{"id":"https://openalex.org/W4408861033","doi":"https://doi.org/10.1109/icce63647.2025.10930058","title":"Strength Assessment Procedure using Grid Strength Impedance Metric with PSCAD","display_name":"Strength Assessment Procedure using Grid Strength Impedance Metric with PSCAD","publication_year":2025,"publication_date":"2025-01-11","ids":{"openalex":"https://openalex.org/W4408861033","doi":"https://doi.org/10.1109/icce63647.2025.10930058"},"language":"en","primary_location":{"id":"doi:10.1109/icce63647.2025.10930058","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icce63647.2025.10930058","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Conference on Consumer Electronics (ICCE)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109640876","display_name":"Deokki You","orcid":null},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Deokki You","raw_affiliation_strings":["School of Electrical Engineering, Korea University,Seoul,Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea University,Seoul,Republic of Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029962922","display_name":"Soseul Jeong","orcid":"https://orcid.org/0000-0002-2678-1736"},"institutions":[{"id":"https://openalex.org/I196471810","display_name":"Korea Electrotechnology Research Institute","ror":"https://ror.org/03ctacd45","country_code":"KR","type":"nonprofit","lineage":["https://openalex.org/I196471810"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Soseul Jeong","raw_affiliation_strings":["Korea Electrotechnology Research Institute (KERI),Distributed Power System Research Center,Gwangju,Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Korea Electrotechnology Research Institute (KERI),Distributed Power System Research Center,Gwangju,Republic of Korea","institution_ids":["https://openalex.org/I196471810"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013899633","display_name":"Yeuntae Yoo","orcid":"https://orcid.org/0000-0003-3530-8673"},"institutions":[{"id":"https://openalex.org/I89440247","display_name":"Myongji University","ror":"https://ror.org/00s9dpb54","country_code":"KR","type":"education","lineage":["https://openalex.org/I89440247"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yeuntae Yoo","raw_affiliation_strings":["Myongji University,Depart. of Electrical Engineering,Gyeonggi,Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Myongji University,Depart. of Electrical Engineering,Gyeonggi,Republic of Korea","institution_ids":["https://openalex.org/I89440247"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023636192","display_name":"Seungmin Jung","orcid":"https://orcid.org/0000-0002-9806-9545"},"institutions":[{"id":"https://openalex.org/I124633538","display_name":"University of Seoul","ror":"https://ror.org/05en5nh73","country_code":"KR","type":"education","lineage":["https://openalex.org/I124633538"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seungmin Jung","raw_affiliation_strings":["University of Seoul,Depart. of Electrical and computer Engineering,Seoul,Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Seoul,Depart. of Electrical and computer Engineering,Seoul,Republic of Korea","institution_ids":["https://openalex.org/I124633538"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5056296601","display_name":"Gilsoo Jang","orcid":"https://orcid.org/0000-0001-7590-8345"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Gilsoo Jang","raw_affiliation_strings":["School of Electrical Engineering, Korea University,Seoul,Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea University,Seoul,Republic of Korea","institution_ids":["https://openalex.org/I197347611"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.06325792,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9014000296592712,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9014000296592712,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.6529181599617004},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.6322826147079468},{"id":"https://openalex.org/keywords/grid","display_name":"Grid","score":0.6081241369247437},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5743884444236755},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3934171199798584},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3688849210739136},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2972298562526703},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19826239347457886},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.17245110869407654},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.07852628827095032}],"concepts":[{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.6529181599617004},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.6322826147079468},{"id":"https://openalex.org/C187691185","wikidata":"https://www.wikidata.org/wiki/Q2020720","display_name":"Grid","level":2,"score":0.6081241369247437},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5743884444236755},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3934171199798584},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3688849210739136},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2972298562526703},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19826239347457886},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17245110869407654},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.07852628827095032},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icce63647.2025.10930058","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icce63647.2025.10930058","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Conference on Consumer Electronics (ICCE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.5099999904632568}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2059099141","https://openalex.org/W2163501722","https://openalex.org/W2782216136","https://openalex.org/W2890713628","https://openalex.org/W2897139880","https://openalex.org/W2996132808","https://openalex.org/W3000227433","https://openalex.org/W4225885649","https://openalex.org/W4285146069","https://openalex.org/W4313887310","https://openalex.org/W4367675614","https://openalex.org/W4392251563","https://openalex.org/W4400228890"],"related_works":["https://openalex.org/W4376453582","https://openalex.org/W2959160600","https://openalex.org/W3147033875","https://openalex.org/W1568390478","https://openalex.org/W2764722704","https://openalex.org/W318913410","https://openalex.org/W2355543518","https://openalex.org/W2601840227","https://openalex.org/W2131832954","https://openalex.org/W2142113611"],"abstract_inverted_index":{"With":[0],"the":[1,28,38,46,65,98,114,125,142,158,178,186],"growing":[2],"integration":[3],"of":[4,48,69,116,124,144,180,189],"inverter-based":[5],"renewable":[6],"energy":[7],"sources,":[8],"modern":[9,193],"power":[10,50,128,194],"systems":[11],"face":[12],"increasing":[13],"challenges":[14],"in":[15,113,192],"maintaining":[16],"grid":[17,35,57,79,95,99,136,153],"strength":[18,36,100,137,154],"across":[19,84,108],"a":[20,75,90],"wide":[21],"frequency":[22,110],"spectrum.":[23],"Traditional":[24],"indices,":[25],"such":[26,53],"as":[27,54],"short":[29],"circuit":[30],"ratio":[31],"(SCR),":[32],"primarily":[33],"assess":[34,94],"at":[37,157,164,172],"fundamental":[39,159],"frequency,":[40,160],"which":[41,72,104],"is":[42,155,171],"inadequate":[43],"for":[44,81],"evaluating":[45],"impact":[47],"dynamic,":[49],"electronics-based":[51],"devices":[52],"inverters":[55],"on":[56,74],"stability.":[58],"This":[59,87],"limitation":[60],"poses":[61],"significant":[62],"risks":[63],"to":[64,93,184],"performance":[66],"and":[67,77,134,140],"reliability":[68],"consumer":[70,117,190],"electronics,":[71],"depend":[73],"stable":[76],"robust":[78],"connection":[80,143],"seamless":[82],"operation":[83,188],"various":[85],"frequencies.":[86],"paper":[88],"proposes":[89],"comprehensive":[91],"procedure":[92],"robustness":[96],"using":[97],"impedance":[101],"metric":[102],"(GSIM),":[103],"analyzes":[105],"system":[106],"stability":[107],"all":[109],"ranges,":[111],"particularly":[112],"context":[115],"electronics":[118,191],"integration.":[119],"Through":[120],"detailed":[121],"PSCAD-based":[122],"simulations":[123],"Jeju":[126],"Island":[127],"grid,":[129],"we":[130],"extract":[131],"frequency-dependent":[132],"impedances":[133],"evaluate":[135],"both":[138],"with":[139],"without":[141],"Grid-Following":[145],"(GFL)":[146],"inverters.":[147],"The":[148],"results":[149],"demonstrate":[150],"that":[151],"while":[152],"high":[156],"potential":[161],"instability":[162],"arises":[163],"higher":[165],"frequencies,":[166],"especially":[167],"when":[168],"inverter":[169],"output":[170],"its":[173],"peak.":[174],"These":[175],"findings":[176],"underscore":[177],"importance":[179],"robust,":[181],"frequency-wide":[182],"analysis":[183],"ensure":[185],"reliable":[187],"systems.":[195]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}