{"id":"https://openalex.org/W2090025763","doi":"https://doi.org/10.1109/iccd.2007.4601927","title":"Modeling soft error effects considering process variations","display_name":"Modeling soft error effects considering process variations","publication_year":2007,"publication_date":"2007-10-01","ids":{"openalex":"https://openalex.org/W2090025763","doi":"https://doi.org/10.1109/iccd.2007.4601927","mag":"2090025763"},"language":"en","primary_location":{"id":"doi:10.1109/iccd.2007.4601927","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccd.2007.4601927","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 25th International Conference on Computer Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103091913","display_name":"Chong Zhao","orcid":"https://orcid.org/0000-0001-7108-9311"},"institutions":[{"id":"https://openalex.org/I36258959","display_name":"University of California, San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Chong Zhao","raw_affiliation_strings":["Department of ECE, University of California at San Diego, La Jolla, 92093, USA","Dept. of ECE, University of California at San Diego, La Jolla, CA#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of ECE, University of California at San Diego, La Jolla, 92093, USA","institution_ids":["https://openalex.org/I36258959"]},{"raw_affiliation_string":"Dept. of ECE, University of California at San Diego, La Jolla, CA#TAB#","institution_ids":["https://openalex.org/I36258959"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5105369696","display_name":"Sujit Dey","orcid":"https://orcid.org/0000-0001-9671-3950"},"institutions":[{"id":"https://openalex.org/I36258959","display_name":"University of California, San Diego","ror":"https://ror.org/0168r3w48","country_code":"US","type":"education","lineage":["https://openalex.org/I36258959"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sujit Dey","raw_affiliation_strings":["Department of ECE, University of California at San Diego, La Jolla, 92093, USA","Department of ECE, University of California, San Diego, San Diego, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of ECE, University of California at San Diego, La Jolla, 92093, USA","institution_ids":["https://openalex.org/I36258959"]},{"raw_affiliation_string":"Department of ECE, University of California, San Diego, San Diego, CA, USA","institution_ids":["https://openalex.org/I36258959"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5103091913"],"corresponding_institution_ids":["https://openalex.org/I36258959"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.13484398,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"376","last_page":"381"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.8933414816856384},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.8213911056518555},{"id":"https://openalex.org/keywords/variation","display_name":"Variation (astronomy)","score":0.6056339144706726},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5825144648551941},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.5782637596130371},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5671112537384033},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5465084314346313},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.538986086845398},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5249190926551819},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.5235664248466492},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5042015314102173},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.498457670211792},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4924212694168091},{"id":"https://openalex.org/keywords/propagation-of-uncertainty","display_name":"Propagation of uncertainty","score":0.45518726110458374},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.37793946266174316},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3566519021987915},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19059056043624878},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12482556700706482},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10587447881698608}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.8933414816856384},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.8213911056518555},{"id":"https://openalex.org/C2778334786","wikidata":"https://www.wikidata.org/wiki/Q1586270","display_name":"Variation (astronomy)","level":2,"score":0.6056339144706726},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5825144648551941},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.5782637596130371},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5671112537384033},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5465084314346313},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.538986086845398},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5249190926551819},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.5235664248466492},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5042015314102173},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.498457670211792},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4924212694168091},{"id":"https://openalex.org/C123614077","wikidata":"https://www.wikidata.org/wiki/Q1364905","display_name":"Propagation of uncertainty","level":2,"score":0.45518726110458374},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.37793946266174316},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3566519021987915},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19059056043624878},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12482556700706482},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10587447881698608},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C44870925","wikidata":"https://www.wikidata.org/wiki/Q37547","display_name":"Astrophysics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iccd.2007.4601927","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iccd.2007.4601927","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 25th International Conference on Computer Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7300000190734863,"id":"https://metadata.un.org/sdg/15","display_name":"Life in Land"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1888427026","https://openalex.org/W2026295009","https://openalex.org/W2030501553","https://openalex.org/W2047518460","https://openalex.org/W2108880814","https://openalex.org/W2121083020","https://openalex.org/W2141068710","https://openalex.org/W2142726556","https://openalex.org/W2145224695","https://openalex.org/W2169213530","https://openalex.org/W4298861651","https://openalex.org/W6676056936","https://openalex.org/W6681499266"],"related_works":["https://openalex.org/W2531550288","https://openalex.org/W2149041233","https://openalex.org/W2171347834","https://openalex.org/W2066042903","https://openalex.org/W3040935927","https://openalex.org/W2090025763","https://openalex.org/W1993206924","https://openalex.org/W2518564956","https://openalex.org/W2066664769","https://openalex.org/W2168546702"],"abstract_inverted_index":{"This":[0],"paper":[1],"addresses":[2],"the":[3,14,21,27,38,58,71,93,103],"aggregated":[4],"effects":[5],"of":[6,9,24,34,62,73],"two":[7],"types":[8],"variations":[10],"that":[11,86],"contribute":[12],"to":[13,56],"reliability":[15],"degradation.":[16],"The":[17],"first":[18],"one":[19,29,31],"is":[20,30],"increasing":[22],"level":[23],"process":[25],"variation;":[26],"second":[28],"particular":[32],"type":[33],"environmental":[35],"variation":[36,77,89],"-":[37],"radiation-induced":[39],"soft":[40,65,94],"error.":[41],"Their":[42],"simultaneous":[43],"presence":[44],"can":[45,90,98],"cause":[46],"large":[47],"negative":[48],"performance":[49],"impact.":[50],"We":[51],"present":[52],"a":[53,63],"statistical":[54],"approach":[55],"model":[57],"generation":[59],"and":[60],"propagation":[61],"transient":[64],"error":[66,95],"inside":[67],"combinational":[68],"circuits":[69],"considering":[70],"existence":[72],"inter-die":[74],"channel":[75,87],"length":[76,88],"in":[78],"CMOS":[79],"digital":[80],"circuits.":[81],"Experiment":[82],"results":[83],"have":[84],"demonstrated":[85],"significantly":[91],"aggravate":[92],"effect,":[96],"which":[97],"be":[99],"accurately":[100],"evaluated":[101],"using":[102],"proposed":[104],"methodology.":[105]},"counts_by_year":[{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}