{"id":"https://openalex.org/W7141194246","doi":"https://doi.org/10.1109/icce67443.2026.11449745","title":"nzswap: Network-based Compressed Swap with Process Isolation and Failover Resilience","display_name":"nzswap: Network-based Compressed Swap with Process Isolation and Failover Resilience","publication_year":2026,"publication_date":"2026-02-03","ids":{"openalex":"https://openalex.org/W7141194246","doi":"https://doi.org/10.1109/icce67443.2026.11449745"},"language":null,"primary_location":{"id":"doi:10.1109/icce67443.2026.11449745","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icce67443.2026.11449745","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE International Conference on Consumer Electronics (ICCE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5130728860","display_name":"Taejoon Song","orcid":null},"institutions":[{"id":"https://openalex.org/I2818286","display_name":"LG (United States)","ror":"https://ror.org/02b948n83","country_code":"US","type":"company","lineage":["https://openalex.org/I2818286","https://openalex.org/I4210131320"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Taejoon Song","raw_affiliation_strings":["LG Electronics"],"affiliations":[{"raw_affiliation_string":"LG Electronics","institution_ids":["https://openalex.org/I2818286"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035915222","display_name":"H. Cho","orcid":null},"institutions":[{"id":"https://openalex.org/I2818286","display_name":"LG (United States)","ror":"https://ror.org/02b948n83","country_code":"US","type":"company","lineage":["https://openalex.org/I2818286","https://openalex.org/I4210131320"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hyungjun Cho","raw_affiliation_strings":["LG Electronics"],"affiliations":[{"raw_affiliation_string":"LG Electronics","institution_ids":["https://openalex.org/I2818286"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024068494","display_name":"G. W. Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I2818286","display_name":"LG (United States)","ror":"https://ror.org/02b948n83","country_code":"US","type":"company","lineage":["https://openalex.org/I2818286","https://openalex.org/I4210131320"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gunho Lee","raw_affiliation_strings":["LG Electronics"],"affiliations":[{"raw_affiliation_string":"LG Electronics","institution_ids":["https://openalex.org/I2818286"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081343194","display_name":"Y. H. Park","orcid":null},"institutions":[{"id":"https://openalex.org/I2818286","display_name":"LG (United States)","ror":"https://ror.org/02b948n83","country_code":"US","type":"company","lineage":["https://openalex.org/I2818286","https://openalex.org/I4210131320"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"YoungJun Park","raw_affiliation_strings":["LG Electronics"],"affiliations":[{"raw_affiliation_string":"LG Electronics","institution_ids":["https://openalex.org/I2818286"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5130728860"],"corresponding_institution_ids":["https://openalex.org/I2818286"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.95777778,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.20080000162124634,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.20080000162124634,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.14640000462532043,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.07500000298023224,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/failover","display_name":"Failover","score":0.7314000129699707},{"id":"https://openalex.org/keywords/resilience","display_name":"Resilience (materials science)","score":0.5123000144958496},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.505299985408783},{"id":"https://openalex.org/keywords/swap","display_name":"Swap (finance)","score":0.4959000051021576},{"id":"https://openalex.org/keywords/isolation","display_name":"Isolation (microbiology)","score":0.37869998812675476},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.32179999351501465}],"concepts":[{"id":"https://openalex.org/C109751979","wikidata":"https://www.wikidata.org/wiki/Q998767","display_name":"Failover","level":2,"score":0.7314000129699707},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6029000282287598},{"id":"https://openalex.org/C2779585090","wikidata":"https://www.wikidata.org/wiki/Q3457762","display_name":"Resilience (materials science)","level":2,"score":0.5123000144958496},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.505299985408783},{"id":"https://openalex.org/C99821215","wikidata":"https://www.wikidata.org/wiki/Q1136583","display_name":"Swap (finance)","level":2,"score":0.4959000051021576},{"id":"https://openalex.org/C2775941552","wikidata":"https://www.wikidata.org/wiki/Q25212305","display_name":"Isolation (microbiology)","level":2,"score":0.37869998812675476},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.3564000129699707},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.32179999351501465},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.3149999976158142},{"id":"https://openalex.org/C188198153","wikidata":"https://www.wikidata.org/wiki/Q1613840","display_name":"Limiting","level":2,"score":0.2639000117778778},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.2635999917984009},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.25929999351501465},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.25859999656677246},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.2578999996185303}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icce67443.2026.11449745","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icce67443.2026.11449745","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE International Conference on Consumer Electronics (ICCE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","id":"https://metadata.un.org/sdg/13","score":0.49021241068840027}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W198862760","https://openalex.org/W1985229168","https://openalex.org/W2070010964","https://openalex.org/W2126656851","https://openalex.org/W2133521520","https://openalex.org/W2477486007","https://openalex.org/W2895764835","https://openalex.org/W2922202378","https://openalex.org/W2974447213"],"related_works":[],"abstract_inverted_index":{"Modern":[0],"embedded":[1],"and":[2,11,22,40,55,65,74,87,91,100],"networked":[3],"systems":[4],"extend":[5],"limited":[6],"DRAM":[7],"capacity":[8],"through":[9,62],"compressed":[10],"network-backed":[12,49],"swap.":[13],"However,":[14],"these":[15],"mechanisms":[16],"often":[17],"suffer":[18],"from":[19,68],"prioritization":[20],"gaps":[21],"fragile":[23],"failure":[24],"behavior.":[25],"We":[26],"present":[27],"nzswap,":[28],"a":[29,48],"network-based":[30],"compressed-swap":[31],"framework":[32],"that":[33],"combines":[34],"per-cgroup":[35],"isolation,":[36],"compression-aware":[37],"network":[38,60,69,98,109],"writeback,":[39],"failover":[41],"control.":[42],"nzswap":[43,80],"routes":[44],"non-critical":[45,92],"tasks":[46,54],"to":[47,51,85],"tier":[50],"protect":[52],"critical":[53,90],"reduce":[56],"interference.":[57],"It":[58,95],"minimizes":[59],"traffic":[61],"compression-optimized":[63],"transmission":[64],"recovers":[66],"gracefully":[67],"timeouts":[70],"using":[71],"controlled":[72],"deactivation":[73],"OOM":[75],"prevention.":[76],"Under":[77],"memory-pressure":[78],"scenarios,":[79],"improves":[81],"performance":[82],"by":[83],"up":[84],"2.4\u00d7":[86],"7.9\u00d7":[88],"for":[89],"tasks,":[93],"respectively.":[94],"further":[96],"reduces":[97],"payload":[99],"maintains":[101],"stable":[102],"operation":[103],"even":[104],"during":[105],"transient":[106],"or":[107],"persistent":[108],"failures.":[110]},"counts_by_year":[],"updated_date":"2026-03-29T06:01:01.467347","created_date":"2026-03-28T00:00:00"}