{"id":"https://openalex.org/W3147463143","doi":"https://doi.org/10.1109/iccd.2009.5413111","title":"3D simulation and analysis of the radiation tolerance of voltage scaled digital circuit","display_name":"3D simulation and analysis of the radiation tolerance of voltage scaled digital circuit","publication_year":2009,"publication_date":"2009-10-01","ids":{"openalex":"https://openalex.org/W3147463143","doi":"https://doi.org/10.1109/iccd.2009.5413111","mag":"3147463143"},"language":"en","primary_location":{"id":"doi:10.1109/iccd.2009.5413111","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccd.2009.5413111","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE International Conference on Computer Design","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102793889","display_name":"Rajesh Garg","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Rajesh Garg","raw_affiliation_strings":["Intel Corporation, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corporation, USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021685706","display_name":"Sunil P. Khatri","orcid":"https://orcid.org/0000-0001-7134-9929"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Sunil P. Khatri","raw_affiliation_strings":["Texas A and M University, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas A and M University, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.4563,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.82928059,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"2007","issue":null,"first_page":"498","last_page":"504"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9886000156402588,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.6999642848968506},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.633061408996582},{"id":"https://openalex.org/keywords/radiation-hardening","display_name":"Radiation hardening","score":0.6075101494789124},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5810521245002747},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5309571623802185},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5273692607879639},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.5203865766525269},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5071697235107422},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.5028662085533142},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.43442288041114807},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38168853521347046},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25728172063827515}],"concepts":[{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.6999642848968506},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.633061408996582},{"id":"https://openalex.org/C119349744","wikidata":"https://www.wikidata.org/wiki/Q3026015","display_name":"Radiation hardening","level":3,"score":0.6075101494789124},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5810521245002747},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5309571623802185},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5273692607879639},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.5203865766525269},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5071697235107422},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.5028662085533142},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.43442288041114807},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38168853521347046},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25728172063827515},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iccd.2009.5413111","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccd.2009.5413111","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2009 IEEE International Conference on Computer Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8999999761581421,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1505948287","https://openalex.org/W1550639219","https://openalex.org/W1988031993","https://openalex.org/W2023856022","https://openalex.org/W2026329473","https://openalex.org/W2030501553","https://openalex.org/W2039996722","https://openalex.org/W2047573366","https://openalex.org/W2071068906","https://openalex.org/W2097514274","https://openalex.org/W2098014430","https://openalex.org/W2104122494","https://openalex.org/W2111445988","https://openalex.org/W2118351481","https://openalex.org/W2128748528","https://openalex.org/W2140687305","https://openalex.org/W2141068710","https://openalex.org/W2141238076","https://openalex.org/W2141454925","https://openalex.org/W2152652532","https://openalex.org/W2153130122","https://openalex.org/W2158161825","https://openalex.org/W2158443609","https://openalex.org/W2169213530","https://openalex.org/W2171382532","https://openalex.org/W3088068623","https://openalex.org/W4244490666","https://openalex.org/W6783340989"],"related_works":["https://openalex.org/W2204879205","https://openalex.org/W1943174035","https://openalex.org/W2096437374","https://openalex.org/W1928481607","https://openalex.org/W3135165657","https://openalex.org/W1485582195","https://openalex.org/W57337972","https://openalex.org/W1561306903","https://openalex.org/W2563702065","https://openalex.org/W2045255589"],"abstract_inverted_index":{"In":[0,78],"recent":[1],"times,":[2],"dynamic":[3],"supply":[4,118,216],"voltage":[5,119],"scaling":[6],"(DVS)":[7],"has":[8,37],"been":[9],"extensively":[10],"employed":[11],"to":[12,71,105,139,176,245],"minimize":[13],"the":[14,29,32,59,100,103,111,114,117,122,125,170,205,209,247],"power":[15,64],"and":[16,74,95,121,146,162,181,218,224],"energy":[17,123,226],"of":[18,34,85,102,124,144,160,203,211,231,243,249],"VLSI":[19,35],"systems.":[20],"Also,":[21],"sub-threshold":[22,75,96,147,163,182],"circuits":[23,53,76],"are":[24,48,137],"becoming":[25],"more":[26],"popular.":[27],"At":[28],"same":[30],"time,":[31],"reliability":[33],"systems":[36],"become":[38],"a":[39,187,212],"major":[40],"concern":[41],"under":[42],"Single":[43],"Event":[44],"Upsets":[45],"(SEUs).":[46],"SEUs":[47],"very":[49],"problematic":[50],"even":[51],"for":[52,62,157,179,191,214,222,254],"operating":[54],"at":[55,208],"nominal":[56],"voltages.":[57],"With":[58],"increasing":[60],"demand":[61],"low":[63],"reliable":[65],"systems,":[66],"it":[67],"is":[68],"therefore":[69],"necessary":[70],"harden":[72],"DVS":[73,94,145,161,180,192,255],"efficiently.":[77],"this":[79],"paper,":[80],"we":[81,132,153],"perform":[82],"3D":[83,130],"simulations":[84,253],"radiation":[86,106,126,142,158,172,252],"particle":[87,107,227],"strikes":[88,108],"in":[89,239],"an":[90,200],"inverter":[91,104,112,115],"implemented":[92],"using":[93],"design.":[97],"We":[98,184],"analyze":[99],"sensitivity":[101],"by":[109],"varying":[110],"size,":[113],"load,":[116],"(VDD)":[120],"particles.":[127],"From":[128],"these":[129,151],"simulations,":[131],"make":[133],"several":[134,155],"observations":[135],"which":[136],"important":[138],"consider":[140],"during":[141],"hardening":[143,159,173],"circuits.":[148,193,256],"Based":[149],"on":[150],"observations,":[152],"propose":[154,186],"guidelines":[156,167],"circuit":[164],"designs.":[165,183],"These":[166],"suggest":[168],"that":[169],"traditional":[171],"approaches":[174],"need":[175],"be":[177,237],"revisited":[178],"also":[185],"charge":[188,206,233],"collection":[189,234],"model":[190,195,235,241],"Our":[194],"can":[196,236],"accurately":[197],"estimate":[198],"(with":[199],"average":[201],"error":[202],"6.3%)":[204],"collected":[207],"output":[210],"gate":[213,220],"different":[215,219],"voltages":[217],"sizes":[221],"medium":[223],"high":[225],"strikes.":[228],"The":[229],"parameters":[230],"our":[232],"included":[238],"SPICE":[240,250],"cards":[242],"transistors,":[244],"improve":[246],"accuracy":[248],"based":[251]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":5}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}