{"id":"https://openalex.org/W4402593836","doi":"https://doi.org/10.1109/icce-taiwan62264.2024.10674485","title":"Study of Silicide Blocking for GGNMOS Performance and Turn-On Time in CMOS Process","display_name":"Study of Silicide Blocking for GGNMOS Performance and Turn-On Time in CMOS Process","publication_year":2024,"publication_date":"2024-07-09","ids":{"openalex":"https://openalex.org/W4402593836","doi":"https://doi.org/10.1109/icce-taiwan62264.2024.10674485"},"language":"en","primary_location":{"id":"doi:10.1109/icce-taiwan62264.2024.10674485","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icce-taiwan62264.2024.10674485","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113387217","display_name":"Er-Wen Chien","orcid":null},"institutions":[{"id":"https://openalex.org/I134161618","display_name":"National Taiwan Normal University","ror":"https://ror.org/059dkdx38","country_code":"TW","type":"education","lineage":["https://openalex.org/I134161618"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Er-Wen Chien","raw_affiliation_strings":["National Taiwan Normal University,Department of Electrical Engineering"],"affiliations":[{"raw_affiliation_string":"National Taiwan Normal University,Department of Electrical Engineering","institution_ids":["https://openalex.org/I134161618"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113387218","display_name":"Hao-En Cheng","orcid":null},"institutions":[{"id":"https://openalex.org/I134161618","display_name":"National Taiwan Normal University","ror":"https://ror.org/059dkdx38","country_code":"TW","type":"education","lineage":["https://openalex.org/I134161618"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Hao-En Cheng","raw_affiliation_strings":["National Taiwan Normal University,Department of Electrical Engineering"],"affiliations":[{"raw_affiliation_string":"National Taiwan Normal University,Department of Electrical Engineering","institution_ids":["https://openalex.org/I134161618"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002476065","display_name":"Chun\u2010Yu Lin","orcid":"https://orcid.org/0000-0003-3375-520X"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chun-Yu Lin","raw_affiliation_strings":["National Yang Ming Chiao Tung University,Institute of Electronics"],"affiliations":[{"raw_affiliation_string":"National Yang Ming Chiao Tung University,Institute of Electronics","institution_ids":["https://openalex.org/I148366613"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5113387217"],"corresponding_institution_ids":["https://openalex.org/I134161618"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.12892459,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"787","last_page":"788"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/blocking","display_name":"Blocking (statistics)","score":0.7865538001060486},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5832093954086304},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5706881284713745},{"id":"https://openalex.org/keywords/silicide","display_name":"Silicide","score":0.4985313415527344},{"id":"https://openalex.org/keywords/turn","display_name":"Turn (biochemistry)","score":0.4617116451263428},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41222071647644043},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.28956061601638794},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2269950807094574},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.21175283193588257},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1700560748577118},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.13287782669067383},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.09880715608596802},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07543346285820007},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.07309353351593018}],"concepts":[{"id":"https://openalex.org/C144745244","wikidata":"https://www.wikidata.org/wiki/Q4927286","display_name":"Blocking (statistics)","level":2,"score":0.7865538001060486},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5832093954086304},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5706881284713745},{"id":"https://openalex.org/C2780901251","wikidata":"https://www.wikidata.org/wiki/Q426473","display_name":"Silicide","level":3,"score":0.4985313415527344},{"id":"https://openalex.org/C85641259","wikidata":"https://www.wikidata.org/wiki/Q290042","display_name":"Turn (biochemistry)","level":2,"score":0.4617116451263428},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41222071647644043},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.28956061601638794},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2269950807094574},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.21175283193588257},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1700560748577118},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.13287782669067383},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.09880715608596802},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07543346285820007},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.07309353351593018},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icce-taiwan62264.2024.10674485","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/icce-taiwan62264.2024.10674485","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","score":0.4399999976158142,"id":"https://metadata.un.org/sdg/13"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1581042664","https://openalex.org/W1985232861","https://openalex.org/W2119637532","https://openalex.org/W3097634049","https://openalex.org/W4386323736","https://openalex.org/W6632104815"],"related_works":["https://openalex.org/W4231070408","https://openalex.org/W943151747","https://openalex.org/W2392835431","https://openalex.org/W2048981943","https://openalex.org/W2753901553","https://openalex.org/W2804368879","https://openalex.org/W4245567755","https://openalex.org/W2325174796","https://openalex.org/W2798522476","https://openalex.org/W4253040403"],"abstract_inverted_index":{"In":[0],"order":[1],"to":[2,15,70],"minimize":[3],"the":[4,33,41,47,62],"occurrence":[5],"of":[6,35],"ESD":[7,23,37,44,68],"damage":[8],"in":[9],"integrated":[10],"circuits,":[11,46],"it":[12],"is":[13,32],"crucial":[14],"design":[16],"protective":[17],"circuits":[18],"that":[19,27],"can":[20],"effectively":[21],"prevent":[22],"destruction.":[24],"One":[25],"approach":[26],"has":[28,51],"been":[29],"widely":[30],"adopted":[31],"utilization":[34],"NMOS-based":[36,43],"protection":[38,45,69],"circuits.":[39],"Among":[40],"various":[42],"gate-grounded":[48],"NMOS":[49],"(GGNMOS)":[50],"emerged":[52],"as":[53,64],"a":[54,65],"prominent":[55],"choice.":[56],"This":[57],"study":[58],"focuses":[59],"on":[60],"utilizing":[61],"GGNMOS":[63],"benchmark":[66],"for":[67],"enhance":[71],"its":[72],"performance.":[73]},"counts_by_year":[],"updated_date":"2025-12-27T23:08:20.325037","created_date":"2025-10-10T00:00:00"}