{"id":"https://openalex.org/W4392248611","doi":"https://doi.org/10.1109/icce59016.2024.10444198","title":"Fault Detection in 3D-Printing with Deep Learning","display_name":"Fault Detection in 3D-Printing with Deep Learning","publication_year":2024,"publication_date":"2024-01-06","ids":{"openalex":"https://openalex.org/W4392248611","doi":"https://doi.org/10.1109/icce59016.2024.10444198"},"language":"en","primary_location":{"id":"doi:10.1109/icce59016.2024.10444198","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icce59016.2024.10444198","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Conference on Consumer Electronics (ICCE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085888481","display_name":"Luca Rettenberger","orcid":"https://orcid.org/0000-0002-7416-1902"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Luca Rettenberger","raw_affiliation_strings":["Institute for Automation and Applied Informatics (IAI) Karlsruhe Institute of Technology (KIT) Hermann-von-Helmholtz-Platz 1,Eggenstein-Leopoldshafen,76344"],"affiliations":[{"raw_affiliation_string":"Institute for Automation and Applied Informatics (IAI) Karlsruhe Institute of Technology (KIT) Hermann-von-Helmholtz-Platz 1,Eggenstein-Leopoldshafen,76344","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Nils Beyer","orcid":null},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Nils Beyer","raw_affiliation_strings":["Institute for Automation and Applied Informatics (IAI) Karlsruhe Institute of Technology (KIT) Hermann-von-Helmholtz-Platz 1,Eggenstein-Leopoldshafen,76344"],"affiliations":[{"raw_affiliation_string":"Institute for Automation and Applied Informatics (IAI) Karlsruhe Institute of Technology (KIT) Hermann-von-Helmholtz-Platz 1,Eggenstein-Leopoldshafen,76344","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081189161","display_name":"Ingo Sieber","orcid":"https://orcid.org/0000-0003-2811-7852"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ingo Sieber","raw_affiliation_strings":["Institute for Automation and Applied Informatics (IAI) Karlsruhe Institute of Technology (KIT) Hermann-von-Helmholtz-Platz 1,Eggenstein-Leopoldshafen,76344"],"affiliations":[{"raw_affiliation_string":"Institute for Automation and Applied Informatics (IAI) Karlsruhe Institute of Technology (KIT) Hermann-von-Helmholtz-Platz 1,Eggenstein-Leopoldshafen,76344","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049462585","display_name":"Markus Reischl","orcid":"https://orcid.org/0000-0002-7780-6374"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Markus Reischl","raw_affiliation_strings":["Institute for Automation and Applied Informatics (IAI) Karlsruhe Institute of Technology (KIT) Hermann-von-Helmholtz-Platz 1,Eggenstein-Leopoldshafen,76344"],"affiliations":[{"raw_affiliation_string":"Institute for Automation and Applied Informatics (IAI) Karlsruhe Institute of Technology (KIT) Hermann-von-Helmholtz-Platz 1,Eggenstein-Leopoldshafen,76344","institution_ids":["https://openalex.org/I102335020"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5085888481"],"corresponding_institution_ids":["https://openalex.org/I102335020"],"apc_list":null,"apc_paid":null,"fwci":2.1446,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.86235089,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":100},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10783","display_name":"Additive Manufacturing and 3D Printing Technologies","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10783","display_name":"Additive Manufacturing and 3D Printing Technologies","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6673392653465271},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.6131231784820557},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5770494341850281},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5075079798698425}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6673392653465271},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.6131231784820557},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5770494341850281},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5075079798698425},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icce59016.2024.10444198","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icce59016.2024.10444198","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Conference on Consumer Electronics (ICCE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320325698","display_name":"Helmholtz Association","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1595545560","https://openalex.org/W2045279221","https://openalex.org/W2135660333","https://openalex.org/W2397118735","https://openalex.org/W2626358610","https://openalex.org/W2895417602","https://openalex.org/W2909096226","https://openalex.org/W2948689530","https://openalex.org/W2985564712","https://openalex.org/W3017430683","https://openalex.org/W3031552405","https://openalex.org/W3200257441","https://openalex.org/W4206634190","https://openalex.org/W4233480432","https://openalex.org/W4291894926","https://openalex.org/W4309969686"],"related_works":["https://openalex.org/W2731899572","https://openalex.org/W3215138031","https://openalex.org/W4321369474","https://openalex.org/W3009238340","https://openalex.org/W4360585206","https://openalex.org/W4285208911","https://openalex.org/W3082895349","https://openalex.org/W4213079790","https://openalex.org/W2248239756","https://openalex.org/W4323565446"],"abstract_inverted_index":{"Fused":[0],"filament":[1,14],"fabrication":[2],"is":[3,82,157],"a":[4,19,124,131],"popular":[5],"3D":[6,110,170],"printing":[7,46,65,75,111,143,155,161,171],"process":[8,76],"where":[9],"layers":[10],"of":[11,34,48,116],"fusible":[12],"plastic":[13],"are":[15,47],"used":[16],"to":[17,51,71,178],"build":[18],"workpiece.":[20],"However,":[21,80],"the":[22,31,37,74,114],"high":[23],"manual":[24],"maintenance":[25],"needs":[26],"limit":[27],"its":[28],"potential.":[29],"Given":[30],"common":[32],"incidence":[33],"defects":[35],"in":[36,90,109,119],"printed":[38,117,138],"components,":[39],"automated":[40],"solutions":[41],"detecting":[42,107,160],"these":[43],"errors":[44,108],"while":[45],"great":[49],"benefit":[50],"every":[52],"practitioner.":[53],"Current":[54],"research":[55],"primarily":[56],"focuses":[57],"on":[58],"monitoring":[59],"and":[60,64,77,112,129,142,154,181],"optimizing":[61],"manufacturing":[62],"processes":[63],"parameters":[66],"or":[67],"using":[68,122],"additional":[69,95],"sensors":[70],"directly":[72],"observe":[73],"identify":[78],"errors.":[79,162],"there":[81],"no":[83],"established":[84],"procedure":[85],"for":[86,159],"assessing":[87,113],"print":[88,182],"quality":[89,115],"real":[91,120],"time":[92,121],"with":[93],"minimal":[94],"sensors.":[96],"Our":[97,146,163],"proposed":[98,164],"computer":[99,165],"vision-based":[100,166],"deep-learning":[101,167],"system":[102,168],"overcomes":[103],"previous":[104],"limitations":[105],"by":[106,172],"parts":[118],"only":[123],"single":[125],"camera.":[126],"We":[127],"record":[128],"provide":[130],"multi-class":[132],"image":[133],"dataset":[134],"that":[135,150],"encompasses":[136],"different":[137],"geometries,":[139],"error":[140,174],"classes,":[141],"condition":[144],"variations.":[145],"extensive":[147],"evaluation":[148],"shows":[149],"considering":[151],"various":[152],"geometries":[153],"conditions":[156],"vital":[158],"enhances":[169],"automating":[173],"detection,":[175],"enabling":[176],"practitioners":[177],"increase":[179],"efficiency":[180],"high-quality":[183],"workpieces.":[184]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":4}],"updated_date":"2026-04-21T08:09:41.155169","created_date":"2025-10-10T00:00:00"}