{"id":"https://openalex.org/W3216392884","doi":"https://doi.org/10.1109/icce-tw52618.2021.9602957","title":"ESD-Immunity Impact of HV pLDMOS with Drain-side Embedded Horizontal P-type Schottky Modulations","display_name":"ESD-Immunity Impact of HV pLDMOS with Drain-side Embedded Horizontal P-type Schottky Modulations","publication_year":2021,"publication_date":"2021-09-15","ids":{"openalex":"https://openalex.org/W3216392884","doi":"https://doi.org/10.1109/icce-tw52618.2021.9602957","mag":"3216392884"},"language":"en","primary_location":{"id":"doi:10.1109/icce-tw52618.2021.9602957","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icce-tw52618.2021.9602957","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Conference on Consumer Electronics-Taiwan (ICCE-TW)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027608154","display_name":"Shi-Zhe Hong","orcid":"https://orcid.org/0000-0003-3655-0592"},"institutions":[{"id":"https://openalex.org/I125934054","display_name":"National United University","ror":"https://ror.org/04twccc71","country_code":"TW","type":"education","lineage":["https://openalex.org/I125934054"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Shi-Zhe Hong","raw_affiliation_strings":["National United University, Taiwan"],"affiliations":[{"raw_affiliation_string":"National United University, Taiwan","institution_ids":["https://openalex.org/I125934054"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033483329","display_name":"Shen-Li Chen","orcid":"https://orcid.org/0000-0001-7860-3889"},"institutions":[{"id":"https://openalex.org/I125934054","display_name":"National United University","ror":"https://ror.org/04twccc71","country_code":"TW","type":"education","lineage":["https://openalex.org/I125934054"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shen-Li Chen","raw_affiliation_strings":["National United University, Taiwan"],"affiliations":[{"raw_affiliation_string":"National United University, Taiwan","institution_ids":["https://openalex.org/I125934054"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012209514","display_name":"Tien-Yu Lan","orcid":"https://orcid.org/0000-0003-3534-683X"},"institutions":[{"id":"https://openalex.org/I125934054","display_name":"National United University","ror":"https://ror.org/04twccc71","country_code":"TW","type":"education","lineage":["https://openalex.org/I125934054"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tien-Yu Lan","raw_affiliation_strings":["National United University, Taiwan"],"affiliations":[{"raw_affiliation_string":"National United University, Taiwan","institution_ids":["https://openalex.org/I125934054"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101801344","display_name":"Yujie Zhou","orcid":"https://orcid.org/0009-0000-9231-9534"},"institutions":[{"id":"https://openalex.org/I125934054","display_name":"National United University","ror":"https://ror.org/04twccc71","country_code":"TW","type":"education","lineage":["https://openalex.org/I125934054"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yu-Jie Zhou","raw_affiliation_strings":["National United University, Taiwan"],"affiliations":[{"raw_affiliation_string":"National United University, Taiwan","institution_ids":["https://openalex.org/I125934054"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100321245","display_name":"Zhiwei Liu","orcid":"https://orcid.org/0000-0003-0805-5930"},"institutions":[{"id":"https://openalex.org/I125934054","display_name":"National United University","ror":"https://ror.org/04twccc71","country_code":"TW","type":"education","lineage":["https://openalex.org/I125934054"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Zhi-Wei Liu","raw_affiliation_strings":["National United University, Taiwan"],"affiliations":[{"raw_affiliation_string":"National United University, Taiwan","institution_ids":["https://openalex.org/I125934054"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001618057","display_name":"Jhong- Yi Lai","orcid":null},"institutions":[{"id":"https://openalex.org/I125934054","display_name":"National United University","ror":"https://ror.org/04twccc71","country_code":"TW","type":"education","lineage":["https://openalex.org/I125934054"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jhong- Yi Lai","raw_affiliation_strings":["National United University, Taiwan"],"affiliations":[{"raw_affiliation_string":"National United University, Taiwan","institution_ids":["https://openalex.org/I125934054"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5027608154"],"corresponding_institution_ids":["https://openalex.org/I125934054"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.14629422,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/schottky-diode","display_name":"Schottky diode","score":0.8786114454269409},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.5762171149253845},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.46951931715011597},{"id":"https://openalex.org/keywords/breakdown-voltage","display_name":"Breakdown voltage","score":0.44521811604499817},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4139620065689087},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3864748775959015},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.37826552987098694},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3216208219528198},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.156410813331604}],"concepts":[{"id":"https://openalex.org/C205200001","wikidata":"https://www.wikidata.org/wiki/Q176066","display_name":"Schottky diode","level":3,"score":0.8786114454269409},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.5762171149253845},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.46951931715011597},{"id":"https://openalex.org/C119321828","wikidata":"https://www.wikidata.org/wiki/Q1267190","display_name":"Breakdown voltage","level":3,"score":0.44521811604499817},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4139620065689087},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3864748775959015},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.37826552987098694},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3216208219528198},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.156410813331604}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icce-tw52618.2021.9602957","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icce-tw52618.2021.9602957","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Conference on Consumer Electronics-Taiwan (ICCE-TW)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.41999998688697815}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2985266575"],"related_works":["https://openalex.org/W2086756978","https://openalex.org/W2124223348","https://openalex.org/W2154798357","https://openalex.org/W2110336605","https://openalex.org/W2096673206","https://openalex.org/W2070314502","https://openalex.org/W2154898697","https://openalex.org/W4297099598","https://openalex.org/W4380551618","https://openalex.org/W1988679721"],"abstract_inverted_index":{"The":[0],"ESD-ability":[1],"effect":[2],"of":[3,31,88,97,125,130,147],"parasitic":[4,70],"p-type":[5],"Schottky":[6,71,81,128],"diodes":[7],"on":[8],"the":[9,19,29,86,89,95,98,102,121,126,131,134,138,145],"high-voltage":[10],"pLDMOS":[11],"is":[12,116,151],"evaluated":[13],"in":[14,83],"this":[15,69,93],"paper.":[16],"By":[17],"using":[18],"TLP":[20],"testing":[21],"machine,":[22],"it":[23,64],"can":[24,65,74],"be":[25,66,75,112],"used":[26],"to":[27,111,149],"analyze":[28],"component":[30,38,99],"snapback":[32],"I-V":[33],"measurement":[34],"values":[35],"such":[36],"as":[37,77,120],"trigger":[39,103],"voltage":[40,47,104],"(V":[41,48,105],"<inf":[42,49,58,106],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[43,50,59,107],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">t1</inf>":[44,108],"),":[45,52],"holding":[46],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">h</inf>":[51],"and":[53,101],"secondary":[54],"breakdown":[55],"current":[56,135],"(I":[57],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">t2</inf>":[60],")":[61,109],"data.":[62],"Finally,":[63],"found":[67,118],"that":[68,119],"device":[72],"structure":[73],"regarded":[76],"adding":[78],"a":[79],"reverse":[80,127],"diode":[82,129],"series":[84],"at":[85,137],"drain-end":[87,132],"reference":[90],"device.":[91],"In":[92],"way,":[94],"on-resistance":[96],"increases,":[100,133],"tends":[110],"increased":[113],"too.":[114],"It":[115],"also":[117,152],"area":[122],"ratio":[123],"(>85%)":[124],"density":[136],"drain":[139],"terminal":[140],"becomes":[141],"more":[142],"dispersed.":[143],"Then,":[144],"immunity":[146],"components":[148],"ESD":[150],"significantly":[153],"improved.":[154]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}