W2895588716","https://openalex.org/W3028989297","https://openalex.org/W3108130890","https://openalex.org/W4387473943","https://openalex.org/W4388667062"],"related_works":[],"abstract_inverted_index":{"We":[0],"have":[1,78],"been":[2],"developing":[3],"radiation-hardened":[4,82],"optically":[5,112],"reconfigurable":[6,113],"gate":[7,17,114],"array":[8,18,115],"(ORGA)":[9],"VLSIs.":[10],"The":[11,100,117],"ORGA-":[12],"VLSIs":[13],"allow":[14],"the":[15,41,46,54,63,123,141,146],"programmable":[16],"to":[19,39,53,71,96,109],"be":[20,50],"broken":[21],"partly.":[22],"In":[23],"this":[24,75],"case,":[25],"radiation-damaged":[26],"regions":[27,32,48],"are":[28,33],"avoided":[29],"and":[30,128],"non-damaged":[31],"only":[34],"used":[35],"for":[36,61,140],"applications.":[37],"However,":[38],"exploit":[40],"advantage":[42],"point":[43],"of":[44],"ORGAs,":[45],"faulty":[47,64],"must":[49],"identified":[51],"prior":[52],"use.":[55],"Although":[56],"JTAG":[57,67,83,98,102],"interface":[58,68,84,103],"is":[59,69,86],"useful":[60],"identifying":[62],"region,":[65],"current":[66,97],"vulnerable":[70],"radiation.":[72],"To":[73],"solve":[74],"problem,":[76],"we":[77],"developed":[79],"a":[80],"new":[81],"that":[85,132],"compliant":[87],"with":[88],"IEEE":[89],"1149.1,":[90],"by":[91],"applying":[92],"triple":[93],"modular":[94],"redundancy":[95],"interface.":[99],"designed":[101],"was":[104,120],"implemented":[105],"onto":[106],"an":[107,111],"FPGA":[108],"test":[110],"VLSI.":[116],"ORGA":[118],"operation":[119],"verified":[121],"using":[122],"open-source":[124],"debugging":[125],"tool":[126],"OpenOCD":[127],"SVF":[129],"files.":[130],"At":[131],"time,":[133],"boundary":[134],"scan":[135],"tests":[136],"were":[137],"successfully":[138],"completed":[139],"ORGA-VLSI.":[142],"This":[143],"paper":[144],"presents":[145],"experimental":[147],"results.":[148]},"counts_by_year":[],"updated_date":"2026-03-29T06:01:01.467347","created_date":"2026-03-28T00:00:00"}