{"id":"https://openalex.org/W4402593272","doi":"https://doi.org/10.1109/icce-taiwan62264.2024.10674456","title":"A Bidirectional ESD Protection Circuit With High Reliability and Low Leakage for Consumer Electronic Products","display_name":"A Bidirectional ESD Protection Circuit With High Reliability and Low Leakage for Consumer Electronic Products","publication_year":2024,"publication_date":"2024-07-09","ids":{"openalex":"https://openalex.org/W4402593272","doi":"https://doi.org/10.1109/icce-taiwan62264.2024.10674456"},"language":"en","primary_location":{"id":"doi:10.1109/icce-taiwan62264.2024.10674456","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icce-taiwan62264.2024.10674456","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057332910","display_name":"Chun-Cheng Chen","orcid":"https://orcid.org/0000-0003-1045-1713"},"institutions":[{"id":"https://openalex.org/I134161618","display_name":"National Taiwan Normal University","ror":"https://ror.org/059dkdx38","country_code":"TW","type":"education","lineage":["https://openalex.org/I134161618"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chun-Cheng Chen","raw_affiliation_strings":["National Taiwan Normal University,Department of Electrical Engineering"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Taiwan Normal University,Department of Electrical Engineering","institution_ids":["https://openalex.org/I134161618"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002476065","display_name":"Chun\u2010Yu Lin","orcid":"https://orcid.org/0000-0003-3375-520X"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chun-Yu Lin","raw_affiliation_strings":["National Yang Ming Chiao Tung University,Institute of Electronics"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Yang Ming Chiao Tung University,Institute of Electronics","institution_ids":["https://openalex.org/I148366613"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1856,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.50104776,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"793","last_page":"794"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9883000254631042,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9765999913215637,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.7082533836364746},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6139965057373047},{"id":"https://openalex.org/keywords/electrostatic-discharge","display_name":"Electrostatic discharge","score":0.6112480163574219},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4630681574344635},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4095616340637207},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3829280734062195},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23684877157211304},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08862316608428955},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.05904102325439453}],"concepts":[{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.7082533836364746},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6139965057373047},{"id":"https://openalex.org/C205483674","wikidata":"https://www.wikidata.org/wiki/Q3574961","display_name":"Electrostatic discharge","level":3,"score":0.6112480163574219},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4630681574344635},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4095616340637207},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3829280734062195},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23684877157211304},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08862316608428955},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.05904102325439453},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icce-taiwan62264.2024.10674456","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icce-taiwan62264.2024.10674456","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W563528871","https://openalex.org/W2051578509","https://openalex.org/W2793606838","https://openalex.org/W2945110610","https://openalex.org/W3006622540","https://openalex.org/W3215682343"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"With":[0],"the":[1,18,103,105,116],"proliferation":[2],"of":[3,20],"consumer":[4],"electronics,":[5],"products":[6],"are":[7],"becoming":[8],"slimmer":[9],"and":[10,71,111],"more":[11,28],"compact,":[12],"leading":[13],"to":[14,30,98],"a":[15,82,86,91],"reduction":[16],"in":[17,102],"size":[19],"integrated":[21],"circuits":[22,51,63,100],"(ICs).":[23],"This":[24],"downsizing":[25],"makes":[26],"ICs":[27],"susceptible":[29],"electrostatic":[31],"discharge":[32],"(ESD)":[33],"issues,":[34,78],"which":[35],"can":[36],"cause":[37],"significant":[38],"circuit":[39],"damage.":[40],"Therefore,":[41],"designing":[42],"bidirectional":[43,60],"ESD":[44,61],"protection":[45,62,95],"components":[46],"is":[47],"crucial,":[48],"especially":[49],"for":[50,115],"with":[52],"I/O":[53],"(input":[54],"or":[55],"output)":[56],"pins.":[57],"However,":[58],"traditional":[59,99],"face":[64],"challenges":[65],"such":[66],"as":[67],"excessive":[68],"space":[69],"occupation":[70],"high":[72],"leakage":[73,113],"current.":[74],"To":[75],"address":[76],"these":[77],"this":[79],"study":[80],"presents":[81],"novel":[83],"design":[84,107],"using":[85],"0.18\u03bcm":[87],"CMOS":[88],"process,":[89],"featuring":[90],"bidirectional,":[92],"PMOS-triggered":[93],"PNP":[94,119],"circuit.":[96],"Compared":[97],"mentioned":[101],"literature,":[104],"new":[106],"demonstrates":[108],"higher":[109],"reliability":[110],"lower":[112],"current":[114],"same":[117],"ESD-discharging":[118],"width.":[120]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}