{"id":"https://openalex.org/W2013443680","doi":"https://doi.org/10.1109/iccd.2013.6657076","title":"Towards analyzing and improving robustness of software applications to intermittent and permanent faults in hardware","display_name":"Towards analyzing and improving robustness of software applications to intermittent and permanent faults in hardware","publication_year":2013,"publication_date":"2013-10-01","ids":{"openalex":"https://openalex.org/W2013443680","doi":"https://doi.org/10.1109/iccd.2013.6657076","mag":"2013443680"},"language":"en","primary_location":{"id":"doi:10.1109/iccd.2013.6657076","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccd.2013.6657076","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 31st International Conference on Computer Design (ICCD)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101818199","display_name":"Ankur Sharma","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Ankur Sharma","raw_affiliation_strings":["UCLA Electrical Engineering Dept","[Electr. Eng. Dept., UCLA, Los Angeles, CA, USA]"],"affiliations":[{"raw_affiliation_string":"UCLA Electrical Engineering Dept","institution_ids":[]},{"raw_affiliation_string":"[Electr. Eng. Dept., UCLA, Los Angeles, CA, USA]","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112214609","display_name":"Joseph Sloan","orcid":null},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Joseph Sloan","raw_affiliation_strings":["UIUC Electrical and Computer Engineering Dept","Electr. & Comput. Eng. Dept, UIUC, USA"],"affiliations":[{"raw_affiliation_string":"UIUC Electrical and Computer Engineering Dept","institution_ids":[]},{"raw_affiliation_string":"Electr. & Comput. Eng. Dept, UIUC, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091197122","display_name":"Lucas Wanner","orcid":"https://orcid.org/0000-0002-5564-698X"},"institutions":[{"id":"https://openalex.org/I161318765","display_name":"University of California, Los Angeles","ror":"https://ror.org/046rm7j60","country_code":"US","type":"education","lineage":["https://openalex.org/I161318765"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lucas F Wanner","raw_affiliation_strings":["UCLA Computer Science Dept","Comput. Sci. Dept., UCLA, Los Angeles, SC, USA"],"affiliations":[{"raw_affiliation_string":"UCLA Computer Science Dept","institution_ids":[]},{"raw_affiliation_string":"Comput. Sci. Dept., UCLA, Los Angeles, SC, USA","institution_ids":["https://openalex.org/I161318765"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042591867","display_name":"Salma H Elmalaki","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Salma H Elmalaki","raw_affiliation_strings":["UCLA Electrical Engineering Dept","[Electr. Eng. Dept., UCLA, Los Angeles, CA, USA]"],"affiliations":[{"raw_affiliation_string":"UCLA Electrical Engineering Dept","institution_ids":[]},{"raw_affiliation_string":"[Electr. Eng. Dept., UCLA, Los Angeles, CA, USA]","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074563122","display_name":"Mani Srivastava","orcid":"https://orcid.org/0000-0002-3782-9192"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Mani B Srivastava","raw_affiliation_strings":["UCLA Electrical Engineering Dept","[Electr. Eng. Dept., UCLA, Los Angeles, CA, USA]"],"affiliations":[{"raw_affiliation_string":"UCLA Electrical Engineering Dept","institution_ids":[]},{"raw_affiliation_string":"[Electr. Eng. Dept., UCLA, Los Angeles, CA, USA]","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084229134","display_name":"Puneet Gupta","orcid":"https://orcid.org/0000-0002-6188-1134"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Puneet Gupta","raw_affiliation_strings":["UCLA Electrical Engineering Dept","[Electr. Eng. Dept., UCLA, Los Angeles, CA, USA]"],"affiliations":[{"raw_affiliation_string":"UCLA Electrical Engineering Dept","institution_ids":[]},{"raw_affiliation_string":"[Electr. Eng. Dept., UCLA, Los Angeles, CA, USA]","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5101818199"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4729,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.68232304,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"435","last_page":"438"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.8525164127349854},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7194159626960754},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.6839087009429932},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.620198667049408},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.5620741248130798},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5512257814407349},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.5309777855873108},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.5274115800857544},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.48205313086509705},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.45277243852615356},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4403383731842041},{"id":"https://openalex.org/keywords/similarity","display_name":"Similarity (geometry)","score":0.4194328784942627},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3768737018108368},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3612903952598572},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.28958866000175476},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2558172643184662},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1682608723640442},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12320417165756226},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.1082058846950531}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.8525164127349854},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7194159626960754},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.6839087009429932},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.620198667049408},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.5620741248130798},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5512257814407349},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.5309777855873108},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.5274115800857544},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.48205313086509705},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.45277243852615356},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4403383731842041},{"id":"https://openalex.org/C103278499","wikidata":"https://www.wikidata.org/wiki/Q254465","display_name":"Similarity (geometry)","level":3,"score":0.4194328784942627},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3768737018108368},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3612903952598572},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.28958866000175476},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2558172643184662},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1682608723640442},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12320417165756226},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.1082058846950531},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iccd.2013.6657076","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccd.2013.6657076","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 31st International Conference on Computer Design (ICCD)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.6299999952316284}],"awards":[],"funders":[{"id":"https://openalex.org/F4320332222","display_name":"University of Illinois at Urbana-Champaign","ror":"https://ror.org/047426m28"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W147650083","https://openalex.org/W207210201","https://openalex.org/W1964782602","https://openalex.org/W2001354277","https://openalex.org/W2005519189","https://openalex.org/W2007796528","https://openalex.org/W2013280342","https://openalex.org/W2015651973","https://openalex.org/W2034593585","https://openalex.org/W2041250459","https://openalex.org/W2042456747","https://openalex.org/W2053207314","https://openalex.org/W2083004950","https://openalex.org/W2083613288","https://openalex.org/W2100418159","https://openalex.org/W2104086123","https://openalex.org/W2105372251","https://openalex.org/W2116043630","https://openalex.org/W2125169487","https://openalex.org/W2131628455","https://openalex.org/W2133201251","https://openalex.org/W2134864637","https://openalex.org/W2137982062","https://openalex.org/W2150267144","https://openalex.org/W2154925544","https://openalex.org/W2159889776","https://openalex.org/W2171085247","https://openalex.org/W3006626791","https://openalex.org/W3035757797","https://openalex.org/W3140872446","https://openalex.org/W4251853244","https://openalex.org/W4253998042","https://openalex.org/W6605987033"],"related_works":["https://openalex.org/W2971479921","https://openalex.org/W2607474334","https://openalex.org/W2138861322","https://openalex.org/W3145923041","https://openalex.org/W2946906624","https://openalex.org/W841176518","https://openalex.org/W1978919910","https://openalex.org/W188714996","https://openalex.org/W2168671684","https://openalex.org/W2157727563"],"abstract_inverted_index":{"Although":[0],"a":[1,38,56,60],"significant":[2],"fraction":[3],"of":[4,50,81],"emerging":[5],"failure":[6,52],"and":[7,59,69,76,98],"wearout":[8],"mechanisms":[9],"result":[10],"in":[11,16,121],"intermittent":[12],"or":[13],"permanent":[14],"faults":[15,114],"hardware,":[17],"their":[18],"impact":[19],"(as":[20],"distinct":[21],"from":[22,46],"transient":[23],"faults)":[24],"on":[25,84,127],"software":[26,67],"applications":[27,68],"has":[28],"not":[29],"been":[30],"well":[31],"studied.":[32],"In":[33],"this":[34],"paper,":[35],"we":[36,88],"develop":[37],"distinguishing":[39],"application":[40,82],"characteristic,":[41],"referred":[42],"to":[43,95],"as":[44,116,118],"similarity":[45,63,75,86,97],"fundamental":[47],"circuit-level":[48],"understanding":[49],"the":[51,72,85,100,122],"mechanisms.":[53],"We":[54],"present":[55,89],"mathematical":[57],"definition":[58],"procedure":[61],"for":[62,65],"computation":[64],"practical":[66],"experimentally":[70],"verify":[71],"relationship":[73],"between":[74],"fault":[77,102,125],"rate.":[78],"Leveraging":[79],"dependence":[80],"robustness":[83],"metric,":[87],"example":[90],"architecture":[91],"independent":[92],"code":[93],"transformations":[94],"reduce":[96],"thereby":[99],"worst-case":[101],"rate":[103,126],"with":[104,111,130],"minimal":[105],"performance":[106],"degradation.":[107],"Our":[108],"experimental":[109],"results":[110],"arithmetic":[112],"unit":[113],"show":[115],"much":[117],"74%":[119],"improvement":[120],"worst":[123],"case":[124],"benchmark":[128],"kernels,":[129],"less":[131],"than":[132],"10%":[133],"runtime":[134],"penalty.":[135]},"counts_by_year":[{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}