{"id":"https://openalex.org/W4294069478","doi":"https://doi.org/10.1109/icce-taiwan55306.2022.9869035","title":"Optimizing 20V LDNMOS Transistors for PMIC Applications by Simulation Tools","display_name":"Optimizing 20V LDNMOS Transistors for PMIC Applications by Simulation Tools","publication_year":2022,"publication_date":"2022-07-06","ids":{"openalex":"https://openalex.org/W4294069478","doi":"https://doi.org/10.1109/icce-taiwan55306.2022.9869035"},"language":"en","primary_location":{"id":"doi:10.1109/icce-taiwan55306.2022.9869035","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icce-taiwan55306.2022.9869035","pdf_url":null,"source":{"id":"https://openalex.org/S4363607852","display_name":"2022 IEEE International Conference on Consumer Electronics - Taiwan","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Conference on Consumer Electronics - Taiwan","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001446342","display_name":"Sue-Yi Chen","orcid":"https://orcid.org/0000-0001-6787-5213"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]},{"id":"https://openalex.org/I4210151006","display_name":"Vanguard International Semiconductor (Taiwan)","ror":"https://ror.org/04jmkm342","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210151006"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Sue-Yi Chen","raw_affiliation_strings":["Vanguard International Semiconductor Corporation,Hsinchu,Taiwan","National Tsing-Hua University, Hsinchu, Taiwan","Vanguard International Semiconductor Corporation, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Vanguard International Semiconductor Corporation,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I4210151006"]},{"raw_affiliation_string":"National Tsing-Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]},{"raw_affiliation_string":"Vanguard International Semiconductor Corporation, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210151006"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101647179","display_name":"Yin-Wei Peng","orcid":"https://orcid.org/0000-0002-7743-4873"},"institutions":[{"id":"https://openalex.org/I4210151006","display_name":"Vanguard International Semiconductor (Taiwan)","ror":"https://ror.org/04jmkm342","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210151006"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yin-Wei Peng","raw_affiliation_strings":["Vanguard International Semiconductor Corporation,Hsinchu,Taiwan","Vanguard International Semiconductor Corporation, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Vanguard International Semiconductor Corporation,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I4210151006"]},{"raw_affiliation_string":"Vanguard International Semiconductor Corporation, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210151006"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059958638","display_name":"Jia-Ching Dong","orcid":null},"institutions":[{"id":"https://openalex.org/I4210151006","display_name":"Vanguard International Semiconductor (Taiwan)","ror":"https://ror.org/04jmkm342","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210151006"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jia-Ching Dong","raw_affiliation_strings":["Vanguard International Semiconductor Corporation,Hsinchu,Taiwan","Vanguard International Semiconductor Corporation, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Vanguard International Semiconductor Corporation,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I4210151006"]},{"raw_affiliation_string":"Vanguard International Semiconductor Corporation, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210151006"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084321291","display_name":"Kai\u2013Chieh Hsu","orcid":"https://orcid.org/0000-0002-3261-7510"},"institutions":[{"id":"https://openalex.org/I4210151006","display_name":"Vanguard International Semiconductor (Taiwan)","ror":"https://ror.org/04jmkm342","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210151006"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Kai-Chieh Hsu","raw_affiliation_strings":["Vanguard International Semiconductor Corporation,Hsinchu,Taiwan","Vanguard International Semiconductor Corporation, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Vanguard International Semiconductor Corporation,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I4210151006"]},{"raw_affiliation_string":"Vanguard International Semiconductor Corporation, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210151006"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031458560","display_name":"Shao-Chang Huang","orcid":"https://orcid.org/0000-0002-3637-3867"},"institutions":[{"id":"https://openalex.org/I4210151006","display_name":"Vanguard International Semiconductor (Taiwan)","ror":"https://ror.org/04jmkm342","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210151006"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shao-Chang Huang","raw_affiliation_strings":["Vanguard International Semiconductor Corporation,Hsinchu,Taiwan","Vanguard International Semiconductor Corporation, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Vanguard International Semiconductor Corporation,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I4210151006"]},{"raw_affiliation_string":"Vanguard International Semiconductor Corporation, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210151006"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111650558","display_name":"Jon-Yiew Gan","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jon-Yiew Gan","raw_affiliation_strings":["National Tsing-Hua University,Hsinchu,Taiwan","National Tsing-Hua University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Tsing-Hua University,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I25846049"]},{"raw_affiliation_string":"National Tsing-Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.10939183,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"361","last_page":"362"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.7253707647323608},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6965460181236267},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5813353657722473},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.46529993414878845},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.42814701795578003},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.37086427211761475},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.27847057580947876},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2544693946838379}],"concepts":[{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.7253707647323608},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6965460181236267},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5813353657722473},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.46529993414878845},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.42814701795578003},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.37086427211761475},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.27847057580947876},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2544693946838379},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icce-taiwan55306.2022.9869035","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icce-taiwan55306.2022.9869035","pdf_url":null,"source":{"id":"https://openalex.org/S4363607852","display_name":"2022 IEEE International Conference on Consumer Electronics - Taiwan","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Conference on Consumer Electronics - Taiwan","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7699999809265137,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1998465818","https://openalex.org/W2092167580","https://openalex.org/W2096094453","https://openalex.org/W2127348088","https://openalex.org/W2625709881"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"For":[0],"PMIC":[1],"applications":[2],"and":[3,12,29],"especially":[4],"in":[5,14,48],"the":[6,49,69],"automotive":[7],"filed,":[8],"many":[9],"rigorous":[10],"testing":[11],"checking":[13],"reliability":[15],"concerns":[16],"are":[17],"required":[18],"such":[19],"as":[20],"a":[21,33,57],"long":[22],"lifetime,":[23],"wide":[24],"operating":[25],"voltages,":[26],"temperature":[27],"ranges":[28],"so":[30],"on.":[31],"Accordingly,":[32],"detailed":[34],"understanding":[35],"for":[36,64],"HCI":[37],"effect":[38],"of":[39,51],"LDNMOS":[40,59],"transistor":[41,60],"has":[42],"been":[43],"becoming":[44],"an":[45],"important":[46],"part":[47],"optimization":[50],"device":[52,61],"design.":[53],"In":[54],"this":[55],"study,":[56],"20V":[58],"is":[62],"chosen":[63],"illustrating":[65],"how":[66],"to":[67],"predict":[68],"optimum":[70],"design":[71],"parameter":[72],"based":[73],"on":[74],"TCAD":[75],"simulation":[76],"tool.":[77]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}