{"id":"https://openalex.org/W2043367571","doi":"https://doi.org/10.1109/iccd.2013.6657017","title":"Functional F&lt;inf&gt;max&lt;/inf&gt; test-time reduction using novel DFTs for circuit initialization","display_name":"Functional F&lt;inf&gt;max&lt;/inf&gt; test-time reduction using novel DFTs for circuit initialization","publication_year":2013,"publication_date":"2013-10-01","ids":{"openalex":"https://openalex.org/W2043367571","doi":"https://doi.org/10.1109/iccd.2013.6657017","mag":"2043367571"},"language":"en","primary_location":{"id":"doi:10.1109/iccd.2013.6657017","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccd.2013.6657017","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 31st International Conference on Computer Design (ICCD)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079601863","display_name":"Ujjwal Guin","orcid":"https://orcid.org/0000-0002-4819-8728"},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Ujjwal Guin","raw_affiliation_strings":["ECE Dept., University of Connecticut","ECE Department University of Connecticut Storrs, CT, USA"],"affiliations":[{"raw_affiliation_string":"ECE Dept., University of Connecticut","institution_ids":["https://openalex.org/I140172145"]},{"raw_affiliation_string":"ECE Department University of Connecticut Storrs, CT, USA","institution_ids":["https://openalex.org/I140172145"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085944984","display_name":"T.J. Chakraborty","orcid":"https://orcid.org/0000-0001-9383-9603"},"institutions":[{"id":"https://openalex.org/I19268510","display_name":"Qualcomm (United Kingdom)","ror":"https://ror.org/04d3djg48","country_code":"GB","type":"company","lineage":["https://openalex.org/I19268510","https://openalex.org/I4210087596"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Tapan Chakraborty","raw_affiliation_strings":["Qualcomm","[Qualcomm, San Diego, CA, USA]"],"affiliations":[{"raw_affiliation_string":"Qualcomm","institution_ids":["https://openalex.org/I19268510"]},{"raw_affiliation_string":"[Qualcomm, San Diego, CA, USA]","institution_ids":["https://openalex.org/I19268510"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113697198","display_name":"Mohammad Tehranipoor","orcid":null},"institutions":[{"id":"https://openalex.org/I140172145","display_name":"University of Connecticut","ror":"https://ror.org/02der9h97","country_code":"US","type":"education","lineage":["https://openalex.org/I140172145"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mohammad Tehranipoor","raw_affiliation_strings":["ECE Dept., University of Connecticut","ECE Department University of Connecticut Storrs, CT, USA"],"affiliations":[{"raw_affiliation_string":"ECE Dept., University of Connecticut","institution_ids":["https://openalex.org/I140172145"]},{"raw_affiliation_string":"ECE Department University of Connecticut Storrs, CT, USA","institution_ids":["https://openalex.org/I140172145"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5079601863"],"corresponding_institution_ids":["https://openalex.org/I140172145"],"apc_list":null,"apc_paid":null,"fwci":0.9456,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.75957504,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"1 3","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/initialization","display_name":"Initialization","score":0.9076573848724365},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6829903721809387},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.6689165830612183},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5709937214851379},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.5595661997795105},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.5553862452507019},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.47806814312934875},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.37094390392303467},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.35078921914100647},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3250992000102997},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2249234914779663},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.19906309247016907},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15419608354568481},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.06342342495918274}],"concepts":[{"id":"https://openalex.org/C114466953","wikidata":"https://www.wikidata.org/wiki/Q6034165","display_name":"Initialization","level":2,"score":0.9076573848724365},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6829903721809387},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.6689165830612183},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5709937214851379},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.5595661997795105},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.5553862452507019},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.47806814312934875},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.37094390392303467},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.35078921914100647},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3250992000102997},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2249234914779663},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.19906309247016907},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15419608354568481},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.06342342495918274},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iccd.2013.6657017","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccd.2013.6657017","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE 31st International Conference on Computer Design (ICCD)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4399999976158142,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W117147670","https://openalex.org/W1582825744","https://openalex.org/W2011363932","https://openalex.org/W2036018446","https://openalex.org/W2072546947","https://openalex.org/W2101900253","https://openalex.org/W2110267158","https://openalex.org/W2123172689","https://openalex.org/W2127737927","https://openalex.org/W2143165581","https://openalex.org/W2167253897","https://openalex.org/W2171474236","https://openalex.org/W4210799017","https://openalex.org/W4236395861","https://openalex.org/W6604745190","https://openalex.org/W6659468188"],"related_works":["https://openalex.org/W4386821099","https://openalex.org/W2157191248","https://openalex.org/W2107525390","https://openalex.org/W2150046587","https://openalex.org/W2164493372","https://openalex.org/W2114980936","https://openalex.org/W4249526199","https://openalex.org/W1594445436","https://openalex.org/W2128920253","https://openalex.org/W2373135325"],"abstract_inverted_index":{"Using":[0],"functional":[1,29,60],"test":[2,25,34,106,112],"for":[3,92],"F":[4,30],"<sub":[5,31],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[6,32],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">max</sub>":[7,33],"analysis":[8],"is":[9],"still":[10],"the":[11,21,24,53,57,73,83,99,110],"only":[12],"effective":[13],"method":[14],"used":[15],"in":[16,18,104],"practice":[17],"spite":[19],"of":[20,55,67,76,88,101],"fact":[22],"that":[23],"cost":[26,54,75],"associated":[27],"with":[28],"remains":[35],"to":[36,50,71],"be":[37],"a":[38],"major":[39],"problem.":[40],"In":[41],"this":[42],"paper,":[43],"we":[44],"develop":[45],"novel":[46],"design-for-testability":[47],"(DFT)":[48],"structures":[49,70,91],"considerably":[51],"reduce":[52,72],"initializing":[56,93],"circuit":[58,84,96],"during":[59],"test.":[61],"The":[62],"proposed":[63],"architectures":[64],"take":[65],"advantage":[66],"existing":[68],"DFT":[69,90],"overall":[74,111],"hardware":[77],"and":[78,108],"have":[79],"no":[80],"impact":[81],"on":[82],"timing.":[85],"Our":[86],"implementations":[87],"these":[89,102],"ITC'99":[94],"benchmark":[95],"b19":[97],"demonstrate":[98],"effectiveness":[100],"techniques":[103],"reducing":[105],"time":[107],"thus":[109],"cost.":[113]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}