{"id":"https://openalex.org/W2054791832","doi":"https://doi.org/10.1109/iccd.2013.6657079","title":"Semi-analytical current source modeling of near-threshold operating logic cells considering process variations","display_name":"Semi-analytical current source modeling of near-threshold operating logic cells considering process variations","publication_year":2013,"publication_date":"2013-10-01","ids":{"openalex":"https://openalex.org/W2054791832","doi":"https://doi.org/10.1109/iccd.2013.6657079","mag":"2054791832"},"language":"en","primary_location":{"id":"doi:10.1109/iccd.2013.6657079","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccd.2013.6657079","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 31st International Conference on Computer Design (ICCD)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101706272","display_name":"Qing Xie","orcid":"https://orcid.org/0000-0003-2520-1768"},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Qing Xie","raw_affiliation_strings":["Department of Electrical Engineering, University of Southern California, Los Angeles, California, United States","University of Southern California, Department of Electrical Engineering, Los Angeles, United States, 90089"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Southern California, Los Angeles, California, United States","institution_ids":["https://openalex.org/I1174212"]},{"raw_affiliation_string":"University of Southern California, Department of Electrical Engineering, Los Angeles, United States, 90089","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069335234","display_name":"Tiansong Cui","orcid":"https://orcid.org/0000-0002-4195-8181"},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tiansong Cui","raw_affiliation_strings":["Department of Electrical Engineering, University of Southern California, Los Angeles, California, United States","University of Southern California, Department of Electrical Engineering, Los Angeles, United States, 90089"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Southern California, Los Angeles, California, United States","institution_ids":["https://openalex.org/I1174212"]},{"raw_affiliation_string":"University of Southern California, Department of Electrical Engineering, Los Angeles, United States, 90089","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100651386","display_name":"Yanzhi Wang","orcid":"https://orcid.org/0000-0002-8324-7425"},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yanzhi Wang","raw_affiliation_strings":["Department of Electrical Engineering, University of Southern California, Los Angeles, California, United States","University of Southern California, Department of Electrical Engineering, Los Angeles, United States, 90089"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Southern California, Los Angeles, California, United States","institution_ids":["https://openalex.org/I1174212"]},{"raw_affiliation_string":"University of Southern California, Department of Electrical Engineering, Los Angeles, United States, 90089","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065681916","display_name":"Shahin Nazarian","orcid":null},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shahin Nazarian","raw_affiliation_strings":["Department of Electrical Engineering, University of Southern California, Los Angeles, California, United States","University of Southern California, Department of Electrical Engineering, Los Angeles, United States, 90089"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Southern California, Los Angeles, California, United States","institution_ids":["https://openalex.org/I1174212"]},{"raw_affiliation_string":"University of Southern California, Department of Electrical Engineering, Los Angeles, United States, 90089","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044650311","display_name":"Massoud Pedram","orcid":"https://orcid.org/0000-0002-2677-7307"},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Massoud Pedram","raw_affiliation_strings":["Department of Electrical Engineering, University of Southern California, Los Angeles, California, United States","University of Southern California, Department of Electrical Engineering, Los Angeles, United States, 90089"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Southern California, Los Angeles, California, United States","institution_ids":["https://openalex.org/I1174212"]},{"raw_affiliation_string":"University of Southern California, Department of Electrical Engineering, Los Angeles, United States, 90089","institution_ids":["https://openalex.org/I1174212"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5101706272"],"corresponding_institution_ids":["https://openalex.org/I1174212"],"apc_list":null,"apc_paid":null,"fwci":0.7197,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.75262374,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"447","last_page":"450"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.7883850336074829},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6803831458091736},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6226876378059387},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5828715562820435},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.5493518710136414},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5229988098144531},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4978952407836914},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4788617789745331},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.46793243288993835},{"id":"https://openalex.org/keywords/lookup-table","display_name":"Lookup table","score":0.4672427475452423},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4376756250858307},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.41645893454551697},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2498454451560974},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1919802725315094},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.14710268378257751},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10202538967132568}],"concepts":[{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.7883850336074829},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6803831458091736},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6226876378059387},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5828715562820435},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.5493518710136414},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5229988098144531},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4978952407836914},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4788617789745331},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.46793243288993835},{"id":"https://openalex.org/C134835016","wikidata":"https://www.wikidata.org/wiki/Q690265","display_name":"Lookup table","level":2,"score":0.4672427475452423},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4376756250858307},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.41645893454551697},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2498454451560974},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1919802725315094},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.14710268378257751},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10202538967132568},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iccd.2013.6657079","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccd.2013.6657079","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 31st International Conference on Computer Design (ICCD)","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.408.1070","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.408.1070","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://atrak.usc.edu/~massoud/Papers/VarAware-NearThresh-CSM-iccd13.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8999999761581421,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1547254974","https://openalex.org/W1966741973","https://openalex.org/W1998525920","https://openalex.org/W2024702153","https://openalex.org/W2112918184","https://openalex.org/W2133268384","https://openalex.org/W2133970570","https://openalex.org/W2134909205","https://openalex.org/W2139164425","https://openalex.org/W2145146339","https://openalex.org/W2154680820","https://openalex.org/W2163262735","https://openalex.org/W2168159483","https://openalex.org/W3143694037","https://openalex.org/W6676633326"],"related_works":["https://openalex.org/W2990962948","https://openalex.org/W4283025278","https://openalex.org/W2084169748","https://openalex.org/W2082432309","https://openalex.org/W817174743","https://openalex.org/W4254559750","https://openalex.org/W2998315020","https://openalex.org/W2127529229","https://openalex.org/W3016208414","https://openalex.org/W1822998120"],"abstract_inverted_index":{"Operating":[0],"circuits":[1,51,96],"in":[2,8,32,57,98],"the":[3,17,38,61],"ultra-low":[4],"voltage":[5,63],"regime":[6,100],"results":[7],"significantly":[9],"lower":[10],"power":[11],"consumption":[12],"but":[13],"can":[14],"also":[15],"degrade":[16],"circuit":[18],"performance.":[19],"In":[20,65],"addition,":[21],"it":[22,67],"leads":[23],"to":[24,27,49,52,60,70,80,103],"higher":[25],"sensitivity":[26],"various":[28],"sources":[29],"of":[30,94],"variability":[31,105],"VLSI":[33,50,95],"circuits.":[34],"This":[35],"paper":[36],"extends":[37],"current":[39],"source":[40],"modeling":[41,83],"(CSM)":[42],"technique,":[43],"which":[44],"has":[45],"successfully":[46],"been":[47],"applied":[48],"achieve":[53,82],"very":[54],"high":[55],"accuracy":[56],"timing":[58,92],"analysis,":[59],"near-threshold":[62,99],"regime.":[64],"particular,":[66],"shows":[68],"how":[69],"combine":[71],"non-linear":[72],"analytical":[73],"models":[74],"and":[75,86,101],"low-dimensionality":[76],"CSM":[77],"lookup":[78],"tables":[79],"simultaneously":[81],"accuracy,":[84],"space":[85],"time":[87],"efficiency,":[88],"when":[89],"performing":[90],"CSM-based":[91],"analysis":[93],"operating":[97],"subject":[102],"process":[104],"effects.":[106]},"counts_by_year":[{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}