{"id":"https://openalex.org/W1981149326","doi":"https://doi.org/10.1109/icce.2013.6487056","title":"RAID-optimal data placement in a hybrid solid-state drive","display_name":"RAID-optimal data placement in a hybrid solid-state drive","publication_year":2013,"publication_date":"2013-01-01","ids":{"openalex":"https://openalex.org/W1981149326","doi":"https://doi.org/10.1109/icce.2013.6487056","mag":"1981149326"},"language":"en","primary_location":{"id":"doi:10.1109/icce.2013.6487056","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icce.2013.6487056","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Conference on Consumer Electronics (ICCE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111432759","display_name":"Jungmin Seo","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jungmin Seo","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Samsung Electronics Company Limited, South Korea","[Samsung Advanced Institute of Technology, Samsung Electronics]"],"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Samsung Electronics Company Limited, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"[Samsung Advanced Institute of Technology, Samsung Electronics]","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008250255","display_name":"Jupyung Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jupyung Lee","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Samsung Electronics Company Limited, South Korea","[Samsung Advanced Institute of Technology, Samsung Electronics]"],"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Samsung Electronics Company Limited, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"[Samsung Advanced Institute of Technology, Samsung Electronics]","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066365577","display_name":"Boncheol Gu","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Boncheol Gu","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Samsung Electronics Company Limited, South Korea","[Samsung Advanced Institute of Technology, Samsung Electronics]"],"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Samsung Electronics Company Limited, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"[Samsung Advanced Institute of Technology, Samsung Electronics]","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059064215","display_name":"Hyunjung Shin","orcid":"https://orcid.org/0000-0003-1284-9098"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyun-Jung Shin","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Samsung Electronics Company Limited, South Korea","[Samsung Advanced Institute of Technology, Samsung Electronics]"],"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Samsung Electronics Company Limited, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"[Samsung Advanced Institute of Technology, Samsung Electronics]","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102164136","display_name":"B. M. Jung","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"B. M. Jung","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Samsung Electronics Company Limited, South Korea","[Samsung Advanced Institute of Technology, Samsung Electronics]"],"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Samsung Electronics Company Limited, South Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"[Samsung Advanced Institute of Technology, Samsung Electronics]","institution_ids":["https://openalex.org/I2250650973"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5111432759"],"corresponding_institution_ids":["https://openalex.org/I2250650973"],"apc_list":null,"apc_paid":null,"fwci":0.3653,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.6319125,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"2008","issue":null,"first_page":"651","last_page":"652"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11478","display_name":"Caching and Content Delivery","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.98089998960495,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/raid","display_name":"RAID","score":0.9227621555328369},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7328776121139526},{"id":"https://openalex.org/keywords/flash-memory","display_name":"Flash memory","score":0.535024881362915},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.450736403465271},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.4297483563423157},{"id":"https://openalex.org/keywords/computer-data-storage","display_name":"Computer data storage","score":0.42801135778427124},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.42288023233413696},{"id":"https://openalex.org/keywords/solid-state","display_name":"Solid-state","score":0.41753146052360535},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4116094410419464},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3215332627296448},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.2398412525653839},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1038956344127655}],"concepts":[{"id":"https://openalex.org/C133320665","wikidata":"https://www.wikidata.org/wiki/Q179299","display_name":"RAID","level":2,"score":0.9227621555328369},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7328776121139526},{"id":"https://openalex.org/C2776531357","wikidata":"https://www.wikidata.org/wiki/Q174077","display_name":"Flash memory","level":2,"score":0.535024881362915},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.450736403465271},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.4297483563423157},{"id":"https://openalex.org/C194739806","wikidata":"https://www.wikidata.org/wiki/Q66221","display_name":"Computer data storage","level":2,"score":0.42801135778427124},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.42288023233413696},{"id":"https://openalex.org/C107814960","wikidata":"https://www.wikidata.org/wiki/Q611957","display_name":"Solid-state","level":2,"score":0.41753146052360535},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4116094410419464},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3215332627296448},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2398412525653839},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1038956344127655},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icce.2013.6487056","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icce.2013.6487056","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Conference on Consumer Electronics (ICCE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8799999952316284,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2147504831","https://openalex.org/W2165068957","https://openalex.org/W2917663763","https://openalex.org/W4248578633","https://openalex.org/W6684515133","https://openalex.org/W6759913822"],"related_works":["https://openalex.org/W2995711473","https://openalex.org/W2103998189","https://openalex.org/W2371108673","https://openalex.org/W262343266","https://openalex.org/W3094485821","https://openalex.org/W2382858638","https://openalex.org/W2358111372","https://openalex.org/W2348696719","https://openalex.org/W4366606145","https://openalex.org/W2042631286"],"abstract_inverted_index":{"Flash-based":[0],"solid-state":[1],"drives":[2,32],"(SSD)":[3],"are":[4,15],"widely":[5],"accepted":[6],"from":[7],"mobile":[8],"devices":[9],"to":[10,36,43,47,98],"enterprise":[11],"storage":[12],"arrays.":[13],"They":[14],"best":[16],"known":[17],"for":[18],"delivering":[19],"low":[20],"power":[21],"consumption":[22],"and":[23,39,72],"high":[24],"random":[25],"I/O":[26],"performance":[27,38],"that":[28,60,85],"far":[29],"exceeds":[30],"hard-disk":[31],"(HDD).":[33],"One":[34],"configuration":[35],"enhance":[37],"reliability":[40],"further":[41],"is":[42,61],"connect":[44],"multiple":[45],"SSDs":[46],"a":[48],"RAID":[49,65],"controller.":[50],"In":[51],"this":[52],"paper,":[53],"we":[54],"propose":[55],"an":[56],"intelligent,":[57],"hybrid":[58],"SSD":[59,91],"optimized":[62],"in":[63,76],"distributed-parity":[64],"schemes":[66],"by":[67,93],"recognizing":[68],"data-parity":[69],"block":[70],"sequence":[71],"placing":[73],"parity":[74],"blocks":[75],"higher":[77],"endurance":[78],"memory":[79],"cells.":[80],"The":[81],"experimental":[82],"results":[83],"show":[84],"our":[86],"predictive":[87],"data":[88,102],"placement":[89],"extends":[90],"lifetime":[92],"31%":[94],"on":[95],"average,":[96],"compared":[97],"the":[99],"history-based":[100],"hot":[101],"placement.":[103]},"counts_by_year":[{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}